Patents by Inventor Tomi Tuohimaa
Tomi Tuohimaa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11979972Abstract: A liquid metal jet X-ray source including an electromagnetic pump for pumping the liquid metal. The electromagnetic pump includes a core having a core diameter and an outer yoke with a thickness of at least 20% of the core diameter. Preferably, the thickness of the outer yoke is at least 20% of the core diameter plus 6% of a radial distance between an outside of the core and an inside of the yoke.Type: GrantFiled: May 7, 2020Date of Patent: May 7, 2024Assignee: EXCILLUM ABInventors: Björn Hansson, Per Takman, Ulf Lundström, Tomi Tuohimaa
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Patent number: 11910515Abstract: An electromagnetic pump for pumping an electrically conductive liquid, including a first conduit section and a second conduit section. The electromagnetic pump further includes a current generator arranged to provide an electric current through the liquid in the first conduit section and the liquid in the second conduit section such that a direction of the electric current is intersecting the flow of the liquid in the first conduit section and in the second conduit section, and a magnetic field generating arrangement arranged to provide a magnetic field passing through the liquid in the first conduit section and the second conduit section such that a direction of the magnetic field is intersecting the flow of the liquid and the direction of the electric current.Type: GrantFiled: May 7, 2020Date of Patent: February 20, 2024Assignee: EXCILLUM ABInventors: Ulf Lundström, Björn Hansson, Per Takman, Tomi Tuohimaa
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Patent number: 11892576Abstract: A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also, a corresponding liquid metal jet X-ray source.Type: GrantFiled: January 17, 2023Date of Patent: February 6, 2024Assignee: EXCILLUM ABInventors: Per Takman, Tomi Tuohimaa, Ulf Lundström
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Publication number: 20230238204Abstract: An X-ray imaging system, including a target; an electron beam source configured to provide an electron beam for interaction with the target to generate X-ray radiation; electron optics configured to alternately direct the electron beam to at least a first and a second location on the target; an X-ray detector array configured to receive X-ray radiation generated at the first and second locations on the target; a sample position region for receiving a sample to be exposed to generated X-ray radiation, the sample position region being located in a region where X-ray radiation generated at the first location overlaps with X-ray radiation generated at the second location; and a processing unit coupled to the X-ray detector array, the processing unit being configured to create an image of a sample, positioned in the sample position region, based on the X-ray radiation originating from the first location and from the second location.Type: ApplicationFiled: April 29, 2021Publication date: July 27, 2023Applicant: Excillum ABInventors: Björn HANSSON, Julius HÅLLSTEDT, Tomi TUOHIMAA, Ulf LUNDSTRÖM, Daniel NILSSON
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Publication number: 20230176239Abstract: A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also, a corresponding liquid metal jet X-ray source.Type: ApplicationFiled: January 17, 2023Publication date: June 8, 2023Applicant: Excillum ABInventors: Per TAKMAN, Tomi TUOHIMAA, Ulf LUNDSTRÖM
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Patent number: 11651927Abstract: An X-ray source including a liquid target source configured to provide a liquid target in an interaction region of the X-ray source, an electron source adapted to provide an electron beam directed towards the interaction region, such that the electron beam interacts with the liquid target to generate X-ray radiation, and an electron collector arranged at a distance downstream of the interaction region, as seen along a travel direction of the electron beam. The electron collector includes an impact portion configured to absorb electrons of the electron beam impinging thereon, and the impact portion is arranged so as to be oblique with respect to the travel direction of the electron beam at the impact portion.Type: GrantFiled: December 17, 2019Date of Patent: May 16, 2023Assignee: EXCILLUM ABInventors: Tomi Tuohimaa, Ulf Lundström, Björn Hansson
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Patent number: 11579318Abstract: A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also a corresponding liquid metal jet X-ray source.Type: GrantFiled: November 12, 2020Date of Patent: February 14, 2023Assignee: EXCILLUM ABInventors: Per Takman, Tomi Tuohimaa, Ulf Lundström
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Publication number: 20220404514Abstract: A method for characterizing an electron beam in a liquid metal jet X-ray source. The method includes providing the electron beam and directing the electron beam to an interaction region; providing an electron beam dump connected to ground potential for receiving the electron beam after it has traversed the interaction region; scanning the electron beam over at least part of the interaction region; measuring X-ray radiation generated by interaction between the electron beam and the electron beam dump during the scanning to obtain an X-ray profile; and calculating an electron beam characteristic based on the X-ray profile. Also a corresponding liquid metal jet X-ray source.Type: ApplicationFiled: November 12, 2020Publication date: December 22, 2022Applicant: Excillum ABInventors: Per TAKMAN, Tomi TUOHIMAA, Ulf LUNDSTRÖM
