Patents by Inventor Tobias Clauss
Tobias Clauss has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11880407Abstract: A method for generating a database, having “receiving environmental noises” (e.g. disturbing noise) and “buffered environmental noises for a migrating time window” (like 30 or 60 seconds) alternatively “deriving a set of parameters relative to the environmental noises” and of “buffering the set of parameters for the migrating time window”, he buffered environmental noises or the buffered set of parameters being generally referred to as recording, furthermore “obtaining a signal”, which identifies a signal class (like disturbing noise) of a plurality of signal classes (disturbing noise and non-disturbing noise) in the environmental noises, and “storing the buffered recordings responsive to the signal” in a memory (e.g. internal or external memory). Obtaining and storing are repeated in order to set up the database which has a plurality of buffered recordings for the same signal class.Type: GrantFiled: December 28, 2017Date of Patent: January 23, 2024Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.Inventors: Thomas Sporer, Tobias Clauss, Judith Liebetrau, Sara Kepplinger, Dietmar Kepplinger
-
Publication number: 20220365131Abstract: Embodiments provide a method for acoustically testing at least one MEMS device of a plurality of MEMS devices. The method comprises a step of providing at least one MEMS device. Additionally, the method comprises a step of exciting the at least one MEMS device to an acoustic vibration. Additionally, the method comprises a step of detecting the acoustic vibration of the at least one MEMS device by at least one sound sensor. Additionally, the method comprises a step of evaluating the acoustic vibration of the at least one MEMS device detected by the at least one sound sensor to test the at least one MEMS device as to an intended functionality.Type: ApplicationFiled: July 28, 2022Publication date: November 17, 2022Inventors: Tobias FRITSCH, Tobias CLAUß, Paul FRITZSCHE, Matthias FIEDLER
-
Patent number: 11003709Abstract: What is described is a method for associating noises of at least one signal class (like disturbing noise) of a plurality of signal classes (like disturbing noise and non-disturbing noise). The method has the steps of “receiving environmental noises” and “establishing whether the environmental noises or a set of parameters derived from the environmental noises fulfill/s a predefined rule which describes the signal class of the plurality of signal classes”. Starting from this, the steps of “logging that the predefined rule has been fulfilled”, “recording the environmental noises received for a migrating time window”, “deriving a set of parameters from the environmental noises for the migrating time window and storing the set of parameters” or “emitting an activation signal for another device for associating a noise” are performed.Type: GrantFiled: December 28, 2017Date of Patent: May 11, 2021Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.Inventors: Thomas Sporer, Tobias Clauss, Judith Liebetrau, Sara Kepplinger, Hanna Lukashevich, Dietmar Kepplinger
-
Publication number: 20180122398Abstract: What is described is a method for associating noises of at least one signal class (like disturbing noise) of a plurality of signal classes (like disturbing noise and non-disturbing noise). The method has the steps of “receiving environmental noises” and “establishing whether the environmental noises or a set of parameters derived from the environmental noises fulfill/s a predefined rule which describes the signal class of the plurality of signal classes”. Starting from this, the steps of “logging that the predefined rule has been fulfilled”, “recording the environmental noises received for a migrating time window”, “deriving a set of parameters from the environmental noises for the migrating time window and storing the set of parameters” or “emitting an activation signal for another device for associating a noise” are performed.Type: ApplicationFiled: December 28, 2017Publication date: May 3, 2018Inventors: Thomas SPORER, Tobias CLAUSS, Judith LIEBETRAU, Sara KEPPLINGER, Hanna LUKASHEVICH, Dietmar KEPPLINGER
-
Publication number: 20180121540Abstract: What is described is a method for generating a database, having “receiving environmental noises”, which may exemplarily have a disturbing noise, and “buffered environmental noises for a migrating time window”, like 30 or 60 seconds or, advantageously, more than 5 seconds, alternatively “deriving a set of parameters relative to the environmental noises” and of “buffering the set of parameters for the migrating time window”, he buffered environmental noises or the buffered set of parameters being generally referred to as recording, furthermore “obtaining a signal”, which identifies a signal class (like disturbing noise) of a plurality of signal classes (disturbing noise and non-disturbing noise) in the environmental noises, and “storing the buffered recordings responsive to the signal” in a memory, like an internal or external memory. Obtaining and storing are repeated in order to set up the database which has a plurality of buffered recordings for the same signal class.Type: ApplicationFiled: December 28, 2017Publication date: May 3, 2018Inventors: Thomas SPORER, Tobias CLAUSS, Judith LIEBETRAU, Sara KEPPLINGER, Dietmar KEPPLINGER
-
Patent number: 8058614Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron to microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.Type: GrantFiled: January 11, 2010Date of Patent: November 15, 2011Assignee: Carl Zeiss NTS GmbHInventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach
-
Publication number: 20100119698Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron to microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.Type: ApplicationFiled: January 11, 2010Publication date: May 13, 2010Inventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach
-
Patent number: 7645989Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.Type: GrantFiled: September 19, 2007Date of Patent: January 12, 2010Assignee: Carl Zeiss NTS GmbHInventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach
-
Publication number: 20080099674Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.Type: ApplicationFiled: September 19, 2007Publication date: May 1, 2008Applicant: Carl Zeiss NTS GmbHInventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach