Patents by Inventor Tamaki HORII

Tamaki HORII has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11094120
    Abstract: An inspection processing system includes a control unit connected to a photographing unit and an output unit. The control unit includes circuitry. The inspection processing system identifies a current position, displays a virtual image of a three-dimensional model of a structure corresponding to the current position. The virtual image is superimposed on a structure image obtained from the photographing unit. The inspection processing system further obtains an evaluation result of an evaluation item of an inspection subject using the structure image on which the displayed virtual image is superimposed, and records the evaluation result in an inspection information memory in association with the position of the inspection subject in the three-dimensional model.
    Type: Grant
    Filed: July 25, 2018
    Date of Patent: August 17, 2021
    Assignee: OBAYASHI CORPORATION
    Inventors: Yuichi Ikeda, Tamaki Horii, Kazuyuki Goto, Hidefumi Takenaka, Takayuki Yamamoto
  • Patent number: 11077985
    Abstract: Provided is a mounting base member used in a pair for mounting an object to be conveyed thereon, the mounting base member including: a body part configured to support the object to be conveyed; and a top plate part that extends in at least a horizontal direction from an upper part of the body part. The top plate part covers an upper surface of the body part, or the upper surface of the body part contacting the conveyed object is flush with an upper surface of an extending portion of the top plate part.
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: August 3, 2021
    Assignees: OBAYASHI CORPORATION, SRI INTERNATIONAL
    Inventors: Eri Ohmoto, Satoru Doi, Tomoya Kaneko, Koji Hamada, Tamaki Horii, Maya Kagatani, Tatsuya Osugi, Hiroto Sato, Takashi Tsuchiya, Aveek Das, Poojitha Preena
  • Patent number: 10810734
    Abstract: Embodiments of the present invention generally relate to computer aided rebar measurement and inspection systems. In some embodiments, the system may include a data acquisition system configured to obtain fine-level rebar measurements, images or videos of rebar structures, a 3D point cloud model generation system configured to generate a 3D point cloud model representation of the rebar structure from information acquired by the data acquisition system, a rebar detection system configured to detect rebar within the 3D point cloud model generated or the rebar images or videos of the rebar structures, a rebar measurement system to measure features of the rebar and rebar structures detected by the rebar detection system, and a discrepancy detection system configured to compare the measured features of the rebar structures detected by the rebar detection system with a 3D Building Information Model (BIM) of the rebar structures, and determine any discrepancies between them.
    Type: Grant
    Filed: June 28, 2019
    Date of Patent: October 20, 2020
    Assignee: SRI International
    Inventors: Garbis Salgian, Bogdan C. Matei, Matthieu Henri Lecce, Abhinav Rajvanshi, Supun Samarasekera, Rakesh Kumar, Tamaki Horii, Yuichi Ikeda, Hidefumi Takenaka
  • Publication number: 20200198834
    Abstract: Provided is a mounting base member used in a pair for mounting an object to be conveyed thereon, the mounting base member including: a body part configured to support the object to be conveyed; and a top plate part that extends in at least a horizontal direction from an upper part of the body part. The top plate part covers an upper surface of the body part, or the upper surface of the body part contacting the conveyed object is flush with an upper surface of an extending portion of the top plate part.
    Type: Application
    Filed: December 21, 2018
    Publication date: June 25, 2020
    Applicants: OBAYASHI CORPORATION, area17, Inc.
    Inventors: Eri OHMOTO, Satoru DOI, Tomoya KANEKO, Koji HAMADA, Tamaki HORII, Maya KAGATANI, Tatsuya OSUGI, Hiroto SATO, Takashi TSUCHIYA, Aveek DAS, Poojitha PREENA
  • Publication number: 20200005447
    Abstract: Embodiments of the present invention generally relate to computer aided rebar measurement and inspection systems. In some embodiments, the system may include a data acquisition system configured to obtain fine-level rebar measurements, images or videos of rebar structures, a 3D point cloud model generation system configured to generate a 3D point cloud model representation of the rebar structure from information acquired by the data acquisition system, a rebar detection system configured to detect rebar within the 3D point cloud model generated or the rebar images or videos of the rebar structures, a rebar measurement system to measure features of the rebar and rebar structures detected by the rebar detection system, and a discrepancy detection system configured to compare the measured features of the rebar structures detected by the rebar detection system with a 3D Building Information Model (BIM) of the rebar structures, and determine any discrepancies between them.
    Type: Application
    Filed: June 28, 2019
    Publication date: January 2, 2020
    Inventors: Garbis Salgian, Bogdan C. Matei, Matthieu Henri Lecce, Abhinav Rajvanshi, Supun Samarasekera, Rakesh Kumar, Tamaki Horii, Yuichi Ikeda, Hidefumi Takenaka
  • Publication number: 20190033074
    Abstract: An inspection processing system identifies a current position, obtains an inspection result of an inspection subject of a structure on the current position, and records the inspection result in association with the position of the inspection subject in a three-dimensional model of the structure. The inspection processing system further identifies a user who views the three-dimensional model and a current position, and outputs, to an output unit, an inspection result in which the user is recorded in an inspection information memory as a related person of the inspection subject. The inspection result is attached on a virtual image according to a three-dimensional model corresponding to the current position.
    Type: Application
    Filed: July 25, 2018
    Publication date: January 31, 2019
    Applicant: OBAYASHI CORPORATION
    Inventors: Yuichi IKEDA, Tamaki HORII, Kazuyuki GOTO, Hidefumi TAKENAKA, Takayuki YAMAMOTO
  • Publication number: 20190035155
    Abstract: An inspection processing system includes a control unit connected to a photographing unit and an output unit. The control unit includes circuitry. The inspection processing system identifies a current position, displays a virtual image of a three-dimensional model of a structure corresponding to the current position. The virtual image is superimposed on a structure image obtained from the photographing unit. The inspection processing system further obtains an evaluation result of an evaluation item of an inspection subject using the structure image on which the displayed virtual image is superimposed, and records the evaluation result in an inspection information memory in association with the position of the inspection subject in the three-dimensional model.
    Type: Application
    Filed: July 25, 2018
    Publication date: January 31, 2019
    Applicant: OBAYASHI CORPORATION
    Inventors: Yuichi IKEDA, Tamaki HORII, Kazuyuki GOTO, Hidefumi TAKENAKA, Takayuki YAMAMOTO
  • Patent number: D894645
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: September 1, 2020
    Assignees: OBAYASHI CORPORATION, SRI INTERNATIONAL
    Inventors: Eri Ohmoto, Satoru Doi, Tomoya Kaneko, Koji Hamada, Tamaki Horii, Maya Kagatani, Tatsuya Osugi, Hiroto Sato, Takashi Tsuchiya, Aveek Das, Poojitha Preena
  • Patent number: D913020
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: March 16, 2021
    Assignees: OBAYASHI CORPORATION, SRI INTERNATIONAL
    Inventors: Eri Ohmoto, Satoru Doi, Tomoya Kaneko, Koji Hamada, Tamaki Horii, Maya Kagatani, Tatsuya Osugi, Hiroto Sato, Takashi Tsuchiya, Aveek Das, Poojitha Preena