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Patent number: 11438996Abstract: A method for protecting an X-ray source including: a liquid jet generator configured to form a liquid jet moving along a flow axis; an electron source configured to provide an electron beam interacting with the liquid jet to generate X-ray radiation; the method including: generating the liquid jet: monitoring a quality measure indicating a performance of the liquid jet; identifying, based on the quality measure, a malperformance of the liquid jet; and if said malperformance is identified, causing the X-ray source to enter a safe mode for protecting the X ray source. Further, to corresponding devices.Type: GrantFiled: February 8, 2019Date of Patent: September 6, 2022Assignee: EXCILLUM ABInventors: Tomi Tuohimaa, Per Takman, Daniel Larsson
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Publication number: 20220230832Abstract: A liquid metal jet X-ray source including an electromagnetic pump for pumping the liquid metal. The electromagnetic pump includes a core having a core diameter and an outer yoke with a thickness of at least 20% of the core diameter. Preferably, the thickness of the outer yoke is at least 20% of the core diameter plus 6% of a radial distance between an outside of the core and an inside of the yoke.Type: ApplicationFiled: May 7, 2020Publication date: July 21, 2022Applicant: Excillum ABInventors: Björn HANSSON, Per TAKMAN, Ulf LUNDSTRÖM, Tomi TUOHIMAA
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Publication number: 20220220951Abstract: An electromagnetic pump for pumping an electrically conductive liquid, including a first conduit section and a second conduit section. The electromagnetic pump further includes a current generator arranged to provide an electric current through the liquid in the first conduit section and the liquid in the second conduit section such that a direction of the electric current is intersecting the flow of the liquid in the first conduit section and in the second conduit section, and a magnetic field generating arrangement arranged to provide a magnetic field passing through the liquid in the first conduit section and the second conduit section such that a direction of the magnetic field is intersecting the flow of the liquid and the direction of the electric current.Type: ApplicationFiled: May 7, 2020Publication date: July 14, 2022Applicant: Excillum ABInventors: Ulf LUNDSTRÖM, Björn HANSSON, Per TAKMAN, Tomi TUOHIMAA
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Publication number: 20220028645Abstract: An X-ray source including a liquid target source configured to provide a liquid target in an interaction region of the X-ray source, an electron source adapted to provide an electron beam directed towards the interaction region, such that the electron beam interacts with the liquid target to generate X-ray radiation, and an electron collector arranged at a distance downstream of the interaction region, as seen along a travel direction of the electron beam. The electron collector includes an impact portion configured to absorb electrons of the electron beam impinging thereon, and the impact portion is arranged so as to be oblique with respect to the travel direction of the electron beam at the impact portion.Type: ApplicationFiled: December 17, 2019Publication date: January 27, 2022Applicant: Excillum ABInventors: Tomi TUOHIMAA, Ulf LUNDSTRÖM, Björn HANSSON
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Patent number: 10930464Abstract: A method for generating X-ray radiation, the method including providing a liquid target in a chamber, directing an electron beam towards the liquid target such that the electron beam interacts with the liquid target to generated X-ray radiation, estimating a number of particles produced from the interaction between the electron beam and the liquid target by measuring a number of positively charged particles in the chamber and eliminating a contribution from scattered electrons to the estimated number of particles, and controlling the electron beam, and/or a temperature in a region of the liquid target in which the electron beam interacts with the target, such that the estimated number of particles is below a predetermined limit. Also, a corresponding X-ray source.Type: GrantFiled: March 27, 2018Date of Patent: February 23, 2021Assignee: EXCILLUM ABInventors: Per Takman, Tomi Tuohimaa
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Publication number: 20200367351Abstract: A method for protecting an X-ray source including: a liquid jet generator configured to form a liquid jet moving along a flow axis; an electron source configured to provide an electron beam interacting with the liquid jet to generate X-ray radiation; the method including: generating the liquid jet: monitoring a quality measure indicating a performance of the liquid jet; identifying, based on the quality measure, a malperformance of the liquid jet; and if said malperformance is identified, causing the X-ray source to enter a safe mode for protecting the X ray source. Further, to corresponding devices.Type: ApplicationFiled: February 8, 2019Publication date: November 19, 2020Applicant: Excillum ABInventors: Tomi TUOHIMAA, Per TAKMAN, Daniel LARSSON
