Patents by Inventor Thomas P. Jones
Thomas P. Jones has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6862405Abstract: An active temperature control system for a DUT utilizes a heat sink containing HFE7100 liquid and an electric heater. The liquid is cooled below the set point and the heater is used to bring the DUT up to the set point. Set points in the range of ?10 degrees C. to +110 degrees C. can be achieved. The heat sink utilizes only a single coolant for all of the set points, allowing set points to be changed within a few minutes. At a given set point, the heater provides a quick response to offset the effect of self-heating and keep the set point deviation to within a few degrees C. Power following techniques can be utilized to achieve the quick response.Type: GrantFiled: August 21, 2002Date of Patent: March 1, 2005Assignee: Delta Design, Inc.Inventors: Mark F. Malinoski, Thomas P. Jones, Brian Annis, Jonathan E. Turner
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Patent number: 6788084Abstract: A system and method for controlling a temperature of a device during testing with a thermal controller and a heat exchanger includes measuring an instantaneous power consumption of the device during testing. The heat exchanger is controlled with the thermal controller using the measured instantaneous power consumption by the device to regulate the temperature of the device during testing, wherein the heat exchanger is in conductive contact with the device.Type: GrantFiled: September 5, 2002Date of Patent: September 7, 2004Assignee: Delta Design, Inc.Inventors: Thomas P. Jones, Jonathan E. Turner, Mark F. Malinoski
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Publication number: 20030047305Abstract: An active temperature control system for a DUT utilizes a heat sink containing HFE7100 liquid and an electric heater. The liquid is cooled below the set point and the heater is used to bring the DUT up to the set point. Set points in the range of −10 degrees C. to +110 degrees C. can be achieved. The heat sink utilizes only a single coolant for all of the set points, allowing set points to be changed within a few minutes. At a given set point, the heater provides a quick response to offset the effect of self-heating and keep the set point deviation to within a few degrees C. Power following techniques can be utilized to achieve the quick response.Type: ApplicationFiled: August 21, 2002Publication date: March 13, 2003Applicant: Delta Design, Inc.Inventors: Mark F. Malinoski, Thomas P. Jones, Brian Annis, Jonathan E. Turner
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Publication number: 20030001605Abstract: A system and method for controlling a temperature of a device during testing with a thermal controller and a heat exchanger includes measuring an instantaneous power consumption of the device during testing. The heat exchanger is controlled with the thermal controller using the measured instantaneous power consumption by the device to regulate the temperature of the device during testing, wherein the heat exchanger is in conductive contact with the device.Type: ApplicationFiled: September 5, 2002Publication date: January 2, 2003Applicant: Delta Design, Inc.Inventors: Thomas P. Jones, Jonathan E. Turner, Mark F. Malinoski
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Patent number: 6498899Abstract: A method of controlling a temperature of a semiconductor device during testing is used with a system including a heater and a heat sink and a temperature control system. The semiconductor device is thermally coupled to the heater, which is thermally coupled to a heat sink. The heat sink defines a chamber, and the chamber is adapted to have a liquid flowing through the chamber. The temperature control system is coupled to the heater and the heat sink. In the method, the temperature of the semiconductor device is moved to approximately a first set point temperature. The temperature of the semiconductor device is moved to approximately a second set point temperature, from approximately the first set point temperature, by changing a temperature of the heater and maintaining the liquid flowing into the chamber at a substantially constant temperature.Type: GrantFiled: November 27, 2001Date of Patent: December 24, 2002Assignee: Delta Design, Inc.Inventors: Mark F. Malinoski, Thomas P. Jones, Brian Annis, Jonathan E. Turner
