Patents by Inventor Takashi Fukano

Takashi Fukano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7315413
    Abstract: An illumination apparatus for a microscope includes a light source portion that projects a light beam, two splitting elements that split the light beam into three, wavelength selection elements that independently select transmission wavelengths of the three light beams, shutters that independently shield or guide the three light beams, a first combining element that combines optical paths of two light beams, a second combining element that combines an optical path of the remaining light beam with a combined optical path, a pinhole that is located on an optical path between the first and second combining elements and has an aperture that selectively transmits only part of a light beam, and a projection optical system that applies a light beam from the second combining element to a sample and, when applying a light beam from the pinhole to the sample, projects the aperture of the pinhole onto the sample.
    Type: Grant
    Filed: November 8, 2005
    Date of Patent: January 1, 2008
    Assignees: Riken, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Patent number: 7277566
    Abstract: A microscope system comprises: a control means (18) capable of generating electric control signals (18a); a spatial modulator means (7) having an illuminated surface (7a) to be illuminated by light emitted by a light source (1), and capable of receiving the electric control signal and of spatially modulating reflection characteristic or transmission characteristic of the illuminated surface by a spatial frequency specified by the electric control signal; an illuminating optical means (8, 11) for illuminating a specimen (12) with light spatially modulated by the spatial modulator means; an image detecting means (15) for detecting a signal image formed by signal light emitted by the specimen illuminated by the illuminating optical means; and an arithmetic means (16) for processing signal images formed by using the spatial frequency of at least three different phases set by the control means and detected by the image detecting means to obtain an optical sectioned image.
    Type: Grant
    Filed: September 16, 2003
    Date of Patent: October 2, 2007
    Assignee: Riken
    Inventors: Atsushi Miyawaki, Takashi Fukano
  • Patent number: 7236298
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Grant
    Filed: September 13, 2006
    Date of Patent: June 26, 2007
    Assignees: The Institute of Physical & Chemical Research, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Publication number: 20070008615
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Application
    Filed: September 13, 2006
    Publication date: January 11, 2007
    Applicants: THE INSTITUTE OF PHYSICAL AND CHEMICAL RESEARCH, OLYMPUS CORPORATION
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Patent number: 7126752
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Grant
    Filed: November 20, 2003
    Date of Patent: October 24, 2006
    Assignees: The Institute of Physical and Chemical Research, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Publication number: 20060098418
    Abstract: An illumination apparatus for a microscope includes a light source portion that projects a light beam, two splitting elements that split the light beam into three, wavelength selection elements that independently select transmission wavelengths of the three light beams, shutters that independently shield or guide the three light beams, a first combining element that combines optical paths of two light beams, a second combining element that combines an optical path of the remaining light beam with a combined optical path, a pinhole that is located on an optical path between the first and second combining elements and has an aperture that selectively transmits only part of a light beam, and a projection optical system that applies a light beam from the second combining element to a sample and, when applying a light beam from the pinhole to the sample, projects the aperture of the pinhole onto the sample.
    Type: Application
    Filed: November 8, 2005
    Publication date: May 11, 2006
    Applicants: RIKEN, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Patent number: 6903869
    Abstract: An illumination system for microscopy includes a light source, a first spectral element dispersing light from the light source, a reflecting member selectively reflecting light dispersed by the first spectral element, a second spectral element combining light reflected by the reflecting member, a dichroic mirror, an objective lens, and an image sensor. The first spectral element is placed at the front focal point of a first lens, the reflecting member is placed at a position where the back focal point of the first lens coincides with the front focal point of a second lens, and the second spectral element is placed at the back focal point of the second lens.
    Type: Grant
    Filed: November 22, 2002
    Date of Patent: June 7, 2005
    Assignee: Olympus Corporation
    Inventors: Takashi Fukano, Atsushi Miyawaki, Keiji Shimizu, Yoshihiro Kawano
  • Publication number: 20040120034
    Abstract: An illumination apparatus for a microscope and an image processing apparatus using the illumination apparatus include a light source, a semi-transmissive mirror splitting a light beam from the light source into two beams of the first and second irradiation light, two excitation filters selecting the wavelengths of the first and second irradiation light, a semi-transmissive mirror synthesizing individual beams of the first and second irradiation light whose wavelengths are selected, into a single beam, a dichroic mirror directing a light beam synthesized by the semi-transmissive mirror toward a specimen and transmitting light from the specimen, an objective lens, cameras imaging fluorescent light from the specimen after being separated into fluorescent light excited by the first and second wavelengths, and an image processing section processing fluorescent images formed by imaging elements.
