Patents by Inventor Ted T. Turner

Ted T. Turner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5581463
    Abstract: A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities and multiple hardware resources, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities and the hardware resources of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities and the tester hardware resources.
    Type: Grant
    Filed: February 14, 1994
    Date of Patent: December 3, 1996
    Assignee: Hewlett-Packard Co
    Inventors: Amanda L. Constant, David W. Webb, Sharon E. LaTourrette, Jeffrey C. Myers, Katherine Z. Withers-Miklos, Kay C. Lannen, Ted T. Turner, Amos H. Leong
  • Patent number: 5481463
    Abstract: A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities.
    Type: Grant
    Filed: February 15, 1995
    Date of Patent: January 2, 1996
    Assignee: Hewlett-Packard Company
    Inventors: Amanda L. Constant, David W. Webb, Katherine Z. Withers-Miklos, Kay C. Lannen, Ted T. Turner, Amos H.-K. Leong
  • Patent number: 5412575
    Abstract: A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities.
    Type: Grant
    Filed: October 7, 1993
    Date of Patent: May 2, 1995
    Assignee: Hewlett-Packard Company
    Inventors: Amanda L. Constant, David W. Webb, Katherine Z. Withers-Miklos, Kay C. Lannen, Ted T. Turner, Amos Hong-Kiat Leong