Patents by Inventor Takao Yoshinaga

Takao Yoshinaga has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automatic defect-detecting method and apparatus
    Patent number: 3988530
    Abstract: An automatic surface defect-detecting method and apparatus for detecting only effective significant surface defects. The significant defects can be detected from video signals and differential signals corresponding to particular scanning lines respectively by removing the distributed density portions having a larger pulse width in the scanning line direction, or removing smaller differential value portions in density, from the examined portions with higher density of flourescent magnetic powders thereon.
    Type: Grant
    Filed: September 30, 1975
    Date of Patent: October 26, 1976
    Assignees: Konan Camera Research Institute, Sumitomo Metal Industries, Ltd.
    Inventors: Yoshizo Ikegami, Kuniomi Abe, Seijiro Kushibe, Takao Yoshinaga, Tsunemasa Okada