Abstract: A spectrograph as disclosed includes a housing, wherein a wall of the housing includes first, second and third openings, an entrance slit located at the first opening and configured to direct light along a first light path portion in the interior of the housing, a dispersive element located at the second opening and configured to receive light from the entrance slit along the first light path portion and direct light along a second light path portion in the interior of the housing, a detector located at the third opening and configured to receive light from the dispersive element along the second light path portion. The detector can include first and second groups of light-sensitive regions. A cover can be positioned to separate the first group of light-sensitive regions from the light path, the second group of light-sensitive regions being exposed to the light path.

Abstract: Apparatuses and methods are disclosed for performing a light-absorption measurement on a test sample and a compliance measurement on a reference sample. A method includes moving a reference sample receptacle carrier of an apparatus to position a first reference sample receptacle received in the carrier at a second position in a light path, directing light from an illumination system to a detection system along the light path to perform a light-absorption measurement on a first reference sample at the second position, moving the carrier to position the first receptacle out of the light path, placing a test sample receptacle in a test sample receptacle holder of the apparatus in the light path at a first position different from the second position, and directing light along the light path to perform a light-absorption measurement on a test sample in the test sample receptacle holder at the first position.

Abstract: An apparatus and a method are disclosed for performing a light-absorption measurement of a specified amount of sample. A method for performing a light-absorption measurement of a specified amount of sample includes placing the sample on the surface of an apparatus including the surface and a light reflector, the light reflector being mechanically coupled with the surface and separated from the surface by a separation distance, changing the separation distance, while the light reflector remains mechanically coupled with the surface, to a first separation distance, and performing a first light-absorption measurement of the sample via the apparatus, while the separation distance is equal to the first separation distance, and while the sample is subject to pressure force.

Abstract: A spectrograph as disclosed includes a housing, wherein a wall of the housing includes first, second and third openings, an entrance slit located at the first opening and configured to direct light along a first light path portion in the interior of the housing, a dispersive element located at the second opening and configured to receive light from the entrance slit along the first light path portion and direct light along a second light path portion in the interior of the housing, a detector located at the third opening and configured to receive light from the dispersive element along the second light path portion. The detector can include first and second groups of light-sensitive regions. A cover can be positioned to separate the first group of light-sensitive regions from the light path, the second group of light-sensitive regions being exposed to the light path.

Abstract: Apparatuses and methods are disclosed for performing a light-absorption measurement on a test sample and a compliance measurement on a reference sample. A method includes moving a reference sample receptacle carrier of an apparatus to position a first reference sample receptacle received in the carrier at a second position in a light path, directing light from an illumination system to a detection system along the light path to perform a light-absorption measurement on a first reference sample at the second position, moving the carrier to position the first receptacle out of the light path, placing a test sample receptacle in a test sample receptacle holder of the apparatus in the light path at a first position different from the second position, and directing light along the light path to perform a light-absorption measurement on a test sample in the test sample receptacle holder at the first position.

Abstract: An apparatus and a method are disclosed for performing a light-absorption measurement of a specified amount of sample. A method for performing a light-absorption measurement of a specified amount of sample includes placing the sample on the surface of an apparatus including the surface and a light reflector, the light reflector being mechanically coupled with the surface and separated from the surface by a separation distance, changing the separation distance, while the light reflector remains mechanically coupled with the surface, to a first separation distance, and performing a first light-absorption measurement of the sample via the apparatus, while the separation distance is equal to the first separation distance, and while the sample is subject to pressure force.

Abstract: A projection subsystem includes a light engine that provides a collection lens, a collimator and at least one solid state light emitter. A projection lens assembly receives the image and provides a projection beam having a luminous flux level. The projection subsystem has a portability efficacy.

Abstract: A projection subsystem includes a light engine that provides a collection lens, a collimator and at least one solid state light emitter. A projection lens assembly receives the image and provides a projection beam having a luminous flux level. The projection subsystem has a portability efficacy.

Abstract: A projection subsystem includes a light engine that provides a collection lens, a collimator and at least one solid state light emitter. A projection lens assembly receives the image and provides a projection beam having a luminous flux level. The projection subsystem has a portability efficacy.

Abstract: A projection subsystem includes a light engine that provides a collection lens, a collimator and at least one solid state light emitter. A projection lens assembly receives the image and provides a projection beam having a luminous flux level. The projection subsystem has a portability efficacy.

Abstract: A projection subsystem includes a light engine that provides a collection lens, a collimator and at least one solid state light emitter. A projection lens assembly receives the image and provides a projection beam having a luminous flux level. The projection subsystem has a portability efficacy.

Abstract: A projection subsystem includes a light engine that provides a collection lens, a collimator and at least one solid state light emitter. A projection lens assembly receives the image and provides a projection beam having a luminous flux level. The projection subsystem has a portability efficacy.

Abstract: A projection subsystem includes a light engine that provides a collection lens, a collimator and at least one solid state light emitter. A projection lens assembly receives the image and provides a projection beam having a luminous flux level. The projection subsystem has a portability efficacy.

Abstract: A polishing system for polishing a surface of a substrate, such as the surface of an optical pin mold, to a desired surface finish and profile under the automated control of a computer during a polishing cycle. The polishing system includes a polishing spindle assembly that holds and rotates a polishing tool that is contacted under pressure with a surface of the mold pin. A torque sensor is associated with the polishing spindle assembly to sense a torque on the polishing tool during the polishing cycle. The polishing system further includes a feedback control system that dynamically adjusts the position of the polishing spindle assembly in response to the torque sensed by the torque sensor to maintain a substantially constant torque on the polishing tool during the polishing cycle.

Abstract: A polishing system for polishing a surface of a substrate, such as the surface of an optical pin mold, to a desired surface finish and profile under the automated control of a computer during a polishing cycle. The polishing system includes a polishing spindle assembly that holds and rotates a polishing tool that is contacted under pressure with a surface of the mold pin. A torque sensor is associated with the polishing spindle assembly to sense a torque on the polishing tool during the polishing cycle. The polishing system further includes a feedback control system that dynamically adjusts the position of the polishing spindle assembly in response to the torque sensed by the torque sensor to maintain a substantially constant torque on the polishing tool during the polishing cycle.