Patents by Inventor Takuya Saitou

Takuya Saitou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11862415
    Abstract: A keyswitch device which is provided with a support mechanism which supports a keytop in a movable manner, and a membrane sheet which has a plurality of upper electrodes and a plurality of lower electrodes which respectively correspond to the plurality of the upper electrodes and which form contact pairs with the corresponding upper electrodes. A plurality of contact pairs are arranged for a single keytop. The rubber cup pushes the plurality of contact pairs which are arranged for the single keytop.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: January 2, 2024
    Assignee: FUJITSU COMPONENT LIMITED
    Inventors: Hiromi Ohtsuka, Daisuke Taga, Takuya Saitou, Momosuke Nakahara
  • Publication number: 20230384760
    Abstract: A control device includes: a data access logic storage unit that stores a data access logic used for performing at least any one of reference and update of data related to an industrial machine; a data management unit that, based on the data access logic, performs reference or update of data related to the industrial machine; an operation logic storage unit that stores an operation logic used for performing a control process of the industrial machine; an operation management unit that, based on the operation logic, performs an operation related to the industrial machine; and an interface unit that provides a common interface used for accessing the data management unit and the operation management unit.
    Type: Application
    Filed: November 8, 2021
    Publication date: November 30, 2023
    Applicant: Fanuc Corporation
    Inventor: Takuya Saitou
  • Patent number: 11048215
    Abstract: A machine learning device included in a tool selecting apparatus includes a state observing unit that observes, as state variables indicative of a current environmental state, data related to machining condition, data related to cutting condition, data related to machining result, and data related to a tool, and a learning unit that, by using the state variables, learns distribution of the data related to the machining condition, the data related to the cutting condition, and the data related to the machining result, with respect to data related to the tool.
    Type: Grant
    Filed: April 15, 2019
    Date of Patent: June 29, 2021
    Assignee: FANUC CORPORATION
    Inventor: Takuya Saitou
  • Publication number: 20200357581
    Abstract: A keyswitch device which is provided with a support mechanism which supports a keytop in a movable manner, and a membrane sheet which has a plurality of upper electrodes and a plurality of lower electrodes which respectively correspond to the plurality of the upper electrodes and which form contact pairs with the corresponding upper electrodes. A plurality of contact pairs are arranged for a single keytop. The rubber cup pushes the plurality of contact pairs which are arranged for the single keytop.
    Type: Application
    Filed: July 24, 2020
    Publication date: November 12, 2020
    Applicant: FUJITSU COMPONENT LIMITED
    Inventors: Hiromi OHTSUKA, Daisuke TAGA, Takuya SAITOU, Momosuke NAKAHARA
  • Patent number: 10763054
    Abstract: A keyswitch device which is provided with a support mechanism which supports a keytop in a movable manner, and a membrane sheet which has a plurality of upper electrodes and a plurality of lower electrodes which respectively correspond to the plurality of the upper electrodes and which form contact pairs with the corresponding upper electrodes. A plurality of contact pairs are arranged for a single keytop. The rubber cup pushes the plurality of contact pairs which are arranged for the single keytop.
    Type: Grant
    Filed: April 29, 2014
    Date of Patent: September 1, 2020
    Assignee: FUJITSU COMPONENT LIMITED
    Inventors: Hiromi Ohtsuka, Daisuke Taga, Takuya Saitou, Momosuke Nakahara
  • Patent number: 10635084
    Abstract: In a numerical control system including a numerical controller having a tool database and a tool catalog database which can be referred to from the numerical controller, the tool catalog database has tool catalog data including first cutting condition data, and the tool database has tool data including second cutting condition data to be used for machining. After execution of the machining, the numerical controller updates the first cutting condition data to be stored in the tool catalog database based on the second cutting condition data stored in the tool database.
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: April 28, 2020
    Assignee: Fanuc Corporation
    Inventor: Takuya Saitou
  • Publication number: 20190332069
    Abstract: A machine learning device included in a tool selecting apparatus includes a state observing unit that observes, as state variables indicative of a current environmental state, data related to machining condition, data related to cutting condition, data related to machining result, and data related to a tool, and a learning unit that, by using the state variables, learns distribution of the data related to the machining condition, the data related to the cutting condition, and the data related to the machining result, with respect to data related to the tool.
    Type: Application
    Filed: April 15, 2019
    Publication date: October 31, 2019
    Inventor: Takuya SAITOU
  • Patent number: 10444737
    Abstract: A numerical controller operates a machine tool based on a plurality of parameters and a machining program. A user is allowed to refer to a parameter that has not been set, in other words, a parameter not falling within the range of recommended setting values, among parameters that may influence the shortening of a cycle time of the operation of the machining program on a display screen. For this reason, the user can use the parameter as a reference for reviewing the parameter setting for the purpose of shortening the cycle time or the like.
    Type: Grant
    Filed: November 3, 2015
    Date of Patent: October 15, 2019
    Assignee: FANUC Corporation
    Inventors: Takuya Saitou, Koichi Murata, Mamoru Kubo
  • Patent number: 10295986
    Abstract: A numerical controller which controls a machine tool acquires tool information including a shape of a tool, a machining condition in machining, and information related to a machining result of a workpiece after machining. A machine learning device performs machine learning on tendency of the information related to a machining result with respect to the tool information and the machining condition based on the tool information and the machining condition used as input data and based on the information related to a machining result used as teacher data, so as to construct a learning model. The machine learning device determines whether or not a machining result is good by using the learning model based on the tool information and the machining condition before the machine tool machines a workpiece.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: May 21, 2019
    Assignee: Fanuc Corporation
    Inventors: Takuya Saitou, Toshinori Matsukawa
  • Publication number: 20180067471
    Abstract: A numerical controller which controls a machine tool acquires tool information including a shape of a tool, a machining condition in machining, and information related to a machining result of a workpiece after machining. A machine learning device performs machine learning on tendency of the information related to a machining result with respect to the tool information and the machining condition based on the tool information and the machining condition used as input data and based on the information related to a machining result used as teacher data, so as to construct a learning model. The machine learning device determines whether or not a machining result is good by using the learning model based on the tool information and the machining condition before the machine tool machines a workpiece.
