Abstract: A lighting system includes a plurality of lighting devices and a control device. The plurality of lighting devices are installed in a facility. The control device controls the plurality of lighting devices. The control device controls lighting light projected by at least one lighting device, belonging to the plurality of lighting devices, into colored lighting light, of which a color is different from a color white, to give, upon acquiring information about an event in question, a sign depending on the event in question.

Abstract: Provided are a measurement system that has a plurality of measurement modules and is capable of creating a program of each measurement module easily and a method of creating a program therefor. A measurement system 100 includes a first and second measurement modules 120 and 130, and a controller 102 controlling thereof, in which the controller includes a first processor, a first memory and a first timer; the first measurement module includes a second processor, a second memory, and a second timer; and the second measurement module includes a third processor, a third memory, a third timer; the controller further includes a first function column including one or more execution steps of a first function sequence to be executed by the first measurement module, and a second function column including one or more execution steps of a second function sequence to be executed by the second measurement module, the second function column being adjacent in a first adjacent direction of the first function column.

Abstract: A method for operating a data processing system to identify documents in a library includes a plurality of documents and a plurality of concepts exemplified by the plurality of documents and computer readable media that stores instructions for causing a data processing system to execute that method are disclosed. The method includes causing the data processing system to identify candidate documents matching a user provided search keyword from the library, causing the data processing system to generate a topical graph relating concepts contained in the candidate documents to one another, and clustering the candidate documents based on the topical graph. For each cluster, the data processing system displays a summary of the candidate documents in that cluster together with a cluster name that characterizes that cluster.

Abstract: A method is provided for detecting mura defects in a master panel during fabrication, the master panel containing multiple flat screen displays. The method includes preparing a combined image from image data of the master panel; enhancing the quality of the combined image, including removing artifacts from the combined image; filtering the enhanced quality combined image to detect local mura defects, the local mura defects including at least one structured pattern of defined geometric shapes; applying different candidate patterns to the filtered combined image; selecting one of the candidate patterns as a defect detection pattern, the defect detection pattern being closest to the structured pattern of defined geometric shapes of the detected local mura defects; and displaying at least a portion of the defect detection pattern on a display, together with the quality-enhanced combined image.

Abstract: A method is provided for detecting mura defects in a master panel during fabrication, the master panel containing multiple flat screen displays. The method includes preparing a combined image from image data of the master panel; enhancing the quality of the combined image, including removing artifacts from the combined image; filtering the enhanced quality combined image to detect local mura defects, the local mura defects including at least one structured pattern of defined geometric shapes; applying different candidate patterns to the filtered combined image; selecting one of the candidate patterns as a defect detection pattern, the defect detection pattern being closest to the structured pattern of defined geometric shapes of the detected local mura defects; and displaying at least a portion of the defect detection pattern on a display, together with the quality-enhanced combined image.

Abstract: Provided are a measurement system that has a plurality of measurement modules and is capable of creating a program of each measurement module easily and a method of creating a program therefor. A measurement system 100 includes a first and second measurement modules 120 and 130, and a controller 102 controlling thereof, in which the controller includes a first processor, a first memory and a first timer; the first measurement module includes a second processor, a second memory, and a second timer; and the second measurement module includes a third processor, a third memory, a third timer; the controller further includes a first function column including one or more execution steps of a first function sequence to be executed by the first measurement module, and a second function column including one or more execution steps of a second function sequence to be executed by the second measurement module, the second function column being adjacent in a first adjacent direction of the first function column.

Abstract: A method for operating a data processing system to identify documents in a library includes a plurality of documents and a plurality of concepts exemplified by the plurality of documents and computer readable media that stores instructions for causing a data processing system to execute that method are disclosed. The method includes causing the data processing system to identify candidate documents matching a user provided search keyword from the library, causing the data processing system to generate a topical graph relating concepts contained in the candidate documents to one another, and clustering the candidate documents based on the topical graph. For each cluster, the data processing system displays a summary of the candidate documents in that cluster together with a cluster name that characterizes that cluster.

Abstract: A test system measures parameters of a device under test (DUT), including a transistor. The test system includes a first voltage source unit for supplying a gate voltage; a second voltage source unit for supplying one of a drain voltage or a source voltage, the second voltage source having a current measurement device for detecting one of a drain current or a source current flowing through the transistor, respectively; a feedback unit for outputting a feedback current, based on the one of the drain or source currents; and an error amplifier for outputting a feedback control signal, based on comparison of the feedback current and a target current value. The first voltage source unit adjusts the gate voltage based on the feedback control signal so that the one of the drain or source currents converges to match the target current value.

Abstract: A test system measures parameters of a device under test (DUT), including a transistor. The test system includes a first voltage source unit for supplying a gate voltage; a second voltage source unit for supplying one of a drain voltage or a source voltage, the second voltage source having a current measurement device for detecting one of a drain current or a source current flowing through the transistor, respectively; a feedback unit for outputting a feedback current, based on the one of the drain or source currents; and an error amplifier for outputting a feedback control signal, based on comparison of the feedback current and a target current value. The first voltage source unit adjusts the gate voltage based on the feedback control signal so that the one of the drain or source currents converges to match the target current value.

Abstract: A module in a module-type tester has a trigger bus for trigger signals and sub-modules; at least one of the sub-modules has a terminal for receiving trigger signals from the trigger bus and a terminal for outputting trigger signals to the trigger bus; and at least one of the sub-modules receives trigger signals from outside the module at a terminal for measurement signals or a terminal for signals under test and outputs the received trigger signals to the trigger bus via the output terminal.