Patents by Inventor Takayuki Ohmura
Takayuki Ohmura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11961728Abstract: A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.Type: GrantFiled: March 6, 2023Date of Patent: April 16, 2024Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Yasuhide Naito, Masahiro Kotani, Takayuki Ohmura
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Patent number: 11948787Abstract: A sample support body is a sample support body for ionizing a sample, including: a substrate formed with a plurality of first through holes opening to a first surface and a second surface opposite to each other; and a conductive layer provided at least on a peripheral portion of the first through hole in the first surface, in which in a partition portion provided between the adjacent first through holes, a plurality of second through holes communicating the adjacent first through holes are formed.Type: GrantFiled: November 30, 2018Date of Patent: April 2, 2024Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro Kotani, Takayuki Ohmura
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Patent number: 11947260Abstract: A sample support includes: a substrate having a plurality of through-holes opening on a first surface and on a second surface; a first member having a plurality of first openings and disposed on the first surface; a second member having a plurality of second openings and disposed on the second surface, and; a bonding member disposed between the first member and the second member; and a conductive layer integrally provided on a region of the second surface corresponding to each of the plurality of second openings. The plurality of through-holes include a plurality of first through-holes located between each of the plurality of first openings and each of the plurality of second openings, and a plurality of second through-holes located between the first member and the second member. Each of the plurality of second openings communicate with each of the plurality of first openings through the plurality of first through-holes.Type: GrantFiled: January 14, 2021Date of Patent: April 2, 2024Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Akira Tashiro, Masahiro Kotani, Takayuki Ohmura
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Patent number: 11935733Abstract: A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a reinforcement member disposed inside a part of the plurality of through holes.Type: GrantFiled: October 3, 2022Date of Patent: March 19, 2024Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Miu Takimoto, Takayuki Ohmura, Masahiro Kotani
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Patent number: 11929245Abstract: A sample support body for ionization of a sample, including: a substrate having a first surface, a second surface on a side opposite to the first surface, and a plurality of through-holes opening on each of the first surface and the second surface; a conductive layer provided on the first surface; and a matrix crystal layer provided on at least one of the conductive layer and the second surface, in which the matrix crystal layer is formed of a plurality of matrix crystal grains so as to include a gap communicating the plurality of through-holes with an outside.Type: GrantFiled: January 23, 2020Date of Patent: March 12, 2024Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro Kotani, Takayuki Ohmura, Akira Tashiro
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Publication number: 20230420237Abstract: A sample support body is used for ionizing a component of a sample. The sample support body includes: a substrate; a porous layer provided on the substrate and having a front surface on a side opposite to the substrate; and a partition portion partitioning the front surface into a first region and a second region. The porous layer includes a main body layer having a plurality of holes opening to the front surface. The partition portion includes a partition groove formed on the front surface so as to pass between the first region and the second region.Type: ApplicationFiled: September 17, 2021Publication date: December 28, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro KOTANI, Takayuki OHMURA, Akira TASHIRO
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Publication number: 20230411133Abstract: A sample support body includes a substrate and a porous layer provided on the substrate and having a surface opposite the substrate. The porous layer includes a body layer having a plurality of holes open to a surface of the porous layer. Each of the plurality of holes includes an extension portion extending in a thickness direction of the substrate and an opening widened from an end of the extension portion on a surface side toward the surface. An average value of the depths of the plurality of holes is 3 ?m or more and 100 ?m or less. A value obtained by dividing the average value of the depths by an average value of the widths of the plurality of holes is 9 or more and 2500 or less.Type: ApplicationFiled: October 14, 2021Publication date: December 21, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro KOTANI, Takayuki OHMURA, Akira TASHIRO
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Publication number: 20230290625Abstract: A sample support is a sample support for ionizing a sample. The sample support includes a substrate that includes a first surface having electrical insulating property, a second surface opposite to the first surface, and an irregular porous structure that opens to at least the first surface.Type: ApplicationFiled: June 1, 2021Publication date: September 14, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Takamasa IKEDA, Masahiro KOTANI, Akira TASHIRO, Takayuki OHMURA
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Patent number: 11735406Abstract: A sample support body is a sample support body for ionizing a sample, including: a substrate having an irregular porous structure formed to communicate a first surface and a second surface opposite to each other; and a conductive layer provided at least on the first surface.Type: GrantFiled: December 13, 2021Date of Patent: August 22, 2023Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro Kotani, Takayuki Ohmura, Takamasa Ikeda
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Publication number: 20230253196Abstract: A sample support used for sample component ionization includes: a substrate having a first surface and a plurality of holes opening to the first surface; and a conductive layer provided on the first surface so as not to block the hole, in which the conductive layer is configured by a plurality of nanoparticles and has a thickness of 30 nm or more.Type: ApplicationFiled: May 10, 2021Publication date: August 10, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Akira TASHIRO, Takayuki OHMURA, Masahiro KOTANI, Takamasa IKEDA
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Patent number: 11694883Abstract: A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a frame body provided in a peripheral portion of the substrate to surround an ionization region in which a sample is ionized when viewed in a thickness direction of the substrate, in which a marker for recognizing a position in the ionization region is provided in the frame body.Type: GrantFiled: April 12, 2022Date of Patent: July 4, 2023Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Miu Takimoto, Takayuki Ohmura, Masahiro Kotani
