Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.

Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.

Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.

Abstract: An apparatus for testing digital and analog signals from an integrated circuit includes an adder or subtractor 17 for being supplied with an analog signal outputted from the integrated circuit of a device under test and a signal outputted from a driver 11, an integrator 14 for being supplied with an analog signal outputted from the adder or subtractor 17, a switch 22 for selectively transmitting an analog signal outputted from the integrator 14 and a digital signal outputted from the integrated circuit to the comparator 13, and a switch 24 for selectively transmitting a signal outputted from a memory 20 and a signal outputted from a comparator 13 to the driver 11. At least one of the switches 22, 24 is operated depending on whether a signal to be tested is analog or digital.

Abstract: In order to prevent spurious signals from being generated in an electronic circuit executing an interleaving operation, a plurality of substantially similar electronic circuits 101, 102, 103 are arranged in parallel and operated in an interleaved manner. When each operating frequency of the electronic circuit is f, in order to obtain a Nf frequency (N is 2 in FIG. 1), more than N pieces (3 in FIG. 1) of electronic circuits are arranged in parallel and used, and electronic circuits 101, 102, 103 are selected for output in an at least pseudo-random manner.

Abstract: The invention presents a circuit by which control of the output amplitude of digital analog converters can be carried out at high speed and with high precision. A first digital signal that is the same as the input signal and a second digital signal of a value slightly smaller than an input signal provided from a high-speed processor are selectively applied to plural D-A converters and the output therefrom is added. By changing the ratio with which the first digital signal and the second digital signal are selected, it is possible to control the analog output amplitude.

Abstract: A signal conditioner comprising a receiving part, a transmitting part, and a power supply part, wherein the main functions of these components are digitalized and common circuit elements are used for different functions. Signal conditions may be of several different types, each of which is a hardware which can accommodate various transmitters and actuators.