Abstract: A non-contact circuit analyzer includes a computer system having a memory with circuit parameters stored therein wherein the circuit parameters specify acceptable operating characteristics for a circuit. The analyzer further includes a magnetic field detector coupled to the computer and configured to detect the magnetic field emitted from the circuit while operational. The magnetic field relates to current in the circuit. The analyzer further includes an electric field sensor coupled to the computer and configured to detect the electric field emitted from the circuit while operational. The electric field relates to voltage and/or operating frequency in the circuit. The magnetic field detector and the electric field detector are configured to send signals for the detected fields to the computer system. The computer system is configured to compare the signals to the circuit parameters to determine whether the circuit is operating within the circuit parameters.

Abstract: A material analysis system configured to determine whether a circuit is defective includes a magnetic field generator configured to generate a first magnetic field that is configured to induce at least one eddy current in a conductive portion of the circuit, wherein the eddy current induces a second magnetic field; a set of magnetic field sensors configured to detect the second magnetic field and generate a set of image information therefrom; a database that includes circuit information for the circuit; and a computing device configured to receive the image information from the set of magnetic field sensors and retrieve the circuit information from the database, wherein the computing device is configured to compare the image information to the circuit information to determine whether the circuit is defective.