Abstract: A separator includes: an anode separator including an anode side surface on which a fuel gas flow passage groove is formed; a cathode separator including a cathode side surface on which an oxidation gas flow passage groove is formed; a joint portion that extends so as to surround the fuel gas flow passage groove and the oxidation gas flow passage groove, and joins the anode separator and the cathode separator to each other; and an outer peripheral seal portion provided on at least one of the fuel gas flow passage groove and the oxidation gas flow passage groove, extending along the joint portion, and formed so as to overlap the joint portion when viewed in a thickness direction of the separator.

Abstract: A stator including, a stator core having a slot, a winding wire to be inserted into the slot; and an insulation sheet interposed between the slot and the winding wire and configured to electrically insulate an inner wall of the slot and the winding wire, wherein the insulation sheet includes an insulation paper, a first adhesive layer disposed on a front surface of the insulation paper facing the inner wall of the slot, and a second adhesive layer disposed on a back surface of the insulation paper facing the winding wire, a foaming adhesive to be thermally cured while foaming by heating is disposed on the first adhesive layer, and a non-foaming adhesive having lower viscosity than that of the foaming adhesive when unheated is disposed on the second adhesive layer.

Abstract: A sound output device includes a device main frame in which at least a speaker is disposed, and an attachment aid member that is joined to the device main frame. In the sound output device, the attachment aid member includes an annular support portion at least a part of which is inserted into a cavum concha, and the annular support portion includes a contact portion that comes into contact with a part of an ear in the cavum concha while being elastically deformed. With this arrangement, the contact portion of the annular support portion inserted into the cavum concha comes into contact with a part of the ear in the cavum concha while being elastically deformed. Accordingly, it is possible to attach the sound output device to the ear, using the attachment aid member, regardless of the size and the shape of the ear.

Abstract: An electron spectrometer is provided which can collect spectra in a reduced measurement time. The electron spectrometer includes an electron analyzer for providing energy dispersion of electrons emitted from a sample (S), a detector having a plurality of detection elements juxtaposed and arranged in the direction of energy dispersion of the dispersed electrons, and a processor. The processor operates (i) to sweep a measurement energy in first incremental energy steps (?E1) within the analyzer, to detect the dispersed electrons with the detection elements, and to obtain a plurality of resulting first spectra; (ii) to interpolate points of measurement in each of the first spectra; and (iii) to generate a spectral chart in second incremental energy steps (?E2) smaller than the first incremental energy steps (?E1) on the basis of the first spectra for which the points of measurement have been interpolated.

Abstract: A charged particle beam apparatus that forms a probe with a charged particle beam and scans a specimen with the probe to acquire a scanning image. The charged particle beam apparatus includes an optical system for scanning the specimen with the probe; a detector that detects a signal generated from the specimen through the scanning of the specimen with the probe; and a control unit that controls the optical system. The control unit performs correction processing of acquiring a reference image obtained by the scanning of the specimen with the probe, comparing the reference image to a criterion image to determine a drift amount, and correcting a displacement of an irradiation position with the probe on the specimen based on the drift amount; and processing of setting a frequency with which the correction processing is to be performed based on the drift amount.

Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.

Abstract: An analysis method includes: obtaining n×m pieces of map data by repeating, m times, a map measurement in which n pieces of map data are obtained by scanning a specimen with a primary probe to detect electrons emitted from the specimen with an electron spectrometer, while measurement energy ranges of an analyzer are varied; and generating a spectral map in which a position on the specimen is associated with a spectrum based on the n×m pieces of map data, the measurement energy ranges of m times of the map measurement not overlapping each other.

Abstract: A thermally conductive elastomer composition of the present invention contains: 100 parts by mass of a styrene-based elastomer; from 610 to 750 parts by mass of a process oil formed of a petroleum-based hydrocarbon, the a process oil having a weight average molecular weight of not greater than 600; from 25 to 40 parts by mass of a solid nonionic surfactant having an HLB value of 2.0 or greater; from 260 to 640 parts by mass of aluminum hydroxide powder; and from 250 to 340 parts by mass of artificial graphite powder.

Abstract: A sound output device includes: a device main frame in which at least a speaker is disposed; and an attachment aid member that is joined to the device main frame. In the sound output device, the attachment aid member includes an annular support portion at least a part of which is inserted into a cavum concha, and the support portion includes a contact portion that comes into contact with a part of an ear in the cavum concha while being elastically deformed. With this arrangement, the contact portion of the support portion inserted into the cavum concha comes into contact with a part of the ear in the cavum concha while being elastically deformed. Accordingly, it is possible to attach the sound output device to the ear, using the attachment aid member, regardless of the size and the shape of the ear. Thus, user-friendliness of the sound output device can be increased, and a state in which the sound output device is stably attached to the ear can be secured.

