Patents by Inventor Thappeta Peddaiah

Thappeta Peddaiah has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9863997
    Abstract: Devices, methods, and systems for localizing a fault on a live cable are described herein. One system includes a wire fault localizer configured to receive current information from a location where direct current is applied to a cable comprising a number of loads, receive additional current information from at least two additional locations on the cable, wherein one of the at least two additional locations is on a source side of the cable and one of the at least two additional locations is on a load side of the cable, determine a fault resistance of the cable based on the received current information and received additional current information, and determine a fault distance on the cable based on the fault resistance.
    Type: Grant
    Filed: June 19, 2015
    Date of Patent: January 9, 2018
    Assignee: Honeywell International Inc.
    Inventors: Venkat Poluru, Mahadevanna Basavaraj Shreshthi, Thappeta Peddaiah, Zhenning Liu, Sundeep Vanka
  • Publication number: 20160370419
    Abstract: Devices, methods, and systems for localizing a fault on a live cable are described herein. One system includes a wire fault localizer configured to receive current information from a location where direct current is applied to a cable comprising a number of loads, receive additional current information from at least two additional locations on the cable, wherein one of the at least two additional locations is on a source side of the cable and one of the at least two additional locations is on a load side of the cable, determine a fault resistance of the cable based on the received current information and received additional current information, and determine a fault distance on the cable based on the fault resistance.
    Type: Application
    Filed: June 19, 2015
    Publication date: December 22, 2016
    Inventors: Venkat Poluru, Mahadevanna Basavaraj Shreshthi, Thappeta Peddaiah, Zhenning Liu, Sundeep Vanka
  • Patent number: 8324906
    Abstract: Hidden or overlapped peaks may occur when using SSTDR technology to determine ware faults. These hidden/overlapped peaks may cause false negative determinations (no fault) when testing a wire for faults. In one method of the present invention, the symmetrical property of the SSTDR wave envelope is used to resolve hidden/overlapped peaks. In another method of the present invention, the calibrated normalized loop back SSTDR wave envelope may be used to resolve hidden/overlapped peaks.
    Type: Grant
    Filed: March 19, 2010
    Date of Patent: December 4, 2012
    Assignee: Honeywell International Inc.
    Inventors: Shaik Shafi Ahamed, Srinivasa Rao Dangeti, Narasimha Rao Pesala, Thappeta Peddaiah, Sreenivasulu Reddy Vedicherla, Vedagiribabu Subramanyam, Zhenning Liu
  • Publication number: 20110227582
    Abstract: Hidden or overlapped peaks may occur when using SSTDR technology to determine ware faults. These hidden/overlapped peaks may cause false negative determinations (no fault) when testing a wire for faults. In one method of the present invention, the symmetrical property of the SSTDR wave envelope is used to resolve hidden/overlapped peaks. In another method of the present invention, the calibrated normalized loop back SSTDR wave envelope may be used to resolve hidden/overlapped peaks.
    Type: Application
    Filed: March 19, 2010
    Publication date: September 22, 2011
    Applicant: HONEYWELL INTERNATIONAL INC.
    Inventors: SHAIK SHAFI AHAMED, SRINIVASA RAO DANGETI, NARASIMHA RAO PESALA, THAPPETA PEDDAIAH, SREENIVASULU REDDY VEDICHERLA, VEDAGIRIBABU SUBRAMANYAM, ZHENNING LIU