Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.

Abstract: In an approach to standard cell differentiation using topology and transistor attributes, a first circuit representation of an unidentified cell is received. The first circuit representation of the unidentified cell is converted to a first graph. A second circuit representation of each of one or more golden reference cells are retrieved. The second circuit representation of each of the one or more golden reference cells are converted to one or more second graphs. The first graph is matched to each of the one or more second graphs. One or more match results are reported based on the matching of the first graph to each of the one or more second graphs.

Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.

Abstract: The present disclosure provides a method for generating a spatially resolved netlist that includes generating a netlist based on integrated circuit (IC) layout data and standard cell library data, the netlist including cell and net definitions associated with the IC; determining position data for respective cells and nets based on the IC layout data; mapping the position data to respective cell and net definitions in the netlist; and generating a spatially resolved netlist that includes the mapped position data to respective cell and net definitions.

Abstract: The present disclosure provides a satisfiability modulo theory (SMT) modeling system that includes graphical representation circuitry to generate graphical data representing a circuit design; finite state machine (FSM) discovery circuitry to discover, based on a feedback loop of the circuit design, an FSM contained within the graphical data; SMT assertion generation circuitry to generate an SMT assertion set of the FSM, based on the combinatorial and/or sequential logic elements associated with the FSM; and SMT modeling circuitry to determine a behavior of the FSM by applying one or more logical functions to the SMT assertion set.

Abstract: A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.