Patents by Inventor Tien-Chun Wei

Tien-Chun Wei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for ranking fault-test pairs based on waveform statistics in a mutation-based test program evaluation system
    Patent number: 9658947
    Abstract: Ranking of fault-test pairs is performed using first and second multitudes of waveform statistics. The first multitude of waveform statistics includes first value-change information regarding variations in logics HIGH and LOW for each bit of each reference output resulting from a test run of the design code. The second multitude of waveform statistics includes second value-change information regarding variations in logics HIGH and LOW for each bit of each faulty output resulting from a test run of the design code injected with a fault. Relative differences between the first and second multitudes of waveform statistics for each bit of each faulty output with respect to the corresponding reference output are determined. A waveform difference based on the relative differences for each signal of each faulty output is determined. A ranking result of fault-test pairs is determined according to the waveform differences of the faulty outputs.
    Type: Grant
    Filed: February 15, 2013
    Date of Patent: May 23, 2017
    Assignee: SYNOPSYS, INC.
    Inventors: Tien-Chun Wei, Jean-Marc Albert Forey, Kai Yang, Kuo-Ching Lin, Michael Lyons
  • Method for Ranking Fault-Test Pairs Based on Waveform Statistics in a Mutation-Based Test Program Evaluation System
    Publication number: 20140136900
    Abstract: Ranking of fault-test pairs is performed using first and second multitudes of waveform statistics. The first multitude of waveform statistics includes first value-change information regarding variations in logics HIGH and LOW for each bit of each reference output resulting from a test run of the design code. The second multitude of waveform statistics includes second value-change information regarding variations in logics HIGH and LOW for each bit of each faulty output resulting from a test run of the design code injected with a fault. Relative differences between the first and second multitudes of waveform statistics for each bit of each faulty output with respect to the corresponding reference output are determined. A waveform difference based on the relative differences for each signal of each faulty output is determined. A ranking result of fault-test pairs is determined according to the waveform differences of the faulty outputs.
    Type: Application
    Filed: February 15, 2013
    Publication date: May 15, 2014
    Applicant: SYNOPSYS, INC.
    Inventors: Tien-Chun Wei, Jean-Marc Albert Forey, Kai Yang, Kuo-Ching Lin, Michael Lyons