Patents by Inventor Timothee Pol Jean Toury

Timothee Pol Jean Toury has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method for the non-invasive detection and measurement of the properties of a medium
    Patent number: 7710573
    Abstract: The invention relates to a device useful for non-invasive detection of the properties of a medium by means of interferometry. The device comprises an optical source which is used for illuminating a zone of the medium that is to be probed with a light beam, and an interferometer for splitting the light beam into a reference beam and a probe beam. The interferometer has a cutoff frequency for the automatic control of respective path lengths of the reference beam and of the probe beam. The device also comprises scanning means which, together with the probe beam, are used to scan the zone to be probed at an image acquisition frequency greater than the cutoff frequency.
    Type: Grant
    Filed: August 18, 2004
    Date of Patent: May 4, 2010
    Assignees: Ecole Normale Superieure de Cachan, Centre National de la Recherche Scientifique—CNRS
    Inventors: Timothée Pol Jean Toury, Joseph Zyss
  • Non-invasive electric-filed-detection device and method
    Patent number: 7450237
    Abstract: The invention relates to a device which is used for the non-invasive detection of an electric potential or field, of the spatial and/or the temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device comprises: an optical source which is used to illuminate at least one zone of the medium that is to be probed with a light beam, the path of which defines an optical axis; and means for mapping the phase shift of the beam in the zone to be probed. Measuring means which are used to map the light beam phase shift comprise a confocal microscope in which the zone to be probed is placed in order to form an image of a plane of said zone.
    Type: Grant
    Filed: August 18, 2004
    Date of Patent: November 11, 2008
    Assignees: Centre National de la Reccherche Scientifique CNRS, Ecole Normale Superieure de Cachan
    Inventors: Joseph Zyss, Timothee Pol Jean Toury
  • Non-invasive electric-filed-detection device and method
    Publication number: 20080007248
    Abstract: The invention relates to a device which is used for the non-invasive detection of an electric potential or field, of the spatial and/or the temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device comprises: an optical source which is used to illuminate at least one zone of the medium that is to be probed with a light beam, the path of which defines an optical axis; and means for mapping the phase shift of the beam in the zone to be probed. Measuring means which are used to map the light beam phase shift comprise a confocal microscope in which the zone to be probed is placed in order to form an image of a plane of said zone.
    Type: Application
    Filed: August 18, 2004
    Publication date: January 10, 2008
    Applicants: Centre National De La Recherche Scientifque-CNRS, Ecole Normale Superieure De Cachan
    Inventors: Joseph Zyss, Timothee Pol Jean Toury