Abstract: A method for reducing the volume of a raw material liquid, the raw material liquid containing at least a valuable and a first solvent, wherein the raw material liquid further contains an accessory component other than the valuable and the first solvent, or contains a mixed solvent including the first solvent and a second solvent as a solvent, and the method for reducing the volume of the raw material liquid is performed by combining a first process in which the first solvent is removed from the raw material liquid and a second process in which the concentration of the second solvent or the accessory component is adjusted from the raw material liquid using a dialysis method with a dialysis membrane.

Abstract: Provided is a molded product having small anisotropy of strength in a MD direction and a TD direction and a processed article thereof. A molded product (10) includes a glycolic acid polymer and a plurality of fibers (11). The fibers (11) include the fibers oriented in the MD direction and the fibers oriented in a direction along a tangent line to concentric circles in a cross-section orthogonal to the MD direction at a specific ratio.

Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.

Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.

Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.

Abstract: A confocal measuring apparatus (1) includes a light source (10), an optical system (30) configured to receive reflected light from a measurement surface, a light guide part (20) into which a plurality of cores including a first core (26) and a second core (28) is built and configured to propagate the reflected light by the plurality of cores, a displacement amount measurement part (40) including a spectroscope (42) configured to separate the reflected light propagated by the first core into each wavelength components and a detector (44) having a plurality of light receiving elements arranged to correspond to a spectral direction by the spectroscope, and a peripheral image measurement part (60) configured to form an image of the reflected light propagated by the second core on the plurality of image pickup elements and to generate a peripheral image with respect to a measurement position of the measurement surface.

Abstract: Provided is an inclination measuring device with excellent convenience. An inclination measuring device includes: an optical system (sensor head) configured to irradiate a measurement object with an irradiated light ray from a light source and receive a reflected light ray from a measurement surface; a light receiving unit including at least one spectroscope configured to separate the reflected light ray into wavelength components, and a detector in which a plurality of light receiving elements are disposed; a light guide including a plurality of cores; and a processor configured to calculate an inclination angle of the measurement surface based on reflected light rays with respect to a plurality of irradiated light rays with which a plurality of positions on the measurement surface are irradiated.

Abstract: An optical measurement system calculates a distance between an optical system and a measurement object based on reflected light beams corresponding to cores, compares a value indicating the distance with a threshold value for each of the reflected light beams, calculates an average value of all the values indicating the distance when the values in the reflected light beams corresponding to all the cores are equal to or greater than the threshold value or the values are less than the threshold value, and calculates an average value of the values indicating the distance which are equal to or greater than the threshold value or an average value of the values indicating the distance which are less than the threshold values when the values corresponding to some cores are equal to or greater than the threshold value and the values corresponding to the other cores are less than the threshold value.

Abstract: A printed circuit board accommodation casing includes: a support surface that abuts on a first planar portion of a printed circuit board; a side wall portion located outside in a planar direction of the printed circuit board, the first planar portion of which is abutted by the support surface; and an engagement protrusion formed on the side wall portion, in which a crushing margin, which is crushed against the first planar portion of the printed circuit board, is set on the engagement protrusion at a location where the support surface does not abut on the first planar portion of the printed circuit board.

Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.

Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.

Abstract: A confocal measuring apparatus (1) includes a light source (10), an optical system (30) configured to receive reflected light from a measurement surface, a light guide part (20) into which a plurality of cores including a first core (26) and a second core (28) is built and configured to propagate the reflected light by the plurality of cores, a displacement amount measurement part (40) including a spectroscope (42) configured to separate the reflected light propagated by the first core into each wavelength components and a detector (44) having a plurality of light receiving elements arranged to correspond to a spectral direction by the spectroscope, and a peripheral image measurement part (60) configured to form an image of the reflected light propagated by the second core on the plurality of image pickup elements and to generate a peripheral image with respect to a measurement position of the measurement surface.

