Patents by Inventor Thilo Michel
Thilo Michel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11958009Abstract: A filter device for ambient air filtration has a blower housing with air inlet and air outlet. A device for generating an air flow is arranged in the blower housing and generates an air flow in operation from air inlet to air outlet. A flexible air conducting hose is provided with a first open end connected to the air outlet of the blower housing and with a second closed end. The flexible air conducting hose has openings arranged between first open end and second closed end. Filter elements are arranged in the openings, respectively. The filter elements separate a raw side inside the air conducting hose from a clean side downstream of the filter element. The air conducting hose is inflated in operation of the device by the air flow. The flexible air conducting hose has a reduced air permeability compared to the air permeability of the filter elements.Type: GrantFiled: March 1, 2021Date of Patent: April 16, 2024Assignee: MANN+HUMMEL GmbHInventors: Christoph Schulz, Tobias Warth, Marc Hittinger, Jens Gusek, Maximilian Bauch, Thilo Mueller, Anja Koronai-Bauer, Sylvain Michel Tchale, Roman Eder
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Patent number: 9498171Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.Type: GrantFiled: September 17, 2014Date of Patent: November 22, 2016Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Gisela Anton, Florian Bayer, Jürgen Durst, Thilo Michel, Georg Pelzer, Jens Rieger, Thomas Weber
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Patent number: 9500602Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.Type: GrantFiled: September 17, 2014Date of Patent: November 22, 2016Assignee: SIEMENS AKTIENGESELLSCHAFTInventors: Gisela Anton, Florian Bayer, Jürgen Durst, Thilo Michel, Georg Pelzer, Jens Rieger, Thomas Weber
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Patent number: 9297912Abstract: The present invention relates to a pixel detector (10), comprising a semiconductor sensor layer (12), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer (14) connected to said semiconductor layer (12), said read-out electronics layer (14) comprising an array of read-out circuits (20) for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (12). The neighboring read-out circuits (20) are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits (20).Type: GrantFiled: September 21, 2011Date of Patent: March 29, 2016Assignees: CERN—European Organization for Nuclear Resesarch, Friedrich-Alexander-Universitat Erlange-Nurnberg, Czech Technical University in PragueInventors: Michael Campbell, Thilo Michel, Jan Jakubek
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Patent number: 9069081Abstract: Radiation detector for measuring one or more characteristics of a radiation, comprising one or more detector pixels, a clock pulse generator, each detector pixel comprising a sensor producing an electrical signal in response to an event of a photon or charged particle of said radiation impinging on said sensor; a pixel electronics adapted for receiving and processing said electrical signal, comprising an analog processing unit for amplifying and shaping said electrical signal and producing a shaped pulse said pixel electronics comprises time determination unit for counting the TOT-count, the TOT-count being the number of clock pulses occurring during the time interval when said shaped pulse is above a threshold. Said pixel electronics comprises a plurality of event counters, each event counter counting the number of events having a TOT-count in a predefined ranges.Type: GrantFiled: August 11, 2008Date of Patent: June 30, 2015Assignees: European Organization For Nuclear Research (CERN), Friedrich-Alexander-Universitat Erlangen-Nurnberg, Ion Beam Applications S.A.Inventors: Michael Campbell, Xavier Llopart Cudie, Lukas Tlustos, Winnie Sze-Wing Wong, Rafael Ballabriga Suñe, Gisela Anton, Thilo Michel, Michael Böhnel, Karl L. Schwartz, Uwe Mollenhauer, Ernst Fritsch
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Publication number: 20150092915Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.Type: ApplicationFiled: September 17, 2014Publication date: April 2, 2015Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER
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Publication number: 20150092914Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.Type: ApplicationFiled: September 17, 2014Publication date: April 2, 2015Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER
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Patent number: 8913714Abstract: A detector arrangement is disclosed for performing phase-contrast measurements, including at least two transducer layers arranged one behind the other, wherein at least the first transducer layer arranged in the radiation direction includes alternate sensitive areas having a high absorptance for the conversion of incident radiation quanta into signals and less sensitive areas having a lower absorptance in comparison thereto. Further, a corresponding X-ray tomography device and a method for performing phase-contrast measurements are also enclosed.Type: GrantFiled: April 13, 2010Date of Patent: December 16, 2014Assignee: Siemens AktiengesellschaftInventors: Thilo Michel, Peter Bartl, Gisela Anton
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Publication number: 20140332691Abstract: The present invention relates to a pixel detector (10), comprising a semiconductor sensor layer (12), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer (14) connected to said semiconductor layer (12), said read-out electronics layer (14) comprising an array of read-out circuits (20) for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (12). The neighbouring read-out circuits (20) are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighbouring read-out circuits (20).Type: ApplicationFiled: September 21, 2011Publication date: November 13, 2014Applicants: CERN - EUROPEAN ORGANIZATION FOR NUCLEAR RESEARCH, Friedrich-Alexander-Universitat Erlangen-Numberg, Czech Technical University in Prague Institute of Experimental and Applied PhysicsInventors: Michael Campbell, Thilo Michel, Jan Jakubek
