Patents by Inventor Taketoshi Aratani

Taketoshi Aratani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7085666
    Abstract: A magnetic head testing apparatus includes reference information storing unit for holding a predetermined reference sampling period and a number of reference samplings, sampling unit for sampling reproduced data read a plurality of times from a magnetic medium in the reference sampling period, sampling number acquiring unit for acquiring a sampling number of measured data from a reproduced data base on a sampling result, sampling number ratio calculating unit for calculating a ratio of the sampling number of the measured data and the number of reference samplings, sampling data re-acquiring unit for changing the sampling period of the measured data depending on the calculated ratio and re-acquiring the sampling data and a measured data overlap-displaying unit for overlap-display of the sampling data re-acquired from the measured data a plurality of times.
    Type: Grant
    Filed: October 1, 2003
    Date of Patent: August 1, 2006
    Assignee: Fujitsu Limited
    Inventors: Taketoshi Aratani, Tetsuya Mukunoki, Kazuteru Hashizume, Takao Sugawara, Kiyoharu Yagyu
  • Publication number: 20040104721
    Abstract: A magnetic head testing apparatus includes reference information storing means for holding a predetermined reference sampling period and a number of reference samplings, sampling means for sampling reproduced data read a plurality of times from a magnetic medium in the reference sampling period, sampling number acquiring means for acquiring a sampling number of measured data from a reproduced data base on a sampling result, sampling number radio calculating means for calculating a ratio of the sampling number of the measured data and the number of reference samplings, sampling data re-acquiring means for changing the sampling period of the measured data depending on the calculated ratio and re-acquiring the sampling data and a measured data overlap-displaying means for overlap-display of the sampling data re-acquired from the measured data a plurality of times.
    Type: Application
    Filed: October 1, 2003
    Publication date: June 3, 2004
    Applicant: FUJITSU LIMITED
    Inventors: Taketoshi Aratani, Tetsuya Mukunoki, Kazuteru Hashizume, Takao Sugawara, Kiyoharu Yagyu