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Publication number: 20230170201Abstract: A sample support is a sample support used for ionizing components of a sample, and includes: a substrate including a first surface, a second surface on a side opposite to the first surface, and a plurality of through holes opening to the first surface and the second surface; a conductive layer provided at least on the first surface; and a derivatizing agent provided to the plurality of through holes to derivatize the components.Type: ApplicationFiled: April 15, 2021Publication date: June 1, 2023Applicants: HAMAMATSU PHOTONICS K.K., TAIYO NIPPON SANSO CORPORATION, NATIONAL UNIVERSITY CORPORATION FUKUSHIMA UNIVERSITYInventors: Masahiro KOTANI, Takayuki OHMURA, Akari WAKIMURA, Tsutomu TERAUCHI, Shu TAIRA, Yasuhide NAITO
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Patent number: 11658018Abstract: Provided is a sample support body that includes a substrate, an ionization substrate, and a support. The ionization substrate has a plurality of measurement regions for dropping a sample on a second surface. A plurality of through-holes that open in a first surface and the second surface are formed at least in the measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. The support has a first support provided on peripheral edges of the measurement regions on the first surface to separate the plurality of measurement regions when viewed in the direction in which the substrate and the ionization substrate face each other.Type: GrantFiled: August 3, 2018Date of Patent: May 23, 2023Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Takayuki Ohmura, Masahiro Kotani
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Patent number: 11656198Abstract: Provided is a sample support body that includes a substrate, an ionization substrate, a support, and a frame. The ionization substrate has a plurality of measurement regions for dropping a sample on second surface. A plurality of through-holes that open in a first surface and the second surface are formed at least in the measurement regions of the ionization substrate. A conductive layer is provided on peripheral edges of the through-holes at least on the second surface. The frame has a wall provided on peripheral edges of the measurement regions on the second surface to separate the plurality of measurement regions when viewed in the direction in which the substrate and the ionization substrate face each other.Type: GrantFiled: May 5, 2022Date of Patent: May 23, 2023Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Takayuki Ohmura, Masahiro Kotani
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Patent number: 11646187Abstract: A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.Type: GrantFiled: September 2, 2021Date of Patent: May 9, 2023Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Yasuhida Naito, Masahiro Kotani, Takayuki Ohmura
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Publication number: 20230131548Abstract: A sample support includes: a substrate having a plurality of through-holes opening on a first surface and on a second surface; a first member having a plurality of first openings and disposed on the first surface; a second member having a plurality of second openings and disposed on the second surface, and; a bonding member disposed between the first member and the second member; and a conductive layer integrally provided on a region of the second surface corresponding to each of the plurality of second openings. The plurality of through-holes include a plurality of first through-holes located between each of the plurality of first openings and each of the plurality of second openings, and a plurality of second through-holes located between the first member and the second member. Each of the plurality of second openings communicate with each of the plurality of first openings through the plurality of first through-holes.Type: ApplicationFiled: January 14, 2021Publication date: April 27, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Akira TASHIRO, Masahiro KOTANI, Takayuki OHMURA
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Publication number: 20230114331Abstract: A sample support used for ionizing a component of a sample includes: a substrate having a first surface, a second surface opposite the first surface, and a plurality of through-holes that are open on the first surface and on the second surface; a conductive layer provided on at least the first surface; and an anionizing agent provided in the plurality of through-holes to anionize the component.Type: ApplicationFiled: January 15, 2021Publication date: April 13, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro KOTANI, Takayuki OHMURA, Akira TASHIRO
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Publication number: 20230095349Abstract: A sample support body includes: an insulating substrate having a measurement region formed with a plurality of through holes; a frame formed with an opening part opening to a first face and a second face to correspond to the measurement region, and formed on the first surface such that the opening part overlaps the measurement region when viewed from a thickness direction of the substrate; an adhesive layer to bond the substrate and the frame and having a protruding portion protruding from an inner surface of the opening part toward the measurement region; and a conductive layer having a first portion provided along the inner surface of the opening part, a second portion provided along the first surface of the measurement region, and a third portion provided along a surface of the protruding portion so as to connect the first portion and the second portion.Type: ApplicationFiled: December 1, 2020Publication date: March 30, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Akira TASHIRO, Masahiro KOTANI, Takayuki OHMURA
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Publication number: 20230086284Abstract: A sample support used for ionizing a component of a sample includes: a substrate having a first surface, a second surface opposite the first surface, and a plurality of through-holes that are open on the first surface and on the second surface; a conductive layer provided on at least the first surface; and a cationizing agent provided in the plurality of through-holes to cationize the component with a predetermined atom.Type: ApplicationFiled: January 15, 2021Publication date: March 23, 2023Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Masahiro KOTANI, Takayuki OHMURA, Akira TASHIRO
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Publication number: 20230025534Abstract: A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a reinforcement member disposed inside a part of the plurality of through holes.Type: ApplicationFiled: October 3, 2022Publication date: January 26, 2023Inventors: Miu TAKIMOTO, Takayuki Ohmura, Masahiro Kotani