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Publication number: 20120033785Abstract: A detector arrangement is disclosed for performing phase-contrast measurements, including at least two transducer layers arranged one behind the other, wherein at least the first transducer layer arranged in the radiation direction includes alternate sensitive areas having a high absorptance for the conversion of incident radiation quanta into signals and less sensitive areas having a lower absorptance in comparison thereto. Further, a corresponding X-ray tomography device and a method for performing phase-contrast measurements are also enclosed.Type: ApplicationFiled: April 13, 2010Publication date: February 9, 2012Applicant: SIEMENS AKTIENGESELLSCHAFTInventors: Thilo Michel, Peter Bartl, Gisela Anton
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Patent number: 7983397Abstract: The present invention relates to a device and method for determining one or more characteristics of radiation using a sensor comprising one or more detector units capable of counting the number of photon or charged particle of said radiation impinging on said sensor in or above a determined energy range.Type: GrantFiled: February 8, 2007Date of Patent: July 19, 2011Assignee: Friedrich-Alexander-Universitat Erlangen-NurnbergInventors: Thilo Michel, Alexander Korn, Gisela Anton, Daniel Niederlohner, Michael Bohnel, Markus Firsching, Jurgen Durst
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Publication number: 20110051901Abstract: The present invention relates to a device and method for determining one or more characteristics of radiation using a sensor comprising one or more detector units capable of counting the number of photon or charged particle of said radiation impinging on said sensor in or above a determined energy range.Type: ApplicationFiled: February 8, 2007Publication date: March 3, 2011Applicant: FRIEDRICH-ALEXANDER-UNIVERSITAT ERLANGEN-NURNBERGInventors: Thilo Michel, Alexander Korn, Gisela Anton, Daniel Niederlohner, Michael Bohnel, Markus Firsching, Jurgen Durst
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Publication number: 20110036988Abstract: Radiation detector (1) for measuring one or more characteristics of a radiation, comprising one or more detector pixels (3), a clock pulse generator, each detector pixel (3) comprising a sensor (20) producing an electrical signal in response to an event of a photon or charged particle of said radiation impinging on said sensor (20); a pixel electronics (24) adapted for receiving and processing said electrical signal, comprising an analog processing unit (62) for amplifying and shaping said electrical signal and producing a shaped pulse said pixel electronics (24) comprises time determination unit (51) for counting the TOT-count, the TOT-count being the number of clock pulses occurring during the time interval when said shaped pulse is above a threshold. Said pixel electronics comprises a plurality of event counters (82), each event counter (82) counting the number of events having a TOT-count in a predefined ranges.Type: ApplicationFiled: August 11, 2008Publication date: February 17, 2011Inventors: Michael Campbell, Xavier Llopart Cudie, Lukas Tlustos, Winnie Sze-Wing Wong, Rafael Ballabriga Sune, Gisela Anton, Thilo Michel, Michael Bohnel, Karl L. Schwartz, Uwe Mollenhauer, Ernst Fritsch
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Patent number: 7601937Abstract: A photon detector has a photocathode for the photon-induced triggering of measuring electrons. Spatial position information is supplied by an at least one-dimensional electron-detector pixel array. An electron optics unit serves for guiding the measuring electrons to the array. Each pixel (19) has an electronic converter unit (20) for converting an analog measuring signal of the pixel (19) into a digital measuring signal, which incorporates a discriminator for background suppression. An electronic post-processing unit (39) serves for processing the digital measuring signal. The converter unit (20) of each pixel (19) has at least one clock generator (36), as well as at least one counter (29, 30), which is in signal connection with the clock generator (36) and discriminator (27) for generation of a digital timing signal.Type: GrantFiled: June 25, 2007Date of Patent: October 13, 2009Assignee: Friedrich-Alexander-Universität Erlangen-NürnbergInventors: Gisela Anton, Thilo Michel
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Publication number: 20080033673Abstract: A photon detector has a photocathode for the photon-induced triggering of measuring electrons. Spatial position information is supplied by an at least one-dimensional electron-detector pixel array. An electron optics unit serves for guiding the measuring electrons to the array. Each pixel (19) has an electronic converter unit (20) for converting an analog measuring signal of the pixel (19) into a digital measuring signal, which incorporates a discriminator for background suppression. An electronic post-processing unit (39) serves for processing the digital measuring signal. The converter unit (20) of each pixel (19) has at least one clock generator (36), as well as at least one counter (29, 30), which is in signal connection with the clock generator (36) and discriminator (27) for generation of a digital timing signal.Type: ApplicationFiled: June 25, 2007Publication date: February 7, 2008Applicant: Friedrich-Alexander-Univeritat Erlangen-NurnbergInventors: Gisela ANTON, Thilo Michel