Patents by Inventor Thuy Vu

Thuy Vu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11572511
    Abstract: A process for converting pyrolysis effluent stream into hydrocarbon products. Waste plastics are pyrolyzed at high temperature in a pyrolysis reactor to obtain a plastic pyrolysis effluent stream. The plastic pyrolysis effluent stream is further sent to a steam cracking unit for the separation of plastic pyrolysis effluent stream into a C5+ hydrocarbon stream and a C4 hydrocarbon stream. The pyrolysis reactor is operated at a to obtain hydrocarbon products of high value.
    Type: Grant
    Filed: May 28, 2021
    Date of Patent: February 7, 2023
    Assignee: UOP LLC
    Inventors: Robert Tsai, Michael S. Allegro, II, Elizabeth Carter, Joseph Montalbano, Matthew Griffiths, John Goodman, Thuy Vu, Andrea Bozzano
  • Publication number: 20220380681
    Abstract: A process for converting pyrolysis effluent stream into hydrocarbon products. Waste plastics are pyrolyzed at high temperature in a pyrolysis reactor to obtain a plastic pyrolysis effluent stream. The plastic pyrolysis effluent stream is further sent to a steam cracking unit for the separation of plastic pyrolysis effluent stream into a C5+ hydrocarbon stream and a C4 hydrocarbon stream. The pyrolysis reactor is operated at a to obtain hydrocarbon products of high value.
    Type: Application
    Filed: May 28, 2021
    Publication date: December 1, 2022
    Inventors: Robert Tsai, Michael S. Allegro, II, Elizabeth Carter, Joseph Montalbano, Matthew Griffiths, John Goodman, Thuy Vu, Andrea Bozzano
  • Patent number: 11029610
    Abstract: A method for determining one or more optimized values of an operational parameter of a sensor system configured for measuring a property of a substrate. The method includes: determining a quality parameter for a plurality of substrates; determining measurement parameters for the plurality of substrates obtained using the sensor system for a plurality of values of the operational parameter; comparing a substrate to substrate variation of the quality parameter and a substrate to substrate variation of a mapping of the measurement parameters; and determining the one or more optimized values of the operational parameter based on the comparing.
    Type: Grant
    Filed: September 4, 2018
    Date of Patent: June 8, 2021
    Assignee: ASML Netherlands B.V.
    Inventors: Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Ahmet Koray Erdamar, Loek Johannes Petrus Verhees, Willem Seine Christian Roelofs, Wendy Johanna Martina Van De Ven, Hadi Yagubizade, Hakki Ergün Cekli, Ralph Brinkhof, Tran Thanh Thuy Vu, Maikel Robert Goosen, Maaike Van T Westeinde, Weitian Kou, Manouk Rijpstra, Matthijs Cox, Franciscus Godefridus Casper Bijnen
  • Patent number: 10962887
    Abstract: A method for determining one or more optimized values of an operational parameter of a sensor system configured for measuring a property of a substrate is disclosed the method including: determining a quality parameter for a plurality of substrates; determining measurement parameters for the plurality of substrates obtained using the sensor system for a plurality of values of the operational parameter; comparing a substrate to substrate variation of the quality parameter and a substrate to substrate variation of a mapping of the measurement parameters; and determining the one or more optimized values of the operational parameter based on the comparing.
    Type: Grant
    Filed: November 18, 2019
    Date of Patent: March 30, 2021
    Assignee: ASML Netherlands B.V.
    Inventors: Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Sudharshanan Raghunathan, Boris Menchtchikov, Ahmet Koray Erdamar, Loek Johannes Petrus Verhees, Willem Seine Christian Roelofs, Wendy Johanna Martina Van De Ven, Hadi Yagubizade, Hakki Ergün Cekli, Ralph Brinkhof, Tran Thanh Thuy Vu, Maikel Robert Goosen, Maaike Van't Westeinde, Weitian Kou, Manouk Rijpstra, Matthijs Cox, Franciscus Godefridus Casper Bijnen
  • Publication number: 20200272061
    Abstract: A method for determining one or more optimized values of an operational parameter of a sensor system configured for measuring a property of a substrate. The method includes: determining a quality parameter for a plurality of substrates; determining measurement parameters for the plurality of substrates obtained using the sensor system for a plurality of values of the operational parameter; comparing a substrate to substrate variation of the quality parameter and a substrate to substrate variation of a mapping of the measurement parameters; and determining the one or more optimized values of the operational parameter based on the comparing.
