Patents by Inventor Tanay Bansal

Tanay Bansal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Using deep learning based defect detection and classification schemes for pixel level image quantification
    Patent number: 10672588
    Abstract: A heat map of probable defects in an image can be represented as a matrix of defect probability index corresponding to each pixel. The image may be generated from data received from a detector of a scanning electron microscope or other inspection tools. A number of pixels in the image that exceed a corresponding threshold in the matrix can be quantified.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: June 2, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Hari Pathangi, Sivaprrasath Meenakshisundaram, Tanay Bansal
  • USING DEEP LEARNING BASED DEFECT DETECTION AND CLASSIFICATION SCHEMES FOR PIXEL LEVEL IMAGE QUANTIFICATION
    Publication number: 20200161081
    Abstract: A heat map of probable defects in an image can be represented as a matrix of defect probability index corresponding to each pixel. The image may be generated from data received from a detector of a scanning electron microscope or other inspection tools. A number of pixels in the image that exceed a corresponding threshold in the matrix can be quantified.
    Type: Application
    Filed: January 16, 2019
    Publication date: May 21, 2020
    Inventors: Hari Pathangi, Sivaprrasath Meenakshisundaram, Tanay Bansal