Patents by Inventor Thomas Dresch
Thomas Dresch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9240311Abstract: A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other gas phase ion detectors. The DSA system includes one or more means of ionizing samples and includes a sealed enclosure which provides protection from high voltages and hazardous vapors, and in which the local background gas environment may be monitored and well-controlled. The DSA system is configured to accommodate single or multiple samples at any one time, and provide external control of individual sample positioning, sample conditioning, sample heating, positional sensing, and temperature measurement.Type: GrantFiled: June 1, 2012Date of Patent: January 19, 2016Assignee: PerkinElmer Health Sciences, Inc.Inventors: Craig M. Whitehouse, Thomas Dresch
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Patent number: 8847157Abstract: A Time-Of-Flight mass analyzer includes a multipole ion guide located in the ion flight path between the ion source and the flight tube of the Time-Of-Flight mass analyzer. The multipole ion guide can be positioned in the ion path between the ion source and the ion pulsing region of the TOF mass analyzer. The multipole ion guide electronics and the ion guide entrance and exit electrostatic lenses are configured to enable trapping or passing through of ions delivered from an atmospheric pressure ion source. The multipole ion guide can be used for ion transmission, trapping and fragmentation, and can reside in one vacuum pumping stage or can extend continuously into more than one vacuum pumping stage.Type: GrantFiled: September 27, 2013Date of Patent: September 30, 2014Assignee: PerkinElmer Health Sciences, Inc.Inventors: Craig M. Whitehouse, Thomas Dresch, Bruce A. Andrien, Jr.
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Publication number: 20140124661Abstract: A Time-Of-Flight mass analyzer includes a multipole ion guide located in the ion flight path between the ion source and the flight tube of the Time-Of-Flight mass analyzer. The multipole ion guide can be positioned in the ion path between the ion source and the ion pulsing region of the TOF mass analyzer. The multipole ion guide electronics and the ion guide entrance and exit electrostatic lenses are configured to enable trapping or passing through of ions delivered from an atmospheric pressure ion source. The multipole ion guide can be used for ion transmission, trapping and fragmentation, and can reside in one vacuum pumping stage or can extend continuously into more than one vacuum pumping stage.Type: ApplicationFiled: September 27, 2013Publication date: May 8, 2014Applicant: PerkinElmer Health Sciences, Inc.Inventors: Craig M. Whitehouse, Thomas Dresch, Bruce A. Andrien, Jr.
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Patent number: 8610056Abstract: An apparatus includes an atmospheric pressure ion source; a first vacuum stage and a second vacuum stage separated from the first vacuum stage by a vacuum partition; a first ion guide positioned within a first vacuum stage and arranged to receive ions from the atmospheric pressure ion source; a second ion guide positioned within a second vacuum stage downstream of the first vacuum stage from the atmospheric pressure ion source, the second ion guide being a multipole ion guide arranged to receive ions from the first ion guide; and a time-of-flight mass analyzer that includes an orthogonal pulsing region arranged to receive ions from the second ion guide.Type: GrantFiled: June 20, 2011Date of Patent: December 17, 2013Assignee: PerkinElmer Health Sciences Inc.Inventors: Craig M. Whitehouse, Thomas Dresch, Bruce Andrien, Jr.
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Patent number: 8598519Abstract: A method includes directing ions from an atmospheric pressure ion source to a first ion guide; directing ions in the first ion guide to a second ion guide, the second ion guide being a multipole ion guide extending along an axis; periodically directing ions along the axis; receiving at least some of the ions in a time-of-flight analyzer; accelerating the ions in the time-of-flight mass analyzer orthogonal to the axis; and detecting the accelerated ions.Type: GrantFiled: June 20, 2011Date of Patent: December 3, 2013Assignee: PerkinElmer Health Sciences Inc.Inventors: Craig M. Whitehouse, Thomas Dresch, Bruce Andrien
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Publication number: 20110309244Abstract: A Time-Of-Flight mass analyzer includes a multipole ion guide located in the ion flight path between the ion source and the flight tube of the Time-Of-Flight mass analyzer. In one preferred embodiment, a Time-Of-Flight (TOF) mass analyzer is configured such that a multipole ion guide is positioned in the ion path between the ion source and the ion pulsing region of the TOF mass analyzer. The multipole ion guide electronics and the ion guide entrance and exit electrostatic lenses are configured to enable the trapping or passing through of ions delivered from an atmospheric pressure ion source. The ion guide electronics can be set to select the mass to charge (m/z) range of ions which can be successfully transmitted or trapped in the ion guide. More than one set of m/z values can be selected using techniques such as notch filtering with resonant frequency ion ejection of unwanted m/z values.Type: ApplicationFiled: June 20, 2011Publication date: December 22, 2011Applicant: PerkinElmer Health Sciences, Inc.Inventors: Craig M. Whitehouse, Thomas Dresch, Bruce Andrien
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Publication number: 20110303840Abstract: A method includes directing ions from an atmospheric pressure ion source to a first ion guide; directing ions in the first ion guide to a second ion guide, the second ion guide being a multipole ion guide extending along an axis; periodically directing ions along the axis; receiving at least some of the ions in a time-of-flight analyzer; accelerating the ions in the time-of-flight mass analyzer orthogonal to the axis; and detecting the accelerated ions.Type: ApplicationFiled: June 20, 2011Publication date: December 15, 2011Applicant: PerkinElmer Health Sciences, Inc.Inventors: Craig M. Whitehouse, Thomas Dresch, Bruce Andrien