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Patent number: 6489793Abstract: A method for controlling a device temperature measures a parameter related to device power consumption and utilizes the parameter to control the device temperature. This can be achieved with a system including a heat exchanger, a power monitor, and a circuit which controls the temperature setting of the heat exchanger. The circuit uses as inputs the power level, heat exchanger temperature, and set point. The system thus eliminates the need for temperature sensing devices in or connected to a chip, responds to the temperature of the device and not the package, can be used for high volume chip manufacturing, does not require significant surface area of a device for temperature sensing, and eliminates the need for chip power profiles. Significantly, the system allows a set point to be maintained with minimal overshoot or undershoot.Type: GrantFiled: July 14, 1999Date of Patent: December 3, 2002Assignee: Delta Design, Inc.Inventors: Thomas P. Jones, Jonathan E. Turner, Mark F. Malinoski
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Patent number: 6476627Abstract: A method for controlling the temperature of a DUT during a testing operation, includes a) measuring a parameter related to power consumption by the DUT during testing, such as current consumption; and b) using the parameter related to power consumption to operate a temperature control device to compensate for temperature change due to changes in power consumption by the DUT during testing. The control can be closed loop or open loop with control signals incorporated into a test program. Apparatus for controlling the temperature of a DUT during testing, includes a) a device for measuring a parameter related to power consumption by the DUT during testing; b) a temperature control device which operates to control the temperature of the DUT during test; and c) a device for controlling operation of the temperature control device according to the measured parameter related to power consumption.Type: GrantFiled: October 21, 1996Date of Patent: November 5, 2002Assignee: Delta Design, Inc.Inventors: Jean Luc Pelissier, Thomas P. Jones, Jonathan E. Turner, Mark F. Malinoski
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Patent number: 6389225Abstract: An active temperature control system for a DUT utilizes a heat sink containing HFE7100 liquid and an electric heater. The liquid is cooled below the set point and the heater is used to bring the DUT up to the set point. Set points in the range of −10 degrees C. to +110 degrees C. can be achieved. The heat sink utilizes only a single coolant for all of the set points, allowing set points to be changed within a few minutes. At a given set point, the heater provides a quick response to offset the effect of self-heating and keep the set point deviation to within a few degrees C. Power following techniques can be utilized to achieve the quick response.Type: GrantFiled: July 14, 1999Date of Patent: May 14, 2002Assignee: Delta Design, Inc.Inventors: Mark F. Malinoski, Thomas P. Jones, Brian Annis, Jonathan E. Turner
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Publication number: 20020050833Abstract: A method for controlling a device temperature measures a parameter related to device power consumption and utilizes the parameter to control the device temperature. This can be achieved with a system including a heat exchanger, a power monitor, and a circuit which controls the temperature setting of the heat exchanger. The circuit uses as inputs the power level, heat exchanger temperature, and set point. The system thus eliminates the need for temperature sensing devices in or connected to a chip, responds to the temperature of the device and not the package, can be used for high volume chip manufacturing, does not require significant surface area of a device for temperature sensing, and eliminates the need for chip power profiles. Significantly, the system allows a set point to be maintained with minimal overshoot or undershoot.Type: ApplicationFiled: July 14, 1999Publication date: May 2, 2002Inventors: THOMAS P. JONES, JONATHAN E. TURNER, MARK F. MALINOSKI
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Publication number: 20020033391Abstract: A method of controlling a temperature of a semiconductor device during testing is used with a system including a heater and a heat sink and a temperature control system. The semiconductor device is thermally coupled to the heater, which is thermally coupled to a heat sink. The heat sink defines a chamber, and the chamber is adapted to have a liquid flowing through the chamber. The temperature control system is coupled to the heater and the heat sink. In the method, the temperature of the semiconductor device is moved to approximately a first set point temperature. The temperature of the semiconductor device is moved to approximately a second set point temperature, from approximately the first set point temperature, by changing a temperature of the heater and maintaining the liquid flowing into the chamber at a substantially constant temperature.Type: ApplicationFiled: November 27, 2001Publication date: March 21, 2002Applicant: Delta Design, Inc.Inventors: Mark F. Malinoski, Thomas P. Jones, Brian Annis, Jonathan E. Turner