    Type: Application
    Filed: November 20, 2003
    Publication date: June 24, 2004
    Applicants: THE INSTITUTE OF PHYSICAL AND CHEMICAL RESEARCH, Olympus Corporation
    Inventors: Atsushi Miyawaki, Takashi Fukano, Yasushi Aono
  • Publication number: 20040061914
    Abstract: A microscope system comprises: a control means (18) capable of generating electric control signals (18a); a spatial modulator means (7) having an illuminated surface (7a) to be illuminated by light emitted by a light source (1), and capable of receiving the electric control signal and of spatially modulating reflection characteristic or transmission characteristic of the illuminated surface by a spatial frequency specified by the electric control signal; an illuminating optical means (8, 11) for illuminating a specimen (12) with light spatially modulated by the spatial modulator means; an image detecting means (15) for detecting a signal image formed by signal light emitted by the specimen illuminated by the illuminating optical means; and an arithmetic means (16) for processing signal images formed by using the spatial frequency of at least three different phases set by the control means and detected by the image detecting means to obtain an optical sectioned image.
    Type: Application
    Filed: September 16, 2003
    Publication date: April 1, 2004
    Inventors: Atsushi Miyawaki, Takashi Fukano
  • Publication number: 20030161039
    Abstract: An illumination system for microscopy includes a light source, a first spectral element dispersing light from the light source, a reflecting member selectively reflecting light dispersed by the first spectral element, a second spectral element combining light reflected by the reflecting member, a dichroic mirror, an objective lens, and an image sensor. The first spectral element is placed at the front focal point of a first lens, the reflecting member is placed at a position where the back focal point of the first lens coincides with the front focal point of a second lens, and the second spectral element is placed at the back focal point of the second lens.
    Type: Application
    Filed: November 22, 2002
    Publication date: August 28, 2003
    Inventors: Takashi Fukano, Atsushi Miyawaki, Keiji Shimizu, Yoshihiro Kawano
  • Patent number: 5943134
    Abstract: A light beam emitted by a light source is projected through a collimator lens, a beam splitter and an objective on a sample having a laminated structure. The light beam reflected from the sample travels through the beam splitter to a detector and the detector provides a confocal signal. The detector provides an interference signal upon the reception of the reflected light beam and a reference light beam reflected by a reference mirror. The sample and the reference mirror are moved on the basis of the confocal signal and the interference signal, and the thickness and the refractive index of layer of the sample are determined on the basis of the respective displacements of the sample and the reference mirror.
    Type: Grant
    Filed: June 17, 1997
    Date of Patent: August 24, 1999
    Assignee: The Institute of Physical and Chemical Research
    Inventors: Ichirou Yamaguchi, Takashi Fukano
  • Patent number: 4269323
    Abstract: A heat insulated tank is disclosed having inner and outer walls between which a supporting material is interposed. The material comprises a molding of alkaline earth metal silicates or a molding of composite material based thereon having a continuous open cell structure and subjected to heat treatment under vacuum. Inside and outside faces of said supporting material are provided with a suitable number of grooves. The entire surface of said supporting material is impregnated with a solution of sodium silicate, potassium silicate or ethyl silicate and subjected to baking.The supporting material has a high insulating capability and a high resistance to compression, thus it is applicable to square shaped tanks in addition to conventional spherical or cylindrical ones. The tank is easy to manufacture with increased storage capacity.
    Type: Grant
    Filed: October 2, 1978
    Date of Patent: May 26, 1981
    Assignee: Nippon Sanso Kabushiki Kaisha
    Inventors: Nobuyoshi Ito, Hiroshi Morishita, Minoru Morita, Takashi Fukano