Patents by Inventor Tomoaki Ishibashi

Tomoaki Ishibashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11781039
    Abstract: Solutions are disclosed for preventing the settling of an abrasive, while maintaining the polishing performance of a polishing composition. Solutions are disclosed for improving the redispersibility of an abrasive while maintaining the polishing performance. Polishing compositions for use in polishing a semiconductor substrate according to the present disclosure include an abrasive, a layered compound, and a dispersion medium.
    Type: Grant
    Filed: December 22, 2017
    Date of Patent: October 10, 2023
    Assignee: FUJIMI INCORPORATED
    Inventors: Tomoaki Ishibashi, Hiroki Kon
  • Publication number: 20230133552
    Abstract: This interior member for a vehicle is configured by causing an upper trim and a lower trim, which are vertically divided in two parts, to abut each other, a concave section having a bottom surface portion that is planar and inclined downward on an inner side in a vehicle width direction is formed in at least a part of the lower trim, and a tag is clamped by the bottom surface portion of the concave section and the upper trim.
    Type: Application
    Filed: October 24, 2022
    Publication date: May 4, 2023
    Inventors: Toshiki Ieiri, Tomoaki Ishibashi, Naoki Takahashi
  • Patent number: 11261346
    Abstract: The present invention provides a polishing composition for use in polishing a material having a Vickers hardness of 1500 Hv or higher. The polishing composition comprises an alumina abrasive and water. The alumina abrasive has an isoelectric point that is below 8.0 and is lower than the pH of the polishing composition.
    Type: Grant
    Filed: March 22, 2017
    Date of Patent: March 1, 2022
    Assignee: FUJIMI INCORPORATED
    Inventor: Tomoaki Ishibashi
  • Publication number: 20200392376
    Abstract: The present invention provides a solution for preventing the settling of an abrasive while maintaining the polishing performance. In addition, the present invention provides a solution for improving the redispersibility of an abrasive while maintaining the polishing performance. The present invention relates to a polishing composition for use in polishing a semiconductor substrate, the polishing composition containing an abrasive, a layered compound, and a dispersion medium.
    Type: Application
    Filed: August 28, 2020
    Publication date: December 17, 2020
    Applicant: FUJIMI INCORPORATED
    Inventors: Tomoaki ISHIBASHI, Hiroki KON
  • Publication number: 20200123413
    Abstract: The present invention provides a solution for preventing the settling of an abrasive while maintaining the polishing performance. In addition, the present invention provides a solution for improving the redispersibility of an abrasive while maintaining the polishing performance. The present invention relates to a polishing composition for use in polishing a semiconductor substrate, the polishing composition containing an abrasive, a layered compound, and a dispersion medium.
    Type: Application
    Filed: December 22, 2017
    Publication date: April 23, 2020
    Applicant: FUJIMI INCORPORATED
    Inventors: Tomoaki ISHIBASHI, Hiroki KON
  • Publication number: 20190112506
    Abstract: The present invention provides a polishing composition for use in polishing a material having a Vickers hardness of 1500 Hv or higher. The polishing composition comprises an alumina abrasive and water. The alumina abrasive has an isoelectric point that is below 8.0 and is lower than the pH of the polishing composition.
    Type: Application
    Filed: March 22, 2017
    Publication date: April 18, 2019
    Applicant: FUJIMI INCORPORATED
    Inventor: Tomoaki ISHIBASHI
  • Publication number: 20140051335
    Abstract: Provided is a polishing composition containing an abrasive and water. The abrasive content in the polishing composition is no less than 0.1% by mass. The abrasive contains zirconium oxide particles. The zirconium oxide particles have a specific surface area of from 1 to 15 m2/g. The zirconium oxide particles preferably have a purity of no less than 99% by mass. The polishing composition is used in, for example, polishing a hard and brittle material, such as sapphire, silicon nitride, silicon carbide, silicon oxide, glass, gallium nitride, gallium arsenide, indium arsenide, and indium phosphide.
