Abstract: Aspects relate to a miniaturized gas cell that may be implemented into an integrated device for gas analysis. The miniaturized gas cell may be a multi-pass gas cell or a hollow waveguide gas cell. In some aspects, the miniaturized gas cell may include a bottom surface and sidewalls formed in a substrate (e.g., a silicon substrate or silicon on insulator (SOI) substrate). The gas cell further includes at least one gas inlet and at least one gas outlet coupled for injection of a gas into and out of the gas cell, respectively. In addition, the gas cell further includes an optical input and an optical output, each optically coupled to direct light into and out of the gas cell, respectively. In addition, a capping layer may be bonded to the substrate to form a top surface of the gas cell.

Abstract: The invention relates to a method for simultaneously analyzing at least two samples using a chromatography device comprising a chromatography column having an inlet and an outlet, and at least one detector placed at the outlet of the chromatography column, the method comprising steps of: injecting fractions of each independent sample at the inlet of the chromatography column, the fractions of each independent sample being injected according to a specific injection timing sequence derived from a pseudo-random binary sequence associated with said independent sample; recording a signal generated by said detector for a period of time at least equal to a duration of the longest of the specific injection timing sequences; cross-correlating the recorded signal and a derived correlation function, said derived correlation function being derived from the pseudo-random binary sequence associated with one of the independent samples, so as to obtain an individual correlogram signal specific to said independent sample; and

Abstract: The invention relates to a method for simultaneously analyzing at least two samples using a chromatography device comprising a chromatography column having an inlet and an outlet, and at least one detector placed at the outlet of the chromatography column, the method comprising steps of: injecting fractions of each independent sample at the inlet of the chromatography column, the fractions of each independent sample being injected according to a specific injection timing sequence derived from a pseudo-random binary sequence associated with said independent sample; recording a signal generated by said detector for a period of time at least equal to a duration of the longest of the specific injection timing sequences; cross-correlating the recorded signal and a derived correlation function, said derived correlation function being derived from the pseudo-random binary sequence associated with one of the independent samples, so as to obtain an individual correlogram signal specific to said independent sample; and

Abstract: A semiconductor scanner substrate includes a vibrating structure of a mirror supported by a beam projecting from a frame. Strain sensing piezoresistors are formed in a base region of the beam adjacent to the frame. Metal interconnections are formed in the frame to connect the piezoresistors in a bridge circuit for sensing bending deformation or in a bridge circuit for sensing twisting deformation. Two of the piezoresistors extend alongside the lateral edges of the beam in the longitudinal direction of the beam, and these resistors are connected as adjacent arms in the bridge circuit for sensing the twisting deformation accurately.

Abstract: A semiconductor scanner substrate includes a vibrating structure of a mirror supported by a beam projecting from a frame. Strain sensing piezoresistors are formed in a base region of the beam adjacent to the frame. Metal interconnections are formed in the frame to connect the piezoresistors in a bridge circuit for sensing bending deformation or in a bridge circuit for sensing twisting deformation. Two of the piezoresistors extend alongside the lateral edges of the beam in the longitudinal direction of the beam, and these resistors are connected as adjacent arms in the bridge circuit for sensing the twisting deformation accurately.