Patents by Inventor Takanori Funabashi

Takanori Funabashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11473904
    Abstract: A measurement probe of the present disclosure that scans a surface of a measurement object to measure a three-dimensional shape or the like of the surface of the measurement object includes a first movable portion having a stylus, a second movable portion that is connected to the first movable portion to be movable in a Z direction, a third movable portion that is connected to the second movable portion to be movable in the Z direction, a first position measurer that measures a first position of the first movable portion in the Z direction, a second position measurer that measures a second position of the second movable portion in the Z direction, and a third position measurer that measures a third position of the third movable portion in the Z direction. A first relative position is calculated based on the first position and the second position. A second relative position is calculated based on the first position and the third position.
    Type: Grant
    Filed: October 22, 2020
    Date of Patent: October 18, 2022
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Keishi Kubo, Takashi Inoue, Masateru Doi, Makoto Okazaki, Yukiya Usui, Takanori Funabashi
  • Publication number: 20210123725
    Abstract: A measurement probe of the present disclosure that scans a surface of a measurement object to measure a three-dimensional shape or the like of the surface of the measurement object includes a first movable portion having a stylus, a second movable portion that is connected to the first movable portion to be movable in a Z direction, a third movable portion that is connected to the second movable portion to be movable in the Z direction, a first position measurer that measures a first position of the first movable portion in the Z direction, a second position measurer that measures a second position of the second movable portion in the Z direction, and a third position measurer that measures a third position of the third movable portion in the Z direction. A first relative position is calculated based on the first position and the second position. A second relative position is calculated based on the first position and the third position.
    Type: Application
    Filed: October 22, 2020
    Publication date: April 29, 2021
    Inventors: KEISHI KUBO, TAKASHI INOUE, MASATERU DOI, MAKOTO OKAZAKI, YUKIYA USUI, TAKANORI FUNABASHI
  • Patent number: 7797851
    Abstract: There are provided a shape measurement device capable of measuring shapes irrespective of an inclined direction of a side surface without using a complex device configuration, and a shape measurement device probe arranged in the shape measurement device. In the shape measurement device probe, a connecting mechanism for connecting an attachment member and a swinging member includes a supporting point member arranged on the swinging member and a mounting platform arranged on the attachment member, and connects the swinging member to the attachment member so as to be inclinable in any direction. The attachment member and the swinging member are configured such that a movable side member arranged on the swinging member and a fixed side member arranged on the attachment member generate magnetic attraction force in a non-contacting state with respect to each other, where the arm of the swinging member is biased so as to be directed in the vertical direction by the magnetic attraction force.
    Type: Grant
    Filed: May 8, 2007
    Date of Patent: September 21, 2010
    Assignee: Panasonic Corporation
    Inventors: Takanori Funabashi, Keiichi Yoshizumi
  • Publication number: 20100011601
    Abstract: There are provided a shape measurement device capable of measuring shapes irrespective of an inclined direction of a side surface without using a complex device configuration, and a shape measurement device probe arranged in the shape measurement device. In the shape measurement device probe, a connecting mechanism for connecting an attachment member and a swinging member includes a supporting point member arranged on the swinging member and a mounting platform arranged on the attachment member, and connects the swinging member to the attachment member so as to be inclinable in any direction. The attachment member and the swinging member are configured such that a movable side member arranged on the swinging member and a fixed side member arranged on the attachment member generate magnetic attraction force in a non-contacting state with respect to each other, where the arm of the swinging member is biased so as to be directed in the vertical direction by the magnetic attraction force.
    Type: Application
    Filed: May 8, 2007
    Publication date: January 21, 2010
    Inventors: Takanori Funabashi, Keiichi Yoshizumi
  • Patent number: 7520067
    Abstract: A three-dimensional measurement probe that is less likely to break, that is of long lifespan, and that is of low cost, capable of measuring the shape and the like of a measuring object such as an aspheric lens with higher precision is realized. A magnetic force for preventing rotation and axial displacement of a small slidably moving shaft part is generated by constructing a magnetic circuit by a magnet attached to a small air bearing part, a yoke, and a magnetic pin attached to the small slidably moving shaft part. The three-dimensional measurement probe is able to perform measurement from below and from the side since the magnetic force is non-contacting.
    Type: Grant
    Filed: October 30, 2007
    Date of Patent: April 21, 2009
    Assignee: Panasonic Corporation
    Inventors: Keiichi Yoshizumi, Keishi Kubo, Hiroyuki Mochizuki, Takanori Funabashi
  • Publication number: 20080148588
    Abstract: A three-dimensional measurement probe that is less likely to break, that is of long lifespan, and that is of low cost, capable of measuring the shape and the like of a measuring object such as an aspheric lens with higher precision is realized. A magnetic force for preventing rotation and axial displacement of a small slidably moving shaft part is generated by constructing a magnetic circuit by a magnet attached to a small air bearing part, a yoke, and a magnetic pin attached to the small slidably moving shaft part. The three-dimensional measurement probe is able to perform measurement from below and from the side since the magnetic force is non-contacting.
    Type: Application
    Filed: October 30, 2007
    Publication date: June 26, 2008
    Inventors: Keiichi Yoshizumi, Keishi Kubo, Hiroyuki Mochizuki, Takanori Funabashi
  • Patent number: 4802815
    Abstract: A dust-free industrial robot of high performance includes an internal air space substantially closed by arms, articulation members, bearings or covers or a combination thereof in a manner to separate the rotating, sliding and contacting portions of structural elements such as the arms, articulation members, bearings and a drive source from the outside air. The air pressure in the internal air space is made lower than that of the outside air to prevent dust produced during the operation of the robot from being scattered to the outside air.
    Type: Grant
    Filed: August 6, 1985
    Date of Patent: February 7, 1989
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Takanori Funabashi, Akiyoshi Nakada, Haruo Tada