Patents by Inventor Tarick J. EL-BABA

Tarick J. EL-BABA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Identification of sample subspecies based on particle mass and charge over a range of sample temperatures
    Patent number: 11942317
    Abstract: A method for analyzing charged particles may include generating, in or into an ion source region, charged particles from a sample of particles, causing the charged particles to enter a mass spectrometer from the ion source region at each of a plurality of differing physical and/or chemical conditions in a range of physical and/or chemical conditions in which the sample particles undergo structural changes, controlling the mass spectrometer to measure at least the charge magnitudes of the generated charged particles at each of the plurality of differing physical and/or chemical conditions, determining, with a processor, an average charge magnitude of the generated charged particles at each of the plurality of differing physical and/or chemical conditions based on the measured charge magnitudes, and determining, with the processor, an average charge magnitude profile over the range of physical and/or chemical conditions based on the determined average charge magnitudes.
    Type: Grant
    Filed: April 22, 2020
    Date of Patent: March 26, 2024
    Assignee: THE TRUSTEES OF INDIANA UNIVERSITY
    Inventors: David E. Clemmer, Martin F. Jarrold, Tarick J. El-Baba, Corinne A. Lutomski
  • IDENTIFICATION OF SAMPLE SUBSPECIES BASED ON PARTICLE MASS AND CHARGE OVER A RANGE OF SAMPLE TEMPERATURES
    Publication number: 20220216047
    Abstract: A method for analyzing charged particles may include generating, in or into an ion source region, charged particles from a sample of particles, causing the charged particles to enter a mass spectrometer from the ion source region at each of a plurality of differing physical and/or chemical conditions in a range of physical and/or chemical conditions in which the sample particles undergo structural changes, controlling the mass spectrometer to measure at least the charge magnitudes of the generated charged particles at each of the plurality of differing physical and/or chemical conditions, determining, with a processor, an average charge magnitude of the generated charged particles at each of the plurality of differing physical and/or chemical conditions based on the measured charge magnitudes, and determining, with the processor, an average charge magnitude profile over the range of physical and/or chemical conditions based on the determined average charge magnitudes.
    Type: Application
    Filed: April 22, 2020
    Publication date: July 7, 2022
    Inventors: David E. CLEMMER, Martin F. JARROLD, Tarick J. EL-BABA, Corinne A. LUTOMSKI