Patents by Inventor Tam-Sanh Nguyen

Tam-Sanh Nguyen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS
    Publication number: 20230333547
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Application
    Filed: June 19, 2023
    Publication date: October 19, 2023
    Inventors: Andrew POH, Andre Frederico Cavalheiro MENCK, Arion SPRAGUE, Benjamin GRABHAM, Benjamin LEE, Bianca RAHILL-MARIER, Gregoire OMONT, Jim INOUE, Jonah SCHEINERMAN, Maciej ALBIN, Myles SCOLNICK, Paul GRIBELYUK, Steven FACKLER, Tam-Sanh NGUYEN, Thomas POWELL, William SEATON
  • Systems and methods for determining relationships between defects
    Patent number: 11681282
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: June 20, 2023
    Assignee: Palantir Technologies Inc.
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton
  • SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS
    Publication number: 20200241518
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Application
    Filed: April 10, 2020
    Publication date: July 30, 2020
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton
  • Systems and methods for determining relationships between defects
    Patent number: 10620618
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Grant
    Filed: December 20, 2016
    Date of Patent: April 14, 2020
    Assignee: Palantir Technologies Inc.
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton
  • SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS
    Publication number: 20180173212
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Application
    Filed: December 20, 2016
    Publication date: June 21, 2018
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton