Patents by Inventor Tetsuya Sakaniwa

Tetsuya Sakaniwa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test apparatus, test method and manufacturing method
    Patent number: 8014969
    Abstract: There is provided a test apparatus for testing a plurality of devices under test. The test apparatus includes a signal input section that applies a test signal to the devices under test so as to cause the devices under test to concurrently output response signals, a combining section that generates a single combination signal by using the response signals output from the devices under test, and a judging section that judges whether the devices under test operate normally with reference to the combination signal.
    Type: Grant
    Filed: December 27, 2007
    Date of Patent: September 6, 2011
    Assignee: Advantest Corporation
    Inventors: Hirokatsu Niijima, Koji Hara, Noriyoshi Kozuka, Kohei Shibata, Tetsuya Sakaniwa
  • TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD
    Publication number: 20090240365
    Abstract: There is provided a test apparatus for testing a plurality of devices under test. The test apparatus includes a signal input section that applies a test signal to the devices under test so as to cause the devices under test to concurrently output response signals, a combining section that generates a single combination signal by using the response signals output from the devices under test, and a judging section that judges whether the devices under test operate normally with reference to the combination signal.
    Type: Application
    Filed: December 27, 2007
    Publication date: September 24, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: HIROKATSU NIIJIMA, KOJI HARA, NORIYOSHI KOZUKA, KOHEI SHIBATA, TETSUYA SAKANIWA