    Type: Application
    Filed: January 19, 2012
    Publication date: February 20, 2014
    Inventors: Hitoshi Morinaga, Eiichi Yamada, Kazusei Tamai, Tomoaki Ishibashi, Taira Otsu, Naoyuki Ishihara, Youhei Takahashi
  • Patent number: 6811583
    Abstract: A polishing composition for a substrate for a magnetic disk, which comprises: (a) a polishing accelerator composed of at least one compound selected from the group consisting of malic acid, glycolic acid, succinic acid, citric acid, maleic acid, itaconic acid, malonic acid, iminodiacetic acid, gluconic acid, lactic acid, mandelic acid, crotonic acid, nicotinic acid, aluminum nitrate, aluminum sulfate and iron(III) nitrate, (b) an edge sagging preventive agent composed of at least one compound selected from the group consisting of a polyvinylpyrrolidone, a polyoxyethylene sorbitan fatty acid ester and a polyoxyethylene sorbit fatty acid ester, (c) at least one abrasive selected from the group consisting of aluminum oxide, silicon dioxide, cerium oxide, zirconium oxide, titanium oxide and silicon carbide, and (d) water.
    Type: Grant
    Filed: November 26, 2002
    Date of Patent: November 2, 2004
    Assignee: Fujimi Incorporated
    Inventor: Tomoaki Ishibashi
  • Patent number: 6645051
    Abstract: A polishing composition for a substrate to be used for a memory hard disk, which comprises the following components (a) to (d): (a) water, (b) at least one compound selected from the group consisting of a polyoxyethylene polyoxypropylene alkyl ether and a polyoxyethylene polyoxypropylene copolymer, (c) at least one compound selected from the group consisting of nitric acid, nitrous acid, sulfuric acid, hydrochloric acid, molybdic acid, sulfamic acid, glycine, glyceric acid, mandelic acid, malonic acid, ascorbic acid, glutamic acid, glyoxylic acid, malic acid, glycolic acid, lactic acid, gluconic acid, succinic acid, tartaric acid, maleic acid and citric acid, and their salts, and (d) at least one abrasive selected from the group consisting of aluminum oxide, silicon dioxide, cerium oxide, zirconium oxide, titanium oxide, silicon nitride and silicon carbide.
    Type: Grant
    Filed: November 7, 2001
    Date of Patent: November 11, 2003
    Assignee: Fujimi Incorporated
    Inventors: Hiroyasu Sugiyama, Tomoaki Ishibashi, Toshiyuki Takahashi
  • Publication number: 20030121214
    Abstract: A polishing composition for a substrate for a magnetic disk, which comprises:
    Type: Application
    Filed: November 26, 2002
    Publication date: July 3, 2003
    Applicant: FUJIMI INCORPORATED
    Inventor: Tomoaki Ishibashi
  • Publication number: 20020102923
    Abstract: A polishing composition for a substrate to be used for a memory hard disk, which comprises the following components (a) to (d):
    Type: Application
    Filed: November 7, 2001
    Publication date: August 1, 2002
    Applicant: FUJIMI INCORPORATED
    Inventors: Hiroyasu Sugiyama, Tomoaki Ishibashi, Toshiyuki Takahashi
  • Patent number: 6423125
    Abstract: A polishing composition for magnetic disk substrates to be used for memory hard disks, which comprises: (a) water; (b) at least one phosphate. compound selected from the group consisting of a phosphate ester of ethoxylated alkylalcohol and a phosphate ester of ethoxylated arylalcohol; (c) at least one polishing accelerator selected from the group consisting of an inorganic acid and an organic acid, and their salts, other than the phosphate compound of component (b); (d) at least one abrasive selected from the group consisting of aluminum oxide, silicon dioxide, cerium oxide, zirconium oxide, titanium oxide, silicon nitride and manganese dioxide.
    Type: Grant
    Filed: August 28, 2000
    Date of Patent: July 23, 2002
    Assignee: Fujimi Incorporated
    Inventors: Tomoaki Ishibashi, Noritaka Yokomichi, Hiroyasu Sugiyama