Abstract: An optical imaging system for a dimensional measuring machine including a digital sensor having an array of addressable pixels, a lens system that provides for forming an image of a test object on the digital sensor, and a variable size aperture of the lens that changes an f-number of the lens system for imaging points of the test object on the digital sensor at different spot sizes. An aperture controller varies the aperture size. An image controller groups contiguous clusters of one or more of the pixels having a common output such that the number of pixels within each of the clusters having a common output can be varied.

Abstract: A machine vision system includes a table having a fixture for supporting an object under inspection above the table, a gantry supporting a camera further above the table, a docking station, and a profile light movable together with the gantry between an inspection position beneath the object and a docking position next to the docking station. Fittings are provided for releasably securing the profile light to the gantry and for releasably securing the profile light to the docking station. The profile light can be disengaged from the gantry and engaged with the docking station for moving the profile light to the docking position or disengaged from the docking station and reengaged with the gantry for moving the profile light to the inspection position.

Abstract: A machine vision system includes a table having a fixture for supporting an object under inspection above the table, a gantry supporting a camera further above the table, a docking station, and a profile light movable together with the gantry between an inspection position beneath the object and a docking position next to the docking station. Fittings are provided for releasably securing the profile light to the gantry and for releasably securing the profile light to the docking station. The profile light can be disengaged from the gantry and engaged with the docking station for moving the profile light to the docking position or disengaged from the docking station and reengaged with the gantry for moving the profile light to the inspection position.