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Patent number: 10825642Abstract: An X-ray source and a corresponding method for generating X-ray radiation are disclosed. The X-ray source includes a chamber comprising an interaction region, and a first electron source operable to emit a first electron beam, including electrons of a first energy, towards the interaction region such that the first electron beam interacts with a target to generate X-ray radiation. The X-ray source further includes a second electron source adapted to be independently operated to emit a second electron beam including electrons of a second energy for ionising particles in the chamber, and an ion collection tool that is adapted to remove the ionised particles from the chamber by means of an electromagnetic field. By ionising particles and preventing them from moving freely in the chamber, problems related to contamination of the chamber may be mitigated.Type: GrantFiled: June 18, 2017Date of Patent: November 3, 2020Assignee: EXCILLUM ABInventor: Tomi Tuohimaa
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Patent number: 10818468Abstract: An X-ray source and a corresponding method for generating X-ray radiation are disclosed. The X-ray source includes a target generator, an electron source and a mixing tool. The target generator is adapted to form a liquid jet propagating through an interaction region, whereas the electron source is adapted to provide an electron beam directed towards the interaction region such that the electron beam interacts with the liquid jet to generate X-ray radiation. The mixing tool is adapted to induce mixing of the liquid jet at a distance downstream of the interaction region such that a maximum surface temperature of the liquid jet is below a threshold temperature. By controlling the maximum surface temperature, vaporisation, and thus the amount of contaminations originating from the jet, may be reduced.Type: GrantFiled: March 1, 2017Date of Patent: October 27, 2020Assignee: EXCILLUM ABInventors: Björn Hansson, Tomi Tuohimaa, Göran Johansson
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Patent number: 10784069Abstract: A system and method for generating X-ray radiation. The system includes an electron source operable to generate an electron beam and an X-ray target for generating X-ray radiation upon interaction with the electron beam. The method includes moving the electron beam over an edge separating a first region and a second region of the X-ray target, wherein the first region and the second region have different capability to generate X-ray radiation upon interaction with the electron beam. The system allows for a lateral extension of the electron beam to be determined based on a change in a quantity indicative of the interaction between the electron beam and the first region and between the electron beam and the second region, and the movement of the electron beam.Type: GrantFiled: October 19, 2017Date of Patent: September 22, 2020Assignee: EXCILLUM ABInventors: Tomi Tuohimaa, Per Takman, Andrii Sofiienko
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Publication number: 20200058461Abstract: A method for generating X-ray radiation, the method including providing a liquid target in a chamber, directing an electron beam towards the liquid target such that the electron beam interacts with the liquid target to generated X-ray radiation, estimating a number of particles produced from the interaction between the electron beam and the liquid target by measuring a number of positively charged particles in the chamber and eliminating a contribution from scattered electrons to the estimated number of particles, and controlling the electron beam, and/or a temperature in a region of the liquid target in which the electron beam interacts with the target, such that the estimated number of particles is below a predetermined limit. Also, a corresponding X-ray source.Type: ApplicationFiled: March 27, 2018Publication date: February 20, 2020Applicant: Excillum ABInventors: Per TAKMAN, Tomi TUOHIMAA
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Publication number: 20190311874Abstract: A system and method for generating X-ray radiation. The system includes an electron source operable to generate an electron beam and an X-ray target for generating X-ray radiation upon interaction with the electron beam. The method includes moving the electron beam over an edge separating a first region and a second region of the X-ray target, wherein the first region and the second region have different capability to generate X-ray radiation upon interaction with the electron beam. The system allows for a lateral extension of the electron beam to be determined based on a change in a quantity indicative of the interaction between the electron beam and the first region and between the electron beam and the second region, and the movement of the electron beam.Type: ApplicationFiled: October 19, 2017Publication date: October 10, 2019Applicant: Excillum ABInventors: Tomi TUOHIMAA, Per TAKMAN, Andrii SOFIIENKO
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Publication number: 20190131103Abstract: An X-ray source and a corresponding method for generating X-ray radiation are disclosed. The X-ray source includes a chamber comprising an interaction region, and a first electron source operable to emit a first electron beam, including electrons of a first energy, towards the interaction region such that the first electron beam interacts with a target to generate X-ray radiation. The X-ray source further includes a second electron source adapted to be independently operated to emit a second electron beam including electrons of a second energy for ionising particles in the chamber, and an ion collection tool that is adapted to remove the ionised particles from the chamber by means of an electromagnetic field. By ionising particles and preventing them from moving freely in the chamber, problems related to contamination of the chamber may be mitigated.Type: ApplicationFiled: June 18, 2017Publication date: May 2, 2019Applicant: Excillum ABInventor: Tomi Tuohimaa