Abstract: A method for manufacturing a solar-power-generator substrate by cutting out a semiconductor substrate by slicing a semiconductor ingot and then by forming a texture structure on a surface of the semiconductor substrate by performing a surface treatment on the surface of the semiconductor substrate, includes: cleaning including cleaning and removing an organic impurity and a metal impurity adhering to the surface of the semiconductor substrate with a cleaning fluid containing an oxidizing chemical; and etching including removing a damaged layer on a substrate surface generated by the slicing and forming the texture structure on the surface of the semiconductor substrate by performing anisotropic etching on the surface of the semiconductor substrate with an alkaline aqueous solution, the etching being performed subsequent to the cleaning.

Abstract: The present invention relates to a chuck mechanism of a charge-discharge test device for a thin secondary battery, and aims to provide a chuck mechanism having excellent action controllability. The chuck mechanism includes: a chuck drive part which is movable in a direction toward a battery container housing a thin secondary battery; and a chuck activation part which is located away from the chuck drive part in the direction toward the battery container and whose movement in the same direction is restricted. In the chuck mechanism, when the chuck unit is moved in the direction toward the battery container, the chuck drive part activates a chuck member of the chuck activation part whose movement in the same direction is restricted.

Abstract: Image processing apparatus includes: interpolation process image acquisition means for acquiring an interpolation process image of prescribed size which includes an interpolation point of an inputted image; Fourier transform means for subjecting the interpolation process image which is acquired with the interpolation process image acquisition means to Fourier transform; phase change means for changing, a phase of each value of the transformed interpolation process image which has been subjected to Fourier transform by the Fourier transform means, such that the interpolation point migrates to a desired nearby integer coordinate position; inverse Fourier transform means for subjecting the interpolation process image whose phase has been changed by the phase change means, to inverse Fourier transform; interpolation value determination means for adopting an interpolation point, a value of a pixel at the integer coordinate position, from the transformed interpolation process image subjected to inverse Fourier tran

Abstract: An image acquisition condition necessary to so arrange FOV's as not to overlap along a device shape so that all constituent arreas necessary for electric characteristic measurement may be confined in the FOV's is determined from device shape information (including circuit design data and layout design data) possessed by CAD data. Since, contingently upon the shape of a wiring portion, the wiring portion of a device is expressed by using a plurality of basic constituent figures in combination, a process of arranging FOV's to the individual constituent figures is executed. For a cell portion, a FOV is arranged in reference to a cell outer frame and apexes. At that time, any apex is a starting point of the FOV arrangement process and another apex is an end point of the same process.

Abstract: The present invention relates to a chuck mechanism of a charge/discharge testing device for flat-rechargeable batteries and has a proposition to provide a chuck mechanism that makes it possible to lighten conventionally needed troublesome works, that is, for example, works of storing and fixing a large number of flat-rechargeable batteries in a container, and that is capable of surely chucking the flat-rechargeable batteries (electrodes).

Abstract: An object of the present invention is to provide an image processing apparatus that quickly and precisely measures or evaluates a distortion in a field of view and a charged particle beam apparatus. To attain the object, an image processing apparatus or the like is proposed which acquires a first image of a first area of an imaging target and a second image of a second area that is located at a different position than the first area and partially overlaps with the first area and determines the distance between a measurement point in the second image and a second part of the second image that corresponds to a particular area for a plurality of sites in the overlapping area of the first image and the second image.

Abstract: The present invention relates to a chuck mechanism of a charge-discharge test device for a thin secondary battery, and aims to provide a chuck mechanism having excellent action controllability. The chuck mechanism includes: a chuck drive part which is movable in a direction toward a battery container housing a thin secondary battery; and a chuck activation part which is located away from the chuck drive part in the direction toward the battery container and whose movement in the same direction is restricted. In the chuck mechanism, when the chuck unit is moved in the direction toward the battery container, the chuck drive part activates a chuck member of the chuck activation part whose movement in the same direction is restricted.

Abstract: An image acquisition condition necessary to so arrange FOV's as not to overlap along a device shape so that all constituent arreas necessary for electric characteristic measurement may be confined in the FOV's is determined from device shape information (including circuit design data and layout design data) possessed by CAD data. Since, contingently upon the shape of a wiring portion, the wiring portion of a device is expressed by using a plurality of basic constituent figures in combination, a process of arranging FOV's to the individual constituent figures is executed. For a cell portion, a FOV is arranged in reference to a cell outer frame and apexes. At that time, any apex is a starting point of the FOV arrangement process and another apex is an end point of the same process.

Abstract: The present invention relates to a chuck mechanism of a charge/discharge testing device for flat-rechargeable batteries and has a proposition to provide a chuck mechanism that makes it possible to lighten conventionally needed troublesome works, that is, for example, works of storing and fixing a large number of flat-rechargeable batteries in a container, and that is capable of surely chucking the flat-rechargeable batteries (electrodes). The chuck mechanism includes a first guide couplable with a battery storage retaining a plurality of flat-rechargeable batteries arranged in parallel, and a plurality of chuck units continuously joined with the first guide and resiliently arranged in parallel, wherein the chuck units each have a second guide resiliently positioning each of the chuck units with a predetermined number of corresponding flat-rechargeable batteries in the battery storage.

Abstract: A semiconductor device allowing the manufacturing process to be simplified and fine structures therein to be readily formed and a manufacturing method thereof are provided. In the semiconductor device, a conductive layer is used as a mask during etching for forming a first opening.

Abstract: A method of annealing a core comprises the following steps. First annealing coils are wound around the legs or yokes of a core or parallel-arranged cores made of an amorphous magnetic alloy. Secondly, the core is excited by flowing an alternating current through the annealing coils. Thirdly, the core interior is uniformly heated to an annealing temperature of amorphous magnetic alloy plates by heat generated due to iron loss.