Patents by Inventor Tomoe Ikawa

Tomoe Ikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Capacitance measuring apparatus and capacitance measuring method
    Patent number: 7812619
    Abstract: A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current flowing through the device under test before and after voltage fluctuation and the charging current flowing through the device under test as a result of voltage fluctuation.
    Type: Grant
    Filed: August 9, 2007
    Date of Patent: October 12, 2010
    Assignee: Agilent Technologies, Inc.
    Inventors: Shinichi Tanida, Hiroshi Nada, Tomoe Ikawa
  • Capacitance measuring apparatus and capacitance measuring method
    Publication number: 20080068029
    Abstract: A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current flowing through the device under test before and after voltage fluctuation and the charging current flowing through the device under test as a result of voltage fluctuation.
    Type: Application
    Filed: August 9, 2007
    Publication date: March 20, 2008
    Inventors: Shinichi Tanida, Hiroshi Nada, Tomoe Ikawa