    Type: Application
    Filed: August 31, 2017
    Publication date: March 8, 2018
    Applicant: FANUC CORPORATION
    Inventors: Takuya Saitou, Toshinori Matsukawa
  • Publication number: 20170139403
    Abstract: In a numerical control system including a numerical controller having a tool database and a tool catalog database which can be referred to from the numerical controller, the tool catalog database has tool catalog data including first cutting condition data, and the tool database has tool data including second cutting condition data to be used for machining. After execution of the machining, the numerical controller updates the first cutting condition data to be stored in the tool catalog database based on the second cutting condition data stored in the tool database.
    Type: Application
    Filed: November 15, 2016
    Publication date: May 18, 2017
    Applicant: FANUC CORPORATION
    Inventor: Takuya Saitou
  • Publication number: 20160154404
    Abstract: A numerical controller operates a machine tool based on a plurality of parameters and a machining program. A user is allowed to refer to a parameter that has not been set, in other words, a parameter not falling within the range of recommended setting values, among parameters that may influence the shortening of a cycle time of the operation of the machining program on a display screen. For this reason, the user can use the parameter as a reference for reviewing the parameter setting for the purpose of shortening the cycle time or the like.
    Type: Application
    Filed: November 3, 2015
    Publication date: June 2, 2016
    Inventors: Takuya SAITOU, Koichi MURATA, Mamoru KUBO
  • Publication number: 20140339065
    Abstract: A keyswitch device which is provided with a support mechanism which supports a keytop in a movable manner, and a membrane sheet which has a plurality of upper electrodes and a plurality of lower electrodes which respectively correspond to the plurality of the upper electrodes and which form contact pairs with the corresponding upper electrodes. A plurality of contact pairs are arranged for a single keytop. The rubber cup pushes the plurality of contact pairs which are arranged for the single keytop.
    Type: Application
    Filed: April 29, 2014
    Publication date: November 20, 2014
    Applicant: Fujitsu Component Limited
    Inventors: Hiromi OHTSUKA, Daisuke TAGA, Takuya SAITOU, Momosuke NAKAHARA
  • Patent number: 7219025
    Abstract: The present invention is intended to provide a waveform measuring instrument which can carry out signal processing and waveform parameter measurement with high accuracy and at high resolution. In a waveform measuring instrument configured to write measured signal waveforms into a memory after converting the waveforms to digital data, the present invention is characterized by providing an interpolation system which performs interpolation between the above digital data and writing the data obtained after interpolation into the above memory.
    Type: Grant
    Filed: December 13, 2002
    Date of Patent: May 15, 2007
    Assignee: Yokogawa Electric Corporation
    Inventors: Takuya Saitou, Shigeru Takezawa
  • Patent number: 7219111
    Abstract: The objective is to realize a numeric value search apparatus and numeric value search method capable of rapidly searching for a numeric value of a prescribed rank. The present invention is characterized in that it comprises the following: a storage unit which stores multiple pieces of digitized numeric value data; a resolution specifying means which specifies a frequency distribution resolution; a frequency distribution creation unit which determines the frequency distribution of numeric value data in the storage unit using the resolution specified by this resolution specifying means; and a computation unit which determines the numeric value range or numeric value with the prescribed rank from the frequency distribution determined by this frequency distribution creation unit; wherein the resolution specifying means increases the resolution specified to the frequency distribution creation unit in steps, based on the computation results of the computation unit.
    Type: Grant
    Filed: September 17, 2003
    Date of Patent: May 15, 2007
    Assignee: Yokogawa Electric Corporation
    Inventors: Takuya Saitou, Yoshinobu Sugihara, Shigeru Takezawa
  • Patent number: 6909979
    Abstract: The present invention is intended to provide a waveform measuring instrument whose waveform reproducibility in the equivalent time sampling system is improved. The present invention is characterized by that, in a waveform measuring instrument configured so that the repeated waveform data items are acquired and sent to the acquisition memory by means of the equivalent time sampling, the above acquisition memory is divided into a plurality of time slot regions corresponding to the interval of equivalent time sampling and a plurality of memory address groups is assigned to each time slot region.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: June 21, 2005
    Assignee: Yokogawa Electric Corporation
    Inventors: Takuya Saitou, Shigeru Takezawa
  • Publication number: 20040064490
    Abstract: The objective is to realize a numeric value search apparatus and numeric value search method capable of rapidly searching for a numeric value of a prescribed rank.
    Type: Application
    Filed: September 17, 2003
    Publication date: April 1, 2004
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Takuya Saitou, Yoshinobu Sugihara, Shigeru Takezawa
  • Publication number: 20030120443
    Abstract: The present invention is intended to provide a waveform measuring instrument whose waveform reproducibility in the equivalent time sampling system is improved.
    Type: Application
    Filed: December 18, 2002
    Publication date: June 26, 2003
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Takuya Saitou, Shigeru Takezawa
  • Publication number: 20030115003
    Abstract: The present invention is intended to provide a waveform measuring instrument which can carry out signal processing and waveform parameter measurement with high accuracy and at high resolution.
    Type: Application
    Filed: December 13, 2002
    Publication date: June 19, 2003
    Applicant: YOKOGAWA ELECTRIC CORPORATION
    Inventors: Takuya Saitou, Shigeru Takezawa