Abstract: An optical measurement system calculates a distance between an optical system and a measurement object based on reflected light beams corresponding to cores, compares a value indicating the distance with a threshold value for each of the reflected light beams, calculates an average value of all the values indicating the distance when the values in the reflected light beams corresponding to all the cores are equal to or greater than the threshold value or the values are less than the threshold value, and calculates an average value of the values indicating the distance which are equal to or greater than the threshold value or an average value of the values indicating the distance which are less than the threshold values when the values corresponding to some cores are equal to or greater than the threshold value and the values corresponding to the other cores are less than the threshold value.

Abstract: Provided is an inclination measuring device with excellent convenience. An inclination measuring device includes: an optical system (sensor head) configured to irradiate a measurement object with an irradiated light ray from a light source and receive a reflected light ray from a measurement surface; a light receiving unit including at least one spectroscope configured to separate the reflected light ray into wavelength components, and a detector in which a plurality of light receiving elements are disposed; a light guide including a plurality of cores; and a processor configured to calculate an inclination angle of the measurement surface based on reflected light rays with respect to a plurality of irradiated light rays with which a plurality of positions on the measurement surface are irradiated.

Abstract: A printed circuit board accommodation casing includes: a support surface that abuts on a first planar portion of a printed circuit board; a side wall portion located outside in a planar direction of the printed circuit board, the first planar portion of which is abutted by the support surface; and an engagement protrusion formed on the side wall portion, in which a crushing margin, which is crushed against the first planar portion of the printed circuit board, is set on the engagement protrusion at a location where the support surface does not abut on the first planar portion of the printed circuit board.

Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.

Abstract: In a measurement apparatus, higher-quality measurement is realized in measurement of measurement object displacement or imaging of a two-dimensional image. In a controller, a light receiving signal of a photodiode is supplied to a displacement measuring unit of a sensor head in order to measure a height of a measurement object, and the height of a surface of the measurement object is measured based on the light receiving signal. Then, in the controller, image obtaining timing is determined based on the height of the measurement object. Specifically, a focus adjustment value corresponding to the computed height of the measurement object is obtained from the table, and an image obtaining signal is transmitted to an imaging device at the timing the focus adjustment value is realized. Therefore, a length between two points on the measurement object is computed from the thus obtained image based on the height of the measurement object.

Abstract: To provide a method for manufacturing a plurality of types of illuminating devices having different specifications while reducing cost. A substrate includes a common flexible portion and a plurality of units bendable with respect to the common portion, where the common portion includes a pad that is extended in the horizontal direction in the plane of the drawing and that is arranged for every predefined interval. In the present manufacturing method, a substrate piece is created by cutting the substrate mounted with the light emitting element in a first direction, the common portion in the substrate piece is formed according to the illuminating device to be manufactured, the relative position of the individual portion with respect to the formed common portion is respectively positioned, and the wiring for supplying power to the pad in the substrate piece is formed.

Abstract: A displacement is accurately measured at high speed to a measurement object having various surface states. In a displacement sensor including a confocal optical system in which an objective lens is moved along an optical axis, light emitted from a laser diode is formed into a slit beam by a cylindrical lens, a Y-axis side orthogonal to the optical axis is narrowed such that the light is collected on a surface of a measurement object, and an X-axis orthogonal to the optical axis is elongated in order to average a component of the light reflected from the surface. A photodiode receives the light reflected from the surface of the measurement object through an opening disposed in a position of conjugation with the laser diode. The opening is formed into a slit shape that is short in the Y-axis while being long in the X-axis. The displacement of the surface is measured from a position of the objective lens when a light receiving signal becomes the maximum.

Abstract: This invention provides a displacement measurement device, a displacement measurement method, and a thickness measurement device capable of easily ensuring a conjugate relationship between the light source and the diaphragm and capable of accurately measuring the change in distance with the testing target. In the displacement measurement device, the light from the laser diode is collected towards the pin hole of the diaphragm plate at the collective lens, and then sent to the objective lens through the pin hole. The light is reflected at a surface of work, and detected by a photodiode through the objective lens, the pin hole, the collective lens, and the half mirror. That is, the pin hole becomes a substantial light source, and becomes a diaphragm with respect to the incident light on the work. The spot diameter collected on the pin hole by the collective lens is greater than the diameter of the pin hole.