Abstract: A detection device that is capable of being attached to a through hole includes a main body portion, a detection portion, a cover portion, an insulation portion, and an oscillation portion. The main body portion has an insertion portion and a head portion. The detection portion is arranged in the insertion portion and detects the state of a fluid. The cover portion is arranged so as to form a gap with the head portion. The insulating portion has a lateral wall having a cylindrical shape. An oscillation portion is accommodated inside the insulation portion, and performs a wireless output of a detection result of the detection portion by using the head portion, the cover portion and the gap as a slot antenna.

Abstract: In a multilayer filter, first and second resonant circuits are arranged in a direction crossing a stacking direction of a plurality of dielectric layers. An input/output portion includes an input/output port group including an unbalanced port and a pair of balanced ports or an input/output port group including two pairs of balanced ports. The second resonant circuit includes an inductor conductor, a first capacitor conductor, and a second capacitor conductor. The inductor conductor includes first and second ends. The first capacitor conductor is connected to the first end. The second capacitor conductor is connected to the second end. The second dielectric layer has a dielectric constant lower than that of the first dielectric layer. The first and second capacitor conductors are provided in the first dielectric layer. At least a part of the inductor conductor is provided in the second dielectric layer.

Abstract: In measuring a dimension of an object to be measured W made of a single material, a plurality of transmission images of the object to be measured W are obtained by using an X-ray CT apparatus, and then respective projection images are generated. The projection images are registered with CAD data used in designing the object to be measured W. The dimension of the object to be measured W is calculated by using a relationship between the registered CAD data and projection images. In such a manner, high-precision dimension measurement is achieved by using several tens of projection images and design information without performing CT reconstruction.

Abstract: An isosurface mesh M is generated by extracting voxels having a certain CT value from volume data obtained by X-ray CT. A gradient vector g of a CT value is calculated at each vertex p of the isosurface mesh M. A plurality of sample points S are generated in positive and negative directions of the calculated gradient vector g. Gradient norms N of CT values at the respective generated sample points S are calculated. The vertex p of the isosurface mesh is moved and corrected to a sample point Sm having the maximum norm Nm calculated.

Abstract: Projection images of reduced resolution are generated by reducing resolution of filtered projection images and/or reducing the number of filtered projection images. Volume data of reduced resolution is generated by performing CT reconstruction using the projection images of reduced resolution. Each voxel of the volume data of reduced resolution is provisionally divided. The provisionally divided voxels are compared in voxel value before and after provisional division. If a difference in voxel value before and after the provisional division is greater than a threshold, the provisional division is determined to be valid, and division is further continued. If the difference in voxel value before and after the provisional division is less than or equal to the threshold, the provisional division is determined to be invalid and the voxel ends being divided.

Abstract: An isosurface mesh M is generated by extracting voxels having a certain CT value from volume data obtained by X-ray CT. A gradient vector g of a CT value is calculated at each vertex p of the isosurface mesh M. A plurality of sample points S are generated in positive and negative directions of the calculated gradient vector g. Gradient norms N of CT values at the respective generated sample points S are calculated. The vertex p of the isosurface mesh is moved and corrected to a sample point Sm having the maximum norm Nm calculated.

Abstract: According to an embodiment of the present invention, a method of measuring a shape based on reflected light from a surface of an object irradiated with light from a measurement head, includes: acquiring a first measurement result by setting a measurement condition suitable for the measurement of a first region of the object and by measuring a first scanning range of the surface with a first scanning pitch; determining a second region of the surface except the first region from the first measurement result; and acquiring a second measurement result by setting a measurement condition suitable for the measurement of the second region and by measuring a second scanning range of the surface narrower than the first scanning range with a second scanning pitch finer than the first scanning pitch.

Abstract: In measuring a dimension of an object to be measured W made of a single material, a plurality of transmission images of the object to be measured W are obtained by using an X-ray CT apparatus, and then respective projection images are generated. The projection images are registered with CAD data used in designing the object to be measured W. The dimension of the object to be measured W is calculated by using a relationship between the registered CAD data and projection images. In such a manner, high-precision dimension measurement is achieved by using several tens of projection images and design information without performing CT reconstruction.

Abstract: Projection images of reduced resolution are generated by reducing resolution of filtered projection images and/or reducing the number of filtered projection images. Volume data of reduced resolution is generated by performing CT reconstruction using the projection images of reduced resolution. Each voxel of the volume data of reduced resolution is provisionally divided. The provisionally divided voxels are compared in voxel value before and after provisional division. If a difference in voxel value before and after the provisional division is greater than a threshold, the provisional division is determined to be valid, and division is further continued. If the difference in voxel value before and after the provisional division is less than or equal to the threshold, the provisional division is determined to be invalid and the voxel ends being divided.

Abstract: A measurement value correction method according to the present invention is a measurement value correction method for correcting a measurement value obtained by tracing a surface of a work piece with a stylus, and including a step of preparing a plurality of work pieces made from same design data, a step of adopting one of the work pieces as a master work piece and obtaining a reference measurement value with the stylus, a step of obtaining calibration data based on a difference between the reference measurement value and the design data, a step of adopting one of the plurality of work pieces other than the master work piece as a measurement target work piece and obtaining a target measurement value with the stylus, and a step of obtaining a corrected measurement value by correcting the target measurement value by using the calibration data.

