Abstract: The exemplary devices and processing techniques allow multiple measurement devices or chips to work together to sample a screen that is larger than one measurement device might sample, by allowing sharing X or drive lines amongst the measurements devices. Particular implementations of the subject matter described in this specification can be implemented so as to realize one or more of the following optional advantages. The sharing of the drive lines may allow for a screen sized or otherwise configured to have more measurement nodes than would be produced by the sum of the nodes that could be measured by the individual devices. For a screen that requires multiple measurement devices, the drive line sharing thus may allow use of a smaller number of measuring devices.

Abstract: The exemplary devices and processing techniques allow multiple measurement devices or chips to work together to sample a screen that is larger than one measurement device might sample, by allowing sharing X or drive lines amongst the measurements devices. Particular implementations of the subject matter described in this specification can be implemented so as to realize one or more of the following optional advantages. The sharing of the drive lines may allow for a screen sized or otherwise configured to have more measurement nodes than would be produced by the sum of the nodes that could be measured by the individual devices. For a screen that requires multiple measurement devices, the drive line sharing thus may allow use of a smaller number of measuring devices.