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Patent number: 7019285Abstract: A method and an apparatus which combines at least one linear two dimensional ion guide or a two dimensional ion storage device in tandem with a time-of-flight mass analyzer to analyze ionic chemical species generated by an ion source. The method improves the duty cycle, and therefore, the overall instrument sensitivity with respect to the analyzed chemical species.Type: GrantFiled: March 14, 2001Date of Patent: March 28, 2006Assignee: Analytica of Branford, Inc.Inventors: Thomas Dresch, Erol E. Gulcicek, Craig M. Whitehouse
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Patent number: 6621073Abstract: A Time-of-Flight Mass Spectrometer (TOF-MS) is configured to improve resolution and sensitivity performance. The TOF-MS includes an arrangement of electrodes comprising an ion accelerator with two stages of homogeneous electric fields, an ion reflector with a single stage of a homogeneous electric field, accelerator and reflector being separated by a first drift space, and an ion detector which is separated from the reflector by a second drift space. Contrary to known TOF-MS of similar configuration, the set of electric potentials which must be applied to said electrodes is predetermined for a given geometry in such a way that a spatial distribution of ions initially at rest in the first gap of the said accelerator is compressed at the location of the detector in the longitudinal direction to a focus of first and second order in the initial axial coordinate.Type: GrantFiled: October 12, 2000Date of Patent: September 16, 2003Assignee: Analytica of Branford, Inc.Inventor: Thomas Dresch
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Publication number: 20010030284Abstract: A method and an apparatus which combines at least one linear two dimensional ion guide or a two dimensional ion storage device in tandem with a time-of-flight mass analyzer to analyze ionic chemical species generated by an ion source. The method improves the duty cycle, and therefore, the overall instrument sensitivity with respect to the analyzed chemical species.Type: ApplicationFiled: March 14, 2001Publication date: October 18, 2001Inventors: Thomas Dresch, Erol E. Gulcicek, Craig M. Whitehouse
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Patent number: 6020586Abstract: A method and an apparatus which combines at least one linear two dimensional ion guide or a two dimensional ion storage device in tandem with a time-of-flight mass analyzer to analyze ionic chemical species generated by an ion source. The method improves the duty cycle, and therefore, the overall instrument sensitivity with respect to the analyzed chemical species.Type: GrantFiled: November 17, 1997Date of Patent: February 1, 2000Assignee: Analytica of Branford, Inc.Inventors: Thomas Dresch, Erol E. Gulcicek, Craig Whitehouse
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Patent number: 6011259Abstract: A Time-Of-Flight (TOF) mass analyzer is configured with a multipole ion guide in the ion path between the ion source and pulsing region of the mass analyzer, and enables trapping or transmission of ions from an atmospheric pressure ion source. The mass-to-charge (m/z) range(s) of ions transmitted through or trapped in the ion guide can be selected. Ions with stable trajectories can undergo Collisional Induced Dissociation (CID). During ion fragmentation, the ion guide potentials can be set to transmit or trap fragment ions produced by CID. The parent and fragment ion population can be delivered from the ion guide to the pulsing region of the TOF mass analyzer for mass analysis. After the first fragmentation step, the ion guide potentials can again be set to select a narrow m/z range to clear the ion guide in trapping mode of all but a selected set of fragment ions. M/z selection and ion fragmentation can be repeated a number of times with mass analysis occurring at the end of all the MS/MS.sup.Type: GrantFiled: August 9, 1996Date of Patent: January 4, 2000Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, Thomas Dresch, Bruce Andrien
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Patent number: 5869829Abstract: A Time-of-Flight Mass Spectrometer (TOF-MS) is configured to improve resolution and sensitivity performance. The TOF-MS includes an arrangement of electrodes comprising an ion accelerator with two stages of homogeneous electric fields, an ion reflector with a single stage of a homogeneous electric field, accelerator and reflector being separated by a first drift space, and an ion detector which is separated from the reflector by a second drift space. Contrary to known TOF-MS of similar configuration, the set of electric potentials which must be applied to said electrodes is predetermined for a given geometry in such a way that a spatial distribution of ions initially at rest in the first gap of the said accelerator is compressed at the location of the detector in the longitudinal direction to a focus of first and second order in the initial axial coordinate.Type: GrantFiled: July 3, 1997Date of Patent: February 9, 1999Assignee: Analytica of Branford, Inc.Inventor: Thomas Dresch
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Patent number: 5847385Abstract: Electrostatic deflectors are used in a time of flight mass spectrometer to steer ions into a detector positioned at a convenient location at the end of a drift region and where the detector assembly is tilted in relation with the steered ion beam in a manner which improves mass spectral resolution.Type: GrantFiled: June 20, 1997Date of Patent: December 8, 1998Assignee: Analytica of Branford, Inc.Inventor: Thomas Dresch
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Patent number: 5689111Abstract: A method and an apparatus which combines a linear two dimensional ion guide or a two dimensional ion storage device in tandem with a time-of-flight mass analyzer to analyze ionic chemical species generated by an ion source. The method improves the duty cycle, and therefore, the overall instrument sensitivity with respect to the analyzed chemical species.Type: GrantFiled: August 9, 1996Date of Patent: November 18, 1997Assignee: Analytica of Branford, Inc.Inventors: Thomas Dresch, Erol E. Gulcicek, Craig Whitehouse
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Patent number: 5654544Abstract: Electrostatic deflectors are used in a time of flight mass spectrometer to steer ions into a detector positioned at a convenient location at the end of a drift region and where the detector assembly is tilted in relation with the steered ion beam in a manner which improves mass spectral resolution.Type: GrantFiled: August 9, 1996Date of Patent: August 5, 1997Assignee: Analytica of BranfordInventor: Thomas Dresch