Abstract: According to an embodiment of the present invention, a method of measuring a shape based on reflected light from a surface of an object irradiated with light from a measurement head, includes: acquiring a first measurement result by setting a measurement condition suitable for the measurement of a first region of the object and by measuring a first scanning range of the surface with a first scanning pitch; determining a second region of the surface except the first region from the first measurement result; and acquiring a second measurement result by setting a measurement condition suitable for the measurement of the second region and by measuring a second scanning range of the surface narrower than the first scanning range with a second scanning pitch finer than the first scanning pitch.

Abstract: An arm type three-dimensional measuring machine includes: a multi-jointed arm mechanism comprising a probe in a distal end; a processing part for computing a position of said probe; and an inclinometer configured to detect an inclination amount of a base part from a vertical direction in the base part for supporting the multi-jointed arm mechanism, wherein the processing part computes a position of the probe using the base part as a criterion and corrects the position of the probe using the base part as the criterion in a time-series manner based on an output from the inclinometer.

Abstract: This sensor state determination system is a sensor state monitoring system capable of accurately determining whether or not a detecting sensor used with a railroad vehicle is in an abnormal state. This system includes: a detecting sensor capable of detecting a physical value acting upon the railroad vehicle; and an electronic control device. A monitoring sensor equivalent to the detection sensor is installed at a position equivalent to the position of the detection sensor. The electronic control device is provided with a determination means (coherence calculation section, state determination section) that computes, based on a first signal detected by the detecting sensor and a second signal detected by the monitoring sensor, a coherence value indicating a correlation between the signals. The electronic control device determines that the detecting sensor is in an abnormal state if the coherence value is smaller than a preset abnormality determination value.

Abstract: An arm type three-dimensional measuring apparatus includes: a multi-jointed arm mechanism including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount.

Abstract: A measurement value correction method according to the present invention is a measurement value correction method for correcting a measurement value obtained by tracing a surface of a work piece with a stylus, and including a step of preparing a plurality of work pieces made from same design data, a step of adopting one of the work pieces as a master work piece and obtaining a reference measurement value with the stylus, a step of obtaining calibration data based on a difference between the reference measurement value and the design data, a step of adopting one of the plurality of work pieces other than the master work piece as a measurement target work piece and obtaining a target measurement value with the stylus, and a step of obtaining a corrected measurement value by correcting the target measurement value by using the calibration data.

Abstract: An arm type three-dimensional measuring apparatus includes: a multi-jointed arm mechanism including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount.

Abstract: An arm type three-dimensional measuring machine includes: a multi-jointed arm mechanism comprising a probe in a distal end; a processing part for computing a position of said probe; and an inclinometer configured to detect an inclination amount of a base part from a vertical direction in the base part for supporting the multi-jointed arm mechanism, wherein the processing part computes a position of the probe using the base part as a criterion and corrects the position of the probe using the base part as the criterion in a time-series manner based on an output from the inclinometer.

Abstract: This sensor state determination system is a sensor state monitoring system capable of accurately determining whether or not a detecting sensor used with a railroad vehicle is in an abnormal state. This system includes: a detecting sensor capable of detecting a physical value acting upon the railroad vehicle; and an electronic control device. A monitoring sensor equivalent to the detection sensor is installed at a position equivalent to the position of the detection sensor. The electronic control device is provided with a determination means (coherence calculation section, state determination section) that computes, based on a first signal detected by the detecting sensor and a second signal detected by the monitoring sensor, a coherence value indicating a correlation between the signals. The electronic control device determines that the detecting sensor is in an abnormal state if the coherence value is smaller than a preset abnormality determination value.

Abstract: A shape measuring method includes guiding light emitted from a light source to an object to be measured and a reference surface, combining light reflected from the object to be measured with light reflected from the reference surface, and taking a distribution image of an interference light intensity corresponding to each measurement position of the object to be measured, while changing an optical path length difference between a first optical path length and a second optical path length over a whole scanning zone, sequentially storing distribution images of the interference light intensity in the whole scanning zone, and obtaining an interference light intensity string at each measurement position based on the stored distribution images of the interference light intensity, and obtaining a position in an optical axis direction at each measurement position of the object to be measured from a peak position of the interference light intensity string.

Abstract: A shape measuring apparatus includes: an optical system configured to guide a light from a light source having a wideband spectrum to an object to be measured and a reference face; an imaging unit configured to image the interfering light intensity distribution image output from the optical system; an optical path length difference changing unit configured to change the optical path length difference; and an arithmetic processing unit configured to obtain the peak value of an interfering light intensity sequence indicating the change in the interfering light intensity due to the change in the optical path length difference at each measurement position of the interfering light intensity distribution images stored in the image storing unit, and configured to obtain the peak value as the position in the direction of the optical axis at each measurement position of the object to be measured.