Patents by Inventor Thomas P. Leist

Thomas P. Leist has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110260726
    Abstract: A phase labeling using sensitivity encoding system and method for correcting geometric distortion caused by magnetic field inhomogeneity in echo planar imaging (EPI) uses local phase shifts derived directly from the EPI measurement itself, without the need for extra field map scans or coil sensitivity maps. The system and method employs parallel imaging and k-space trajectory modification to produce multiple images from a single acquisition. The EPI measurement is also used to derive sensitivity maps for parallel imaging reconstruction. The derived phase shifts are retrospectively applied to the EPI measurement for correction of geometric distortion in the measurement itself.
    Type: Application
    Filed: May 1, 2009
    Publication date: October 27, 2011
    Applicant: THOMAS JEFFERSON UNIVERSITY
    Inventors: Udomchai Techavipoo, Thomas P. Leist, Song Lai