Patents by Inventor Tetsuo Tatsuda

Tetsuo Tatsuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150185080
    Abstract: A spectrometry apparatus includes a wavelength variable interference filter emitting light of various predetermined wavelengths; a roll shutter imaging element having pixels accumulating electric charges when exposed to light, and forming one frame by photodetection for each pixel block including pixels with a predetermined time delay for each pixel block, in which the imaging element accumulates electric charges in a photodetection period, and outputs a detection signal in response to the accumulated electric charges in a non-photodetection period; and a spectroscopic controller controlling the wavelength change driving of the emitted light of the wavelength variable interference filter. For the one frame, the spectroscopic controller starts the wavelength change driving at an end timing of the photodetection period of a final pixel block for which the photodetection process is performed at the end.
    Type: Application
    Filed: December 23, 2014
    Publication date: July 2, 2015
    Inventors: Danjun ZHAO, Tetsuo TATSUDA, Shinichi ARAZAKI
  • Publication number: 20150116707
    Abstract: A spectroscopic measurement device includes a variable wavelength interference filter capable of selectively emitting light with a predetermined wavelength out of incident light, and changing the wavelength of the light to be emitted, a light receiving element adapted to output a detection signal corresponding to a light exposure in response to an exposure to the light emitted from the variable wavelength interference filter, a detection signal acquisition section adapted to obtain a plurality of detection signals different in the light exposure from each other with respect to each of the wavelengths, and a selection section adapted to select the detection signal having a highest signal level out of signal levels of the detection signals obtained, which are lower than a maximum signal level corresponding to a saturated light exposure of the light receiving element.
    Type: Application
    Filed: October 28, 2014
    Publication date: April 30, 2015
    Inventor: Tetsuo TATSUDA
  • Publication number: 20140218735
    Abstract: An imaging section that detects the amount of light separated by a wavelength tunable interference filter to acquire a spectroscopic image (imaging device and light amount acquisition section) detects the amount of light successively separated for three wavelengths to acquire spectroscopic images for producing a combined image. A display controller causes a display section to display a combined image based on the spectroscopic images for producing the combined image. A specified position detection section identifies based on user's operation a specified position where a colorimetry result is to be outputted. The imaging section detects the amount of light successively separated for a plurality of wavelengths by the wavelength tunable interference filter to acquire spectroscopic images for colorimetry corresponding to the plurality of wavelengths. A colorimetry section measures the color in the specified position by using the amount of light obtained from each of the spectroscopic images for colorimetry.
    Type: Application
    Filed: January 31, 2014
    Publication date: August 7, 2014
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Tetsuo TATSUDA
  • Patent number: 7649165
    Abstract: An apparatus including: a photodiode including: a first conductivity substrate; a second conductivity PD-well on the substrate's first surface side; and a first conductivity collection well inside the PD-well; a modulation transistor including: a second conductivity TR-well connected with the PD-well, and a junction depth shallower than that of the PD-well; a first conductivity modulation well inside the TR-well, and connected with the collection well; a second conductivity source inside the modulation well, and including a region contacting the first surface; a gate electrode in a region partially covering the modulation well and enclosing the source; a gate insulation layer between the gate and the first surface; and a second conductivity drain partially sandwiching the gate and opposing the source, and including a region contacting the first surface; and a transfer transistor connected to modulation transistors in pixels between the source and a connected source line.
    Type: Grant
    Filed: March 21, 2008
    Date of Patent: January 19, 2010
    Assignee: Seiko Epson Corporation
    Inventors: Yorito Sakano, Sanae Nishida, Kazunobu Kuwazawa, Tetsuo Tatsuda
  • Publication number: 20090128120
    Abstract: A reference voltage generation circuit includes a plurality of resistors that divide a prescribed input reference voltage into a plurality of divisional voltages and a plurality of analogue switches one of which selects one of the divisional voltages to output the selected divisional voltage as a desired reference voltage. Each of the analogue switches is formed of a transistor, and a size of the transistor is varied corresponding to a level of the reference voltage to be output.
    Type: Application
    Filed: November 13, 2008
    Publication date: May 21, 2009
    Applicant: SEIKO EPSON CORPORATION
    Inventor: Tetsuo TATSUDA
  • Publication number: 20090014628
    Abstract: An apparatus including: a photodiode including: a first conductivity substrate; a second conductivity PD-well on the substrate's first surface side; and a first conductivity collection well inside the PD-well; a modulation transistor including: a second conductivity TR-well connected with the PD-well, and a junction depth shallower than that of the PD-well; a first conductivity modulation well inside the TR-well, and connected with the collection well; a second conductivity source inside the modulation well, and including a region contacting the first surface; a gate electrode in a region partially covering the modulation well and enclosing the source; a gate insulation layer between the gate and the first surface; and a second conductivity drain partially sandwiching the gate and opposing the source, and including a region contacting the first surface; and a transfer transistor connected to modulation transistors in pixels between the source and a connected source line.
    Type: Application
    Filed: March 21, 2008
    Publication date: January 15, 2009
    Applicant: Seiko Epson Corporation
    Inventors: Yorito Sakano, Sanae Nishida, Kazunobu Kuwazawa, Tetsuo Tatsuda
  • Patent number: 6505004
    Abstract: A photometric apparatus for a microscope comprises a light-reception element having a plurality of concentrically arranged photometric measurement areas, the light-reception element receiving observation light from the microscope and measuring a brightness of an observation image of the observation light, a calculation circuit for calculating an exposure time necessary for photographing the observation image, on the basis of a photometric measurement value obtained from at least one of the photometric measurement areas of the light-reception element, and a control circuit for performing an exposure operation on the basis of the exposure time calculated by the calculation circuit.
    Type: Grant
    Filed: February 27, 2002
    Date of Patent: January 7, 2003
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Jitsunari Kojima, Kazuhiko Tsubota, Keiichi Iizuka, Tetsuo Tatsuda, Ri Sei, Tomohiro Uchida
  • Publication number: 20020090218
    Abstract: A photometric apparatus for a microscope comprises a light-reception element having a plurality of concentrically arranged photometric measurement areas, the light-reception element receiving observation light from the microscope and measuring a brightness of an observation image of the observation light, a calculation circuit for calculating an exposure time necessary for photographing the observation image, on the basis of a photometric measurement value obtained from at least one of the photometric measurement areas of the light-reception element, and a control circuit for performing an exposure operation on the basis of the exposure time calculated by the calculation circuit.
    Type: Application
    Filed: February 27, 2002
    Publication date: July 11, 2002
    Applicant: OLYMPUS OPTICAL CO., LTD.
    Inventors: Jitsunari Kojima, Kazuhiko Tsubota, Keiichi Iizuka, Tetsuo Tatsuda
  • Patent number: 6385403
    Abstract: A photometric apparatus for a microscope comprises a light-reception element having a plurality of concentrically arranged photometric measurement areas, the light-reception element receiving observation light from the microscope and measuring a brightness of an observation image of the observation light, a calculation circuit for calculating an exposure time necessary for photographing the observation image, on the basis of a photometric measurement value obtained from at least one of the photometric measurement areas of the light-reception element, and a control circuit for performing an exposure operation on the basis of the exposure time calculated by the calculation circuit.
    Type: Grant
    Filed: October 27, 1999
    Date of Patent: May 7, 2002
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Jitsunari Kojima, Kazuhiko Tsubota, Keiichi Iizuka, Tetsuo Tatsuda