Patents by Inventor Thomas Knarr

Thomas Knarr has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6369363
    Abstract: A method is provide for measuring electromagnetic radiation radiated from a surface of an object that is irradiated by electromagnetic radiation given off by at least one radiation source. The radiation given off by the radiation source is determined by at least one first detector, and the radiation given off by the irradiated object is determined by at least one second detector that measures the radiation. The radiation from the at least one radiation source is actively modulated with at least one characteristic pyrometer. The radiation determined by the second detector is corrected with the radiation determined by the first detector to compensate for the radiation of the radiation source reflected from the object.
    Type: Grant
    Filed: February 16, 2001
    Date of Patent: April 9, 2002
    Assignee: Steag Ast
    Inventors: Markus Hauf, Thomas Knarr, Heinrich Walk, Horst Balthasar, Uwe Müller
  • Publication number: 20010010308
    Abstract: A method is provide for measuring electromagnetic radiation radiated from a surface of an object that is irradiated by electromagnetic radiation given off by at least one radiation source. The radiation given off by the radiation source is determined by at least one first detector, and the radiation given off by the irradiated object is determined by at least one second detector that measures the radiation. The radiation from the at least one radiation source is actively modulated with at least one characteristic pyrometer. The radiation determined by the second detector is corrected with the radiation determined by the first detector to compensate for the radiation of the radiation source reflected from the object.
    Type: Application
    Filed: February 16, 2001
    Publication date: August 2, 2001
    Inventors: Markus Hauf, Thomas Knarr, Heinrich Walk, Horst Balthasar, Uwe Muller
  • Patent number: 6191392
    Abstract: A method is provide for measuring electromagnetic radiation radiated from a surface of an object that is irradiated by electromagnetic radiation given off by at least one radiation source. The radiation given off by the radiation source is determined by at least one first detector, and the radiation given off by the irradiated object is determined by at least one second detector that measures the radiation. The radiation from the at least one radiation source is actively modulated with at least one characteristic parameter. The radiation determined by the second detector is corrected with the radiation determined by the first detector to compensate for the radiation of the radiation source reflected from the object.
    Type: Grant
    Filed: December 8, 1998
    Date of Patent: February 20, 2001
    Assignee: Steag AST Elektronik GmbH
    Inventors: Markus Hauf, Thomas Knarr, Heinrich Walk, Horst Balthasar, Uwe Müller
  • Patent number: 5861609
    Abstract: A thin visible and near IR absorbing plate is placed between the radiation source and the object to be processed in a rapid thermal processing system. The object is heated in part by the near IR and far IR radiation from the thin plate, and the material and optically induced heating inhomogeneities are reduced.
    Type: Grant
    Filed: October 2, 1995
    Date of Patent: January 19, 1999
    Inventors: Guenter Kaltenbrunner, Thomas Knarr, Zsolt Nenyei
  • Patent number: 5841110
    Abstract: A method for Rapid Thermal Processing (RTP) is presented, wherein the broadband reflectivity of an object is measured, and the results of the measurement used by the RTP system to adjust the RTP system parameters used in processing the object.
    Type: Grant
    Filed: August 27, 1997
    Date of Patent: November 24, 1998
    Assignee: Steag-Ast GmbH
    Inventors: Zsolt Nenyei, Heinrich Walk, Michael Maurer, Thomas Knarr
  • Patent number: 5359693
    Abstract: A low defect rate is provided in rapid thermal processing of delicate components with reduction of defects caused by inhomogeneities of temperature during a rapid thermal processing. In a suitable system a defect-guarded RTP method is carried out in such a manner that the density of the heating energy is adjusted in consecutive intervals of time, which may be as short as desired, to such automatically controlled limiting values or to such fixed values that in the reaction chamber the difference between the primary and secondary energy densities is almost continuously held at the minimum which is achievable throughout the thermal processing whereas the ramps have predetermined slopes.
    Type: Grant
    Filed: July 14, 1992
    Date of Patent: October 25, 1994
    Assignee: AST elektronik GmbH
    Inventors: Zsolt Nenyei, Thomas Knarr, Heinrich Walk