Abstract: An input lens is provided which has a large acceptance solid angle for electrons. The input lens is for use in an electron spectrometer and disposed between an electron source producing electrons and an electron analyzer in the electron spectrometer. The input lens has a reference electrode at a reference potential, a slit, first through nth electrodes, where n is an integer equal to or greater than three, arranged between the reference electrode and the slit, and a second mesh attached to the first electrode. The first through nth electrodes are arranged in this order along an optical axis. The second mesh is at a potential higher than the reference potential.

Abstract: An Auger electron microscope includes a processing unit, and the processing unit performs processing of: acquiring an actually measured Auger spectrum obtained by measuring a test specimen containing an analysis target element; acquiring a plurality of first standard Auger spectra obtained by measuring a plurality of standard specimens each containing the same analysis target element but in different chemical states; calculating, based on a test specimen measurement condition that is a measurement condition when the test specimen has been measured and a standard specimen measurement condition that is a measurement condition when the standard specimens have been measured, a plurality of second standard Auger spectra under the test specimen measurement condition from the plurality of first standard Auger spectra; and performing curve fitting calculation of the actually measured Auger spectrum by using the plurality of calculated second standard Auger spectra.

Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.

Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.

Abstract: A fixture includes two mounted portions and an interposing portion. At least the one mounted portion includes a strut portion, a check portion, and an abutment portion. The strut portion is insertable into a mounting hole provided in a mounting target. The check portion is caught on the mounting target on an outlet side of the mounting hole. The abutment portion abuts on the mounting target on an inlet side of the mounting hole. When any one of the mounting target or the fixture vibrates, the check portion and the abutment portion deform to suppress a vibration in a direction parallel to an insertion direction. When any one of the mounting target or the fixture vibrates, the interposing portion deforms to suppress a vibration in a direction parallel to a plane orthogonal to the insertion direction.

Abstract: An Auger electron microscope includes a processing unit, and the processing unit performs processing of: acquiring an actually measured Auger spectrum obtained by measuring a test specimen containing an analysis target element; acquiring a plurality of first standard Auger spectra obtained by measuring a plurality of standard specimens each containing the same analysis target element but in different chemical states; calculating, based on a test specimen measurement condition that is a measurement condition when the test specimen has been measured and a standard specimen measurement condition that is a measurement condition when the standard specimens have been measured, a plurality of second standard Auger spectra under the test specimen measurement condition from the plurality of first standard Auger spectra; and performing curve fitting calculation of the actually measured Auger spectrum by using the plurality of calculated second standard Auger spectra.

Abstract: A method of generating an elemental map includes: acquiring a plurality of correction channel images by scanning a surface of a standard specimen having a uniform elemental concentration with a primary beam and generating a correction channel image for each channel; generating correction information for each pixel of each correction channel image among the plurality of correction channel images based on a brightness value of the pixel; acquiring a plurality of analysis channel images by scanning a surface of a specimen to be analyzed with the primary beam and generating an analysis channel image for each channel; correcting brightness values of pixels constituting an analysis channel image among the plurality of analysis channel images based on the correction information; and generating an elemental map of the specimen to be analyzed based on the plurality of analysis channel images having pixels with corrected brightness values.

Abstract: An analysis method includes: obtaining n×m pieces of map data by repeating, m times, a map measurement in which n pieces of map data are obtained by scanning a specimen with a primary probe to detect electrons emitted from the specimen with an electron spectrometer, while measurement energy ranges of an analyzer are varied; and generating a spectral map in which a position on the specimen is associated with a spectrum based on the n×m pieces of map data, the measurement energy ranges of m times of the map measurement not overlapping each other.

Abstract: An input lens is provided which has a large acceptance solid angle for electrons. The input lens is for use in an electron spectrometer and disposed between an electron source producing electrons and an electron analyzer in the electron spectrometer. The input lens has a reference electrode at a reference potential, a slit, first through nth electrodes, where n is an integer equal to or greater than three, arranged between the reference electrode and the slit, and a second mesh attached to the first electrode. The first through nth electrodes are arranged in this order along an optical axis. The second mesh is at a potential higher than the reference potential.

Abstract: A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.

Abstract: A thermally conductive elastomer composition of the present technology contains 100 parts by mass of a styrene-based elastomer, from 400 to 540 parts by mass of a process oil formed of a petroleum-based hydrocarbon, from 950 to 1350 parts by mass of aluminum hydroxide having an average particle diameter from 3 ?m to 20 ?, and from 70 to 80 parts by mass of expanded graphite having an average particle diameter from 3 ?m to 20 ?m, where a difference between the average particle diameter of the aluminum hydroxide and the average particle diameter of the expanded graphite is within 5 ?m.