Patents by Inventor Thomas Y. Chuh

Thomas Y. Chuh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5652586
    Abstract: A Sigma Rho A/D converter (10) includes a transconductance element (R) having an input node for receiving an input voltage signal V.sub.in and an output node providing an analog current I.sub.in ; a charge integrator (12) having an input coupled to the output node, the charge integrator having feedback provided by an integrating capacitor C and an output node providing an output signal V.sub.o ; and a clocked voltage comparator (14) having an input coupled to V.sub.o for comparing V.sub.o to a reference potential. An output of the comparator updates in response to an occurrence of a first clock signal CLK1. A current sink (16) is switchably coupled to the output node of the transconductance element as a function of the logic state of the output of the comparator.
    Type: Grant
    Filed: March 17, 1995
    Date of Patent: July 29, 1997
    Assignee: Hughes Aircraft Company
    Inventors: Thomas Y. Chuh, Arthur L. Morse
  • Patent number: 4602421
    Abstract: Low noise polycrystalline silicon resistors are fabricated in the following sequence:(1) deposit an appropriate thickness of polysilicon (e.g. 400 nm) on top of an oxidized wafer(2) resistor doping by ion implantation (e.g. phosphorous)(3) heavy doping of the end-contact regions of the polysilicon resistor by high-dose ion implantation(4) patterning the polysilicon resistor(5) oxidation/annealing the polysilicon resistor(6) open contacts to the polysilicon resistor(7) aluminum metallization to form ohmic contacts(8) a long (e.g. 3 hours) low temperature (e.g. at 375.degree.) pure hydrogen annealing to passivate the interface states in the polysilicon resistor. Polyresistors processed this way have a noise figure that is about a factor of three lower than samples processed otherwise. The low temperature post metallization annealing in pure hydrogen passivates the interfaces of polyresistors, reducing the l/f noise normally generated therein.
    Type: Grant
    Filed: April 24, 1985
    Date of Patent: July 29, 1986
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Joseph Y. Lee, Michael H. Kriegel, Thomas Y. Chuh