Abstract: End-user software is used to select lists of values of control signals from a predetermined design of a processor, and a unique value of an opcode is assigned to each selected list of values of control signals. The assignments, of opcode values to lists of values of control signals, are used to create a new processor design customized for the end-user software, followed by synthesis, place and route, and netlist generation based on the new processor design, followed by configuring an FPGA based on the netlist, followed by execution of the end-user software in customized processor implemented by the FPGA. Different end-user software may be used as input to generate different assignments, of opcode values to lists of control signal values, followed by generation of different netlists. The different netlists may be used at different times, to reconfigure the same FPGA, to execute different end-user software optimally at different times.

Abstract: An implementation of an apparatus and method to generate a dynamically controlled clock is provided. The resulting clock reduces otherwise produced narrow clock pulses and allows for control from two separate control signals. A first control signal indicates a low power mode, for example a chip-wide low power mode. A second control signal indicates a user-selected mode to shutdown a selected clock.

Abstract: The present invention provides for a method of testing an FPGA using NVM memory cells for programmable interconnects. The NVM memory cells are arranged as a memory array of rows and columns. User-configurable logic elements and interconnections, which are programmed by the stored states of the memory cells, are organized into identical and/or differing tiles. The tiles organized into an array of rows and columns superimposed upon the memory array. The testing method includes: selecting test circuit configurations by which identical tiles are identically programmed as much as possible; and simultaneously programming and simultaneously erasing pluralities of the memory rows corresponding to the tiles into the test circuit configurations. Additionally, the test circuit configurations programmed into the FPGA are tested at a lower supply voltage than that of normal operation.

Abstract: The present invention provides for a method of testing an FPGA using NVM memory cells for programmable interconnects. The NVM memory cells are arranged as a memory array of rows and columns. User-configurable logic elements and interconnections, which are programmed by the stored states of the memory cells, are organized into identical and/or differing tiles. The tiles are organized into an array of rows and columns superimposed upon the memory array. The testing method includes: selecting test circuit configurations by which identical tiles are identically programmed as much as possible; and simultaneously programming and simultaneously erasing pluralities of the memory rows corresponding to the tiles into the test circuit configurations. Additionally, the test circuit configurations programmed into the FPGA are tested at a lower supply voltage than that of normal operation.

Abstract: The present invention provides for an FPGA integrated circuit having an array of logic cells and interconnect lines interconnected by programmable switches, each formed from a nonvolatile memory cell. The logic cell is designed to provide logic or memory functions according to the setting of programmable switches within the cell. The logic cells in the array are interconnectable by a hierarchy of local, long and global wiring segments. The interconnections are made by the setting of programmable switches between the wiring segments.

Abstract: An integrated circuit structure which employs at least two metal levels overlying an array of circuit elements. Each metal level contains signal routing resources which can be used for supplying power and interconnecting circuit elements. The metal levels include a first metal level directly overlying the array of circuit elements, intermediate metal levels (if there are more than two metal levels), and a top metal level overlying all other metal levels. Power carrying tracks are disposed in the top metal level. Power antennae are disposed in the first metal level, but only where necessary to provide power to the circuit elements. The power antennae are for connecting the power carrying tracks to the circuit elements. Power bridges are disposed in intermediate metal levels between the first metal level and the top metal level. The power bridges are for connecting the power carrying tracks to the power antennae.

Abstract: A simulation technique for modeling the function of logic elements containing memory is disclosed. The technique uses a table to represent the logical function of the devices that are being simulated.