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Patent number: 6304093Abstract: A handler for a device under test (“DUT”) includes a rotating table which supports up to eight DUTs. The DUTs are held in place over openings in the table and separate heat exchangers contact the individual DUTs through the openings and conductively control the temperature of the DUTs. Six of the DUTs are in conditioning stations and are lifted off of the rotary table until they contact separate spring-loaded pads. One of the DUTs is in a test station and it is lifted off of the rotary table until it contacts a test head, at which point testing is performed. The temperature of each of the DUTs is controlled throughout the process.Type: GrantFiled: December 2, 1999Date of Patent: October 16, 2001Assignee: Schlumberger Technologies Inc.Inventors: Mark K. Hilmoe, Thomas P. Jones, Brian G. Annis, Mark F. Malinoski
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Patent number: 5307146Abstract: A dual wavelength optical sensor for measuring chemical properties of a particular quantity, the optical sensor including a sensor probe having a thin sensing film whose optical characteristics are responsive to the chemical properties of the measured quantityThe United States Government has certain rights in this invention pursuant to Contract No. ITA87-02 between the U.S. Department of Commerce and Iowa State University.Type: GrantFiled: October 16, 1992Date of Patent: April 26, 1994Assignee: Iowa State University Research Foundation, Inc.Inventors: Marc D. Porter, Thomas P. Jones, Shelley J. Coldiron
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Patent number: 5157601Abstract: This invention relates to apparatus for estimating body alcohol concentration from personal body characteristics. For example, a calculator 10 has a keyboard 12 through which the user can input information concerning his sex, body weight, degree of fat, food consumption, alcohol consumption and the timing of these last two events. Depending on the mode into which the apparatus is set, the user can be told his maximum body alcohol concentration, how much more he may drink before reaching a legal limit, or when he may achieve the legal limit if he drinks no more.Type: GrantFiled: January 5, 1990Date of Patent: October 20, 1992Assignee: Alcolator LimitedInventors: Thomas P. Jones, Paul M. Williams
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Patent number: 4868545Abstract: Apparatus for detecting the presence of alcohol in expired breath in the atmosphere, comprising a gas sampler, a detector for the presence of alcohol in a gas sample, an output indicator or recorder coupled to the detector to provide an output signal when alcohol is detected, and an automatic controller for actuating the sampler and detector in response to a signal from a sensor arranged to be responsive to the presence of a subject to be tested.Type: GrantFiled: January 28, 1988Date of Patent: September 19, 1989Assignee: Lion Technology LimitedInventor: Thomas P. Jones
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Patent number: 4707336Abstract: A breath alcohol testing instrument comprises a breathing tube (10) connected to an instrument (15) for detecting alcohol, including a sampling system comprising a spring-loaded piston (30) arranged to draw a gas sample into a sampling chamber (21) in contact with an electrochemical fuel cell (20). A pressure sensor (52) detects a predetermined breath flow rate and starts a timer (53) which after a predetermined interval actuates a solenoid (40) to release the sampler. If the suspect interrupts normal breath flow the system does not "abort". The solenoid (40) is still actuated automatically either immediately when the pressure sensor (52) indicates a predetermined drop in pressure or after the preselected time interval. Simultaneously a "test fail" signal is generated (55) and applied to a warning signal generator (56) which actuates a visible or audible warning sign to indicate a non-standard test result.Type: GrantFiled: March 4, 1985Date of Patent: November 17, 1987Assignee: Lion Laboratories LimitedInventor: Thomas P. Jones
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Patent number: 4297871Abstract: A breath sampling device in which a main flow tube through which a subject blows is provided with a venturi restriction. The main flow tube communicates through a passage at the restriction to pressure sensing, constituent sensing, and expansible sample collecting chamber. A control responsive to pressure change delays the operation of the sampler and sensor until breath flow rate diminishes, thus insuring that sampling and sensing occur near the end of expiration.Type: GrantFiled: November 5, 1979Date of Patent: November 3, 1981Inventors: Basil M. Wright, Thomas P. Jones