Abstract: A display may have an array of pixels. Display driver circuitry may supply data and control signals to the pixels. Each pixel may have seven transistors, a capacitor, and a light-emitting diode such as an organic light-emitting diode. The seven transistors may receive control signals using horizontal control lines. Each pixel may have first and second emission enable transistors that are coupled in series with a drive transistor and the light-emitting diode of that pixel. The first and second emission enable transistors may be coupled to a common control line or may be separately controlled so that on-bias stress can be effectively applied to the drive transistor. The display driver circuitry may have gate driver circuits that provide different gate line signals to different rows of pixels within the display. Different rows may also have different gate driver strengths and different supplemental gate line loading structures.

Abstract: A method for automatically cleaning a probe card includes the following operations. A first wafer is tested in a chamber of a testing machine. A yield of the first wafer is monitored by a tool online monitor system (TOMS). An instruction file is transmitted by the TOMS to a tester, in which the instruction file compiles a first program code of the TOMS into a second program code of the tester. The second program code of the tester is received by the tester. A general purpose interface bus (GPIB) command is transferred to a testing machine by the tester. A cleaning operation is performed by the testing machine.

Abstract: The present disclosure provides a semiconductor test method. The semiconductor test method includes the operations of: receiving a source code written in an interpreted language; and performing, by a first test apparatus, a first test on a device under test (DUT) based on the source code. The operation of performing, by the first test apparatus, the first test on the DUT based on the source code includes the operations of: interpreting, by a processor, the source code to generate a first interpreted code; and performing the first test on the DUT according to the first interpreted code. The first test apparatus is configured to execute the first interpreted code written in a first language.

Abstract: A method and a testing apparatus related to wafer testing are provided. In the method, testing raw data is obtained by a testing apparatus operating with a Unix-related system. The testing raw data is a testing result of probe testing on one or more wafers by the testing apparatus. The testing raw data is converted into converted data by the testing apparatus. The converted data is related to the defect information of the wafer. Analyzed data is generated by the testing apparatus according to the converted data. The analyzed data is used for a graphical interface. Therefore, real-time defect analysis during the testing procedure may be provided.

Abstract: A test method is disclosed. The test method includes the following operations: transmitting from a first controller a first command by a network to a test apparatus; the test apparatus being disconnecting from a prober in response to the first command received by a control interface in the test apparatus; controlling, by the control interface, at least one operation of the prober on a wafer held by the prober or a probe through a first control signal that is generated by the test apparatus to the prober and associated with the second command; and testing, by the prober and the test apparatus, the wafer and outputting a test data of the wafer.

Abstract: The present disclosure provides a semiconductor test method. The semiconductor test method includes the operations of: receiving a source code written in an interpreted language; and performing, by a first test apparatus, a first test on a device under test (DUT) based on the source code. The operation of performing, by the first test apparatus, the first test on the DUT based on the source code includes the operations of: interpreting, by a processor, the source code to generate a first interpreted code; and performing the first test on the DUT according to the first interpreted code. The first test apparatus is configured to execute the first interpreted code written in a first language.

Abstract: A lens assembly has an optical axis. The lens assembly includes a first lens and a second lens stacked on a side of the first lens along the optical axis. A mounting groove is recessed from a surface of the first lens facing the second lens, the mounting groove is arranged around the optical axis and coaxially with the first lens. A protruding portion is protruded from a surface of the second lens facing the first lens to match the mounting groove, the protruding portion is arranged around the optical axis and coaxially with the second lens. The protruding portion is received in the mounting groove. The disclosure also provides an electronic device having the lens assembly.

Abstract: A pH-responsive nanoparticle made of a pH-responsive polymer and a poly(lactic-co-glycolic acid) by self-assembly includes a polyethylene glycol derivative and a R-Histidine derivative that are subjected to a chemical reaction to form the pH-responsive polymer, wherein the surface electric potential of the pH-responsive nanoparticle is ?25 to 10 mV, such that when a pH value of the pH-responsive nanoparticle is changed from 7.4 to 5.0 depending upon an external environment, a surface zeta potential of the pH-responsive nanoparticle is converted from negative charge to positive charge.

Abstract: A pH-responsive nanoparticle made of a pH-responsive polymer and a poly(lactic-co-glycolic acid) by self-assembly includes a polyethylene glycol derivative and a R-Histidine derivative that are subjected to a chemical reaction to form the pH-responsive polymer, wherein the surface electric potential of the pH-responsive nanoparticle is ?25 to 10 mV, such that when a pH value of the pH-responsive nanoparticle is changed from 7.4 to 5.0 depending upon an external environment, a surface zeta potential of the pH-responsive nanoparticle is converted from negative charge to positive charge.