Abstract: Embodiments of the disclosure provide various nanogap sensor designs (e.g., horizontal nanogap sensors, vertical nanogap sensors, arrays of multiple nanogap sensors, various arrangements for making electrical connections to the electrodes of nanogap sensors, etc.), as well as various methods which may be used to fabricate at least some of the proposed sensors. The nanogap sensors proposed herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap.

Abstract: The disclosed technology generally relates to lithographically defined conductive lines for integrated circuit devices formed by plating, and more particularly to conductive lines shaped to reduce the magnitude of electric field in the electric field distributions around conductive lines of integrated and monolithic transformers and isolators.

Abstract: Embodiments of the disclosure provide various nanogap sensor designs (e.g., horizontal nanogap sensors, vertical nanogap sensors, arrays of multiple nanogap sensors, various arrangements for making electrical connections to the electrodes of nanogap sensors, etc.), as well as various methods which may be used to fabricate at least some of the proposed sensors. The nanogap sensors proposed herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap.

Abstract: A monitoring system for monitoring a process includes a housing with a viewing panel. The viewing panel includes a view port. An emitter generates light and illuminates an observation zone of the process. A detector is disposed within the housing and is configured to detect light entering the housing through the view port and create a plurality of images of the process in the observation zone. A thermal regulation system is configured to generate heat in the vicinity of the viewing panel of the housing so as to increase the temperature of at least the view port above ambient temperature.

Abstract: Embodiments of the disclosure provide various nanogap sensor designs (e.g., horizontal nanogap sensors, vertical nanogap sensors, arrays of multiple nanogap sensors, various arrangements for making electrical connections to the electrodes of nanogap sensors, etc.), as well as various methods which may be used to fabricate at least some of the proposed sensors. The nanogap sensors proposed herein may operate as molecular sensors to help identify chemical species through electrical measurements using at least a pair of electrodes separated by a nanogap.

Abstract: A method for analysing performance of a media recording system in a telecommunications network comprising the steps of selecting an extension within a telecommunications network, the extension capable of exchanging communication media, designating a time period within which communication records for the extension should be analysed, receiving communications data for the network extension, the communications data comprising data associated with communications involving the extension with the time period, receiving media data for the network extension, the media data comprising data associated with recorded media content of communications involving the extension within the time period, comparing the communications data with the media data to determine the performance of the communications recording system.

Abstract: A monitoring system for monitoring a process includes a housing with a viewing panel. The viewing panel includes a view port. An emitter generates light and illuminates an observation zone of the process. A detector is disposed within the housing and is configured to detect light entering the housing through the view port and create a plurality of images of the process in the observation zone. A thermal regulation system is configured to generate heat in the vicinity of the viewing panel of the housing so as to increase the temperature of at least the view port above ambient temperature.

Abstract: A method of manufacture of a sensor, the method comprising, in a first fabrication facility, forming one or more components of the sensor on a substrate; and in a second fabrication facility depositing a sensor layer, such as a magnetoresistive sensor, onto the substrate or over the one or more components. Otherwise contaminating effects of depositing magnetoresistive materials can thus be confined to the second fabrication facility, permitting more advanced fabrication equipment and techniques to be employed in the first fabrication facility.

Abstract: A method for analysing performance of a media recording system in a telecommunications network comprising the steps of selecting an extension within a telecommunications network, the extension capable of exchanging communication media, designating a time period within which communication records for the extension should be analysed, receiving communications data for the network extension, the communications data comprising data associated with communications involving the extension with the time period, receiving media data for the network extension, the media data comprising data associated with recorded media content of communications involving the extension within the time period, comparing the communications data with the media data to determine the performance of the communications recording system.

Abstract: A method of manufacture of a sensor, the method comprising, in a first fabrication facility, forming one or more components of the sensor on a substrate; and in a second fabrication facility depositing a sensor layer, such as a magnetoresistive sensor, onto the substrate or over the one or more components. Otherwise contaminating effects of depositing magnetoresistive materials can thus be confined to the second fabrication facility, permitting more advanced fabrication equipment and techniques to be employed in the first fabrication facility.

Abstract: A particle inspection device includes a feeder configured to drop a particle through an image area. The feeder includes a tray surface having a flat portion and an edge portion disposed above the image area. The inspection device also includes a vibration device configured to vibrate the feeder induce movement of the particle from the flat portion to the edge portion and an image capturing device configured to capture an image of the particle in the image area. The edge portion may be a downwardly curved edge section and configured to maintain the orientation and reduce tumbling motion as the particle slides off the tray and falls through the image area. Alternately or additionally, a landing element is provided having a landing surface disposed in the image area and angled with respect to the flat portion of the tray surface and configured to receive the particle. The image capturing device is configured to capture an image of the particle on the landing surface.

Abstract: A fluid inspection device for inspecting a fluid in a vessel includes an elongate insertion well having a rear end disposed at the wall of the vessel and a front end disposed in the interior of the vessel. An inside of the insertion well is sealed off from the fluid in the vessel and an outside of the insertion well is in contact with the fluid in the vessel. A camera unit is disposed in the inside of the insertion well, and a lens in operative communication with the camera unit is disposed at the front end of the insertion well so that a front end of the lens is in contact with the fluid and a rear end of the lens is inside the insertion well. In addition, a light guide having a light emitting end is configured to guide light from the inside of the insertion well to the light emitting end.

Abstract: A particle inspection device includes a feeder configured to drop a particle through an image area, a reflector configured to provide a reflected view of the particle in the image area, and an image capturing device configured to capture an image of the particle in the image area such that the image includes at least a direct view of the particle and the reflected view of the particle. In addition, a method for inspecting a particle includes dropping the particle through an image area, providing a reflected view of the particle in the image area using a reflector, and capturing an image of the particle in the image area using an image capturing device so that the image includes a direct view of the particle and the reflected view of the particle.