Patents by Inventor Takehiko Ohkubo

Takehiko Ohkubo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Partly replaceable device for testing a multi-contact integrated circuit chip package
    Patent number: 5847572
    Abstract: Herein disclosed is a test device for testing an integrated circuit (IC) chip having side edge portions each provided with a set of lead pins. The test device comprises a socket base, contact units each including a contact support member and socket contact members, and anisotropic conductive sheet assemblies each including an elastic insulation sheet and conductive members. The anisotropic conductive sheet assemblies are arranged to hold each conductive member in contact with one of the socket contact members of the contact units. The test device further comprises a contact retainer detachably mounted on the socket base to bring the socket contact members into contact with the anisotropic conductive sheet assemblies to establish electrical communication between the socket contact members and the conductive members of the anisotropic conductive sheet assemblies.
    Type: Grant
    Filed: January 3, 1997
    Date of Patent: December 8, 1998
    Assignees: Mitsubishi Denki Kabushiki Kaisha, Unitechno, Inc.
    Inventors: Hidekazu Iwasaki, Hiroshi Matsunaga, Takehiko Ohkubo