Patents by Inventor Tobias Clauss

Tobias Clauss has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11880407
    Abstract: A method for generating a database, having “receiving environmental noises” (e.g. disturbing noise) and “buffered environmental noises for a migrating time window” (like 30 or 60 seconds) alternatively “deriving a set of parameters relative to the environmental noises” and of “buffering the set of parameters for the migrating time window”, he buffered environmental noises or the buffered set of parameters being generally referred to as recording, furthermore “obtaining a signal”, which identifies a signal class (like disturbing noise) of a plurality of signal classes (disturbing noise and non-disturbing noise) in the environmental noises, and “storing the buffered recordings responsive to the signal” in a memory (e.g. internal or external memory). Obtaining and storing are repeated in order to set up the database which has a plurality of buffered recordings for the same signal class.
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: January 23, 2024
    Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
    Inventors: Thomas Sporer, Tobias Clauss, Judith Liebetrau, Sara Kepplinger, Dietmar Kepplinger
  • Publication number: 20220365131
    Abstract: Embodiments provide a method for acoustically testing at least one MEMS device of a plurality of MEMS devices. The method comprises a step of providing at least one MEMS device. Additionally, the method comprises a step of exciting the at least one MEMS device to an acoustic vibration. Additionally, the method comprises a step of detecting the acoustic vibration of the at least one MEMS device by at least one sound sensor. Additionally, the method comprises a step of evaluating the acoustic vibration of the at least one MEMS device detected by the at least one sound sensor to test the at least one MEMS device as to an intended functionality.
    Type: Application
    Filed: July 28, 2022
    Publication date: November 17, 2022
    Inventors: Tobias FRITSCH, Tobias CLAUß, Paul FRITZSCHE, Matthias FIEDLER
  • Patent number: 11003709
    Abstract: What is described is a method for associating noises of at least one signal class (like disturbing noise) of a plurality of signal classes (like disturbing noise and non-disturbing noise). The method has the steps of “receiving environmental noises” and “establishing whether the environmental noises or a set of parameters derived from the environmental noises fulfill/s a predefined rule which describes the signal class of the plurality of signal classes”. Starting from this, the steps of “logging that the predefined rule has been fulfilled”, “recording the environmental noises received for a migrating time window”, “deriving a set of parameters from the environmental noises for the migrating time window and storing the set of parameters” or “emitting an activation signal for another device for associating a noise” are performed.
    Type: Grant
    Filed: December 28, 2017
    Date of Patent: May 11, 2021
    Assignee: Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
    Inventors: Thomas Sporer, Tobias Clauss, Judith Liebetrau, Sara Kepplinger, Hanna Lukashevich, Dietmar Kepplinger
  • Publication number: 20180122398
    Abstract: What is described is a method for associating noises of at least one signal class (like disturbing noise) of a plurality of signal classes (like disturbing noise and non-disturbing noise). The method has the steps of “receiving environmental noises” and “establishing whether the environmental noises or a set of parameters derived from the environmental noises fulfill/s a predefined rule which describes the signal class of the plurality of signal classes”. Starting from this, the steps of “logging that the predefined rule has been fulfilled”, “recording the environmental noises received for a migrating time window”, “deriving a set of parameters from the environmental noises for the migrating time window and storing the set of parameters” or “emitting an activation signal for another device for associating a noise” are performed.
    Type: Application
    Filed: December 28, 2017
    Publication date: May 3, 2018
    Inventors: Thomas SPORER, Tobias CLAUSS, Judith LIEBETRAU, Sara KEPPLINGER, Hanna LUKASHEVICH, Dietmar KEPPLINGER
  • Publication number: 20180121540
    Abstract: What is described is a method for generating a database, having “receiving environmental noises”, which may exemplarily have a disturbing noise, and “buffered environmental noises for a migrating time window”, like 30 or 60 seconds or, advantageously, more than 5 seconds, alternatively “deriving a set of parameters relative to the environmental noises” and of “buffering the set of parameters for the migrating time window”, he buffered environmental noises or the buffered set of parameters being generally referred to as recording, furthermore “obtaining a signal”, which identifies a signal class (like disturbing noise) of a plurality of signal classes (disturbing noise and non-disturbing noise) in the environmental noises, and “storing the buffered recordings responsive to the signal” in a memory, like an internal or external memory. Obtaining and storing are repeated in order to set up the database which has a plurality of buffered recordings for the same signal class.
    Type: Application
    Filed: December 28, 2017
    Publication date: May 3, 2018
    Inventors: Thomas SPORER, Tobias CLAUSS, Judith LIEBETRAU, Sara KEPPLINGER, Dietmar KEPPLINGER
  • Patent number: 8058614
    Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron to microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.
    Type: Grant
    Filed: January 11, 2010
    Date of Patent: November 15, 2011
    Assignee: Carl Zeiss NTS GmbH
    Inventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach
  • Publication number: 20100119698
    Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron to microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.
    Type: Application
    Filed: January 11, 2010
    Publication date: May 13, 2010
    Inventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach
  • Patent number: 7645989
    Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.
    Type: Grant
    Filed: September 19, 2007
    Date of Patent: January 12, 2010
    Assignee: Carl Zeiss NTS GmbH
    Inventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach
  • Publication number: 20080099674
    Abstract: The disclosure relates to a method for manufacturing an object with miniaturized structures. The method involves processing the object by supplying reaction gas during concurrent directing an electron beam onto a location to be processed, to deposit material or ablate material; and inspecting the object by scanning the surface of the object with an electron beam and leading generated backscattered electrons and secondary electrons to an energy selector, reflecting the secondary electrons from the energy selector, detecting the backscattered electrons passing the energy selector and generating an electron microscopic image of the scanned region in dependence on the detected backscattered electrons; and examining the generated electron microscopic image and deciding whether further depositing or ablating of material should be carried out. The disclosure also relates to an electron microscope and a processing system which are adapted for performing the method.
    Type: Application
    Filed: September 19, 2007
    Publication date: May 1, 2008
    Applicant: Carl Zeiss NTS GmbH
    Inventors: Johannes Bihr, Friedhelm Panteleit, Tobias Clauss, Michael Budach