Patents by Inventor Tate Picard

Tate Picard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Networking architecture for thermal processing system
    Publication number: 20070145019
    Abstract: A thermal processing system includes a thermal torch for processing a workpiece, a power supply for providing power to the thermal torch, a positioning system for relatively moving the thermal torch and the workpiece, a controller for controlling the thermal processing system, and a deterministic-based communication network, such as, for example, a network which operates using SERCOS. The deterministic-based communications network connects at least the controller, the power supply, and the positioning system of the thermal processing system together.
    Type: Application
    Filed: December 28, 2005
    Publication date: June 28, 2007
    Inventors: Tate Picard, Gregory Wilson, Jeffery Peterson
  • Centralized control architecture for a plasma arc system
    Publication number: 20060219674
    Abstract: Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector for measuring a signal emitted from the workpiece as a result of the incident laser beam. The detector generates at least two signals based upon the optical signal. The method also involves use of a light source monitor in determining workpiece processing quality based upon the quotient of the two outputs as well as a magnitude of one of the two quotients.
    Type: Application
    Filed: March 8, 2006
    Publication date: October 5, 2006
    Applicant: Hypertherm, Inc.
    Inventors: Tate Picard, Roger Young, Gregory Wilson, Ronald Huppe
  • Centralized control architecture for a plasma arc system
    Publication number: 20060108333
    Abstract: Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector for measuring a signal emitted from the workpiece as a result of the incident laser beam. The detector generates at least two signals based upon the optical signal. The method also involves use of a light source monitor in determining workpiece processing quality based upon the quotient of the two outputs as well as a magnitude of one of the two quotients.
    Type: Application
    Filed: December 30, 2005
    Publication date: May 25, 2006
    Applicant: Hypertherm, Inc.
    Inventors: Tate Picard, Kenneth Woods, Roger Young, William Connally
  • Centralized control architecture for a laser materials processing system
    Publication number: 20050205530
    Abstract: Apparatus, systems, and methods for monitoring the processing of a workpiece that includes directing an incident laser beam onto the workpiece and using an optical detector for measuring a signal emitted from the workpiece as a result of the incident laser beam. The detector generates at least two signals based upon the optical signal. The method also involves use of a light source monitor in determining workpiece processing quality based upon the quotient of the two outputs as well as a magnitude of one of the two quotients.
    Type: Application
    Filed: May 13, 2005
    Publication date: September 22, 2005
    Applicant: Hypertherm, Inc.
    Inventors: Tate Picard, Kenneth Woods, Roger Young, William Connally