Patents by Inventor Teunis J. A. Heijmans

Teunis J. A. Heijmans has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray spectrometer having a doubly curved crystal
    Patent number: 4949367
    Abstract: An X-ray analysis crystal is also curved in a direction transverse to the dispersion direction to increase the radiation efficiency. As a result of this radiation diffracted at the crystal is focused towards a detector input. In order to ensure a non-deformable crystal surface the crystal is preferably bonded to a carrier having an adapted bonding profile.
    Type: Grant
    Filed: March 29, 1989
    Date of Patent: August 14, 1990
    Assignee: U.S. Philips Corporation
    Inventors: Albert Huizing, Cornelis P. G. M. Zegers, Teunis J. A. Heijmans, Maurits W. Van Tol