    Type: Application
    Filed: September 4, 2018
    Publication date: August 27, 2020
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Patricius Aloysius Jacobus TINNEMANS, Edo Maria HULSEBOS, Henricus Johannes Lambertus MEGENS, Ahmet Koray ERDAMAR, Loek Johannes Petrus VERHEES, Willem Seine Christian ROELOFS, Wendy Johanna Martina VAN DE VEN, Hadi YAGUBIZADE, Hakki Ergün CEKLI, Ralph BRINKHOF, Tran Thanh Thuy VU, Maikel Robert GOOSEN, Maaike VAN T WESTEINDE, Weitian KOU, Manouk RIJPSTRA, Matthijs COX, Franciscus Godefridus Casper BIJNEN
  • Publication number: 20200081356
    Abstract: A method for determining one or more optimized values of an operational parameter of a sensor system configured for measuring a property of a substrate is disclosed the method comprising: determining a quality parameter for a plurality of substrates; determining measurement parameters for the plurality of substrates obtained using the sensor system for a plurality of values of the operational parameter; comparing a substrate to substrate variation of the quality parameter and a substrate to substrate variation of a mapping of the measurement parameters; and determining the one or more optimized values of the operational parameter based on the comparing.
    Type: Application
    Filed: November 18, 2019
    Publication date: March 12, 2020
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Patricius Aloysius Jacobus TINNEMANS, Edo Maria HULSEBOS, Henricus Johannes Lambertus MEGENS, Sudharshanan RAGHUNATHAN, Boris MENCHTCHIKOV, Ahmet Koray ERDAMAR, Loek Johannes Petrus VERHEES, Willem Seine Christian ROELOFS, Wendy Johanna Martina VAN DE VEN, Hadi YAGUBIZADE, Hakki Ergün CEKLI, Ralph BRINKHOF, Tran Thanh Thuy VU, Maikel Robert GOOSEN, Maaike VAN'T WESTEINDE, Weitian KOU, Manouk RIJPSTRA, Matthijs COX, Franciscus Godefridus Casper BIJNEN
  • Patent number: 10527958
    Abstract: A method for determining one or more optimized values of an operational parameter of a sensor system configured to measure a property of a substrate is disclosed. The method includes: determining a quality parameter for a plurality of substrates; determining measurement parameter values for the plurality of substrates using the sensor system for a plurality of values of the operational parameter; comparing a substrate to substrate variation of the quality parameter and a substrate to substrate variation of a mapping of the measurement parameter values; and determining the one or more optimized values of the operational parameter based on the comparing.
    Type: Grant
    Filed: September 17, 2018
    Date of Patent: January 7, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Sudharshanan Raghunathan, Boris Menchtchikov, Ahmet Koray Erdamar, Loek Johannes Petrus Verhees, Willem Seine Christian Roelofs, Wendy Johanna Martina Van De Ven, Hadi Yagubizade, Hakki Ergün Cekli, Ralph Brinkhof, Tran Thanh Thuy Vu, Maikel Robert Goosen, Maaike Van't Westeinde, Weitian Kou, Manouk Rijpstra, Matthijs Cox, Franciscus Godefridus Casper Bijnen
  • Patent number: 10381534
    Abstract: Embodiments of the invention include a package for a light emitting diode (LED). The package includes a lead frame, an LED, and an optically reflective but electrically non-conductive molding. The lead frame has a first lead frame part and a second lead frame part electrically isolated from the first lead frame part, each lead frame part having at least one raised pillar. The molding is disposed over the lead frame except over the pillars of the lead frame. The LED is mounted on at least one pillar and is electrically coupled to at least one pillar. The molding serves the purpose of a highly reflective, electrically conductive material like silver without being subject to tarnishing.
    Type: Grant
    Filed: July 18, 2017
    Date of Patent: August 13, 2019
    Assignee: Lumileds LLC
    Inventors: Shu Li, Thuy Vu
  • Publication number: 20190094721
    Abstract: A method for determining one or more optimized values of an operational parameter of a sensor system configured to measure a property of a substrate is disclosed. The method includes: determining a quality parameter for a plurality of substrates; determining measurement parameter values for the plurality of substrates using the sensor system for a plurality of values of the operational parameter; comparing a substrate to substrate variation of the quality parameter and a substrate to substrate variation of a mapping of the measurement parameter values; and determining the one or more optimized values of the operational parameter based on the comparing.
