Patents by Inventor Thomas H. Bailey
Thomas H. Bailey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9103876Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.Type: GrantFiled: January 7, 2011Date of Patent: August 11, 2015Assignee: PHOTON DYNAMICS, INC.Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
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Publication number: 20140266244Abstract: Described are techniques for maintaining reliable and reproducible conditions for panel inspection, i.e. pixel and line defect detection, while at the same time preventing large-scale panel damage. One implementation involves an apparatus for identifying a defect in an electronic circuit incorporating a circuit driving module configured to apply an electrical test signal to the electronic circuit; a defect detection module configured to identify the defect in the electronic circuit based at least on the applied electrical test signal; a signal monitoring module configured to measure the electrical test signal at the electronic circuit; and a control module operatively coupled to the signal monitoring module and the circuit driving module and configured to control at least the circuit driving module based on the electrical test signal measured at the electronic circuit.Type: ApplicationFiled: March 16, 2014Publication date: September 18, 2014Applicant: Photon Dynamics Inc.Inventors: Viacheslav MINAEV, Raul Albert MARTIN, Thomas E. WISHARD, Michael Sean CASSADY, Jongho LEE, Thomas H. BAILEY, Sriram KRISHNASWAMI
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Patent number: 8728589Abstract: A laser decal transfer is used to generate thin film features by directing laser pulses of very low energy at the back of a target substrate illuminating an area of a thin layer of a high viscosity rheological fluid coating the front surface of the target. The illuminated area is shaped and defined by an aperture centered about the laser beam. The decal transfer process allows for the release and transfer from the target substrate to the receiving substrate a uniform and continuous layer identical in shape and size of the laser irradiated area. The released layer is transferred across the gap with almost no changes to its initial size and shape. The resulting patterns transferred onto the receiving substrate are highly uniform in thickness and morphology, have sharp edge features and exhibit high adhesion, independent of the surface energy, wetting or phobicity of the receiving substrate.Type: GrantFiled: January 7, 2008Date of Patent: May 20, 2014Assignee: Photon Dynamics, Inc.Inventors: Raymond Auyeung, Alberto Pique, Thomas H. Bailey, Lydia J. Young
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Publication number: 20120319713Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.Type: ApplicationFiled: January 7, 2011Publication date: December 20, 2012Applicant: PHOTON DYNAMICS, INC.Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
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Patent number: 8025542Abstract: An apparatus includes integrated review, material removal and material deposition functions. The apparatus performs the review, material removal and material deposition operations along the same optical axis. The apparatus includes, in part, a camera, a pair of lenses, and one or more lasers. A first lens is used to focus the camera along the optical axis on a structure formed on the target substrate undergoing review. The first lens is also used to focus the laser beam on the structure to remove a material present thereon if the reviewed structure is identified as requiring material removal. The second lens is used to focus the laser beam on a ribbon to transfer a rheological compound from a recessed well formed in the ribbon to the structure if the reviewed structure is identified as requiring material deposition.Type: GrantFiled: May 14, 2007Date of Patent: September 27, 2011Assignees: Photon Dynamics, Inc., The United States of America as represented by the Secretary of the NavyInventors: Steven Edward Birrell, Alan Cable, Joel Visser, Lydia J. Young, Justin Kwak, Joachim Eldring, Thomas H. Bailey, Alberto Pique, Raymond Auyeung
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Publication number: 20090074987Abstract: A laser decal transfer is used to generate thin film features by directing laser pulses of very low energy at the back of a target substrate illuminating an area of a thin layer of a high viscosity rheological fluid coating the front surface of the target. The illuminated area is shaped and defined by an aperture centered about the laser beam. The decal transfer process allows for the release and transfer from the target substrate to the receiving substrate a uniform and continuous layer identical in shape and size of the laser irradiated area. The released layer is transferred across the gap with almost no changes to its initial size and shape. The resulting patterns transferred onto the receiving substrate are highly uniform in thickness and morphology, have sharp edge features and exhibit high adhesion, independent of the surface energy, wetting or phobicity of the receiving substrate.Type: ApplicationFiled: January 7, 2008Publication date: March 19, 2009Applicants: Photon Dynamics, Inc., The United States of America as represented by the Secretary of NavyInventors: Raymond Auyeung, Alberto Pique, Thomas H. Bailey, Lydia J. Young
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Patent number: 7439499Abstract: In one embodiment, an analytical apparatus is provided that includes a carriage; and a plurality of electrospray probes pivotably mounted on the carriage, wherein movement of the carriage engages a feature with a selected one of the electrospray probes whereby movement of the feature pivots the selected one of the electrospray probes with respect to the carriage.Type: GrantFiled: March 22, 2006Date of Patent: October 21, 2008Assignee: Metara, Inc.Inventors: Thomas H. Bailey, James E. Tappan
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Publication number: 20080139075Abstract: An apparatus includes integrated review, material removal and material deposition functions. The apparatus performs the review, material removal and material deposition operations along the same optical axis. The apparatus includes, in part, a camera, a pair of lenses, and one or more lasers. A first lens is used to focus the camera along the optical axis on a structure formed on the target substrate undergoing review. The first lens is also used to focus the laser beam on the structure to remove a material present thereon if the reviewed structure is identified as requiring material removal.Type: ApplicationFiled: May 14, 2007Publication date: June 12, 2008Applicants: Photon Dynamics, Inc., The United States of America as represented by the Secretary of NavyInventors: Steven Edward Birrell, Alan Cable, Joel Visser, Lydia J. Young, Justin Kwak, Joachim Eldring, Thomas H. Bailey, Alberto Pique, Raymond Auyeung