Patents by Inventor Tange N. Barbour

Tange N. Barbour has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of statistical binning for reliability selection
    Patent number: 6789032
    Abstract: A statistical method is described for reliability selection of dies on semiconductor wafers using critical wafer yield parameters. This is combined with other data from the wafer or module level reliability screens (such as voltage screen or burn-in) to obtain the relative latent defect density. Finally the modeled results are compared with actual results to demonstrate confidence in the model.
    Type: Grant
    Filed: December 19, 2002
    Date of Patent: September 7, 2004
    Assignee: International Business Machines Corporation
    Inventors: Tange N. Barbour, Thomas S. Barnett, Matthew S. Grady, Kathleen G. Purdy
  • Method of statistical binning for reliability selection
    Publication number: 20030120445
    Abstract: A statistical method is described for reliability selection of dies on semiconductor wafers using critical wafer yield parameters. This is combined with other data from the wafer or module level reliability screens (such as voltage screen or burn-in) to obtain the relative latent defect density. Finally the modeled results are compared with actual results to demonstrate confidence in the model.
    Type: Application
    Filed: December 19, 2002
    Publication date: June 26, 2003
    Applicant: International Business Machines Corporation
    Inventors: Tange N. Barbour, Thomas S. Barnett, Matthew S. Grady, Kathleen G. Purdy