Abstract: An internal shim used to accurately measure spaces in conjunction with a standard small probe has a shim top and a chassis. The internal shim is adjustably fixed within the space to be measured using grippers that emerge from the chassis and which are controlled by an arm pivotably attached to the shim top. A standard small probe passes through the shim along guides on the chassis and measures the distance between the exterior of the chassis and the boundary. By summing the measurements on each side of the chassis and the width of the chassis, the dimension of the space can be determined to within 0.001 inches.

Abstract: Electrical components such as IC modules and printed circuit boards, at least one of which has an array of solder balls or other protruding conductors, are connected quickly, precisely and economically with a component locator having openings adapted to capture the protruding conductors. The locator is aligned with one of the components, and the other component is pressed against the locator. The protruding conductors enter the capture openings and complete electrical circuits with contacts on the other conductor.