    Type: Application
    Filed: September 17, 2018
    Publication date: March 28, 2019
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Patricius Aloysius Jacobus TINNEMANS, Edo Maria HULSEBOS, Henricus Johannes Lambertus MEGENS, Sudharshanan RAGHUNATHAN, Boris MENCHTCHIKOV, Ahmet Koray ERDAMAR, Loek Johannes Petrus VERHEES, Willem Seine Christian ROELOFS, Wendy Johanna Martina VAN DE VEN, Hadi YAGUBIZADE, Hakki Ergün CEKLI, Ralph BRINKHOF, Tran Thanh Thuy VU, Maikel Robert GOOSEN, Maaike VAN'T WESTEINDE, Weitian KOU, Manouk RIJPSTRA, Matthijs COX, Franciscus Godefridus Casper BIJNEN
  • Publication number: 20190027661
    Abstract: Embodiments of the invention include a package for a light emitting diode (LED). The package includes a lead frame, an LED, and an optically reflective but electrically non-conductive molding. The lead frame has a first lead frame part and a second lead frame part electrically isolated from the first lead frame part, each lead frame part having at least one raised pillar. The molding is disposed over the lead frame except over the pillars of the lead frame. The LED is mounted on at least one pillar and is electrically coupled to at least one pillar. The molding serves the purpose of a highly reflective, electrically conductive material like silver without being subject to tarnishing.
    Type: Application
    Filed: July 18, 2017
    Publication date: January 24, 2019
    Applicant: LUMILEDS LLC
    Inventors: Shu LI, Thuy VU
  • Publication number: 20140145061
    Abstract: A method of manufacture of a brick moulding system for window frames and door frames includes providing a frame member which is used to form a frame to accommodate a variety of styles of window or doors in accordance with customer requirements. The frame member has a female brick moulding attachment receptacle. A plurality of brick moulding variations is provided, all of which have a male coupling engageable with the female brick moulding receptacle. An order is received from a customer for a selected style of frame with a selected style of brick moulding. Lengths of the frame member are secured together to form the selected style of frame and in the process of forming the frame the male coupling of the selected style of brick moulding is inserted into the femal brick moulding receptacle.
    Type: Application
    Filed: February 3, 2014
    Publication date: May 29, 2014
    Applicant: All Weather Windows Ltd.
    Inventors: Robert Joseph Jean-Marie Gilles, Thuy Vu
  • Patent number: 8640339
    Abstract: A method of manufacture of a brick molding system for window frames and door frames includes providing a frame member which is used to form a frame to accommodate a variety of styles of window or doors in accordance with customer requirements. The frame member has a female brick molding attachment receptacle. A plurality of brick molding variations is provided, all of which have a male coupling engageable with the female brick molding receptacle. An order is received from a customer for a selected style of frame with a selected style of brick molding. Lengths of the frame member are secured together to form the selected style of frame and in the process of forming the frame the male coupling of the selected style of brick molding is inserted into the female brick molding receptacle.
    Type: Grant
    Filed: April 15, 2009
    Date of Patent: February 4, 2014
    Assignee: All Weather Windows Ltd.
    Inventors: Robert Joseph Jean-Marie Gilles, Thuy Vu
  • Publication number: 20110295857
    Abstract: A system and method for aligning multilingual content and indexing multilingual documents, to a computer readable data storage medium having stored thereon computer code means for indexing multilingual documents, to a system for presenting multilingual content. The method for aligning multilingual content and indexing multilingual documents comprises the steps of generating multiple bilingual terminology databases, wherein each bilingual terminology database associates respective terms in a pivot language with one or more terms in another language; and combining the multiple bilingual terminology databases to form a multilingual terminology database, wherein the multilingual terminology database associates terms in different languages via the pivot language terms.
    Type: Application
    Filed: June 20, 2008
    Publication date: December 1, 2011
    Inventors: Ai Ti Aw, Min Zhang, Lian Hau Lee, Thuy Vu, Fon Lin Lai
  • Publication number: 20100263307
    Abstract: A method of manufacture of a brick moulding system for window frames and door frames includes providing a frame member which is used to form a frame to accommodate a variety of styles of window or doors in accordance with customer requirements. The frame member has a female brick moulding attachment receptacle. A plurality of brick moulding variations is provided, all of which have a male coupling engageable with the female brick moulding receptacle. An order is received from a customer for a selected style of frame with a selected style of brick moulding. Lengths of the frame member are secured together to form the selected style of frame and in the process of forming the frame the male coupling of the selected style of brick moulding is inserted into the female brick moulding receptacle.
    Type: Application
    Filed: April 15, 2009
    Publication date: October 21, 2010
    Applicant: ALL WEATHER WINDOWS LTD.
    Inventors: Robert Joseph Jean-Marie Gilles, Thuy Vu
  • Patent number: D615505
    Type: Grant
    Filed: July 27, 2009
    Date of Patent: May 11, 2010
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Mark Butterworth, Thuy Vu, Gregory W. Eng, Nicola B. Pfeffer