Patents by Inventor Tomoya ONITSUKA

Tomoya ONITSUKA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240120217
    Abstract: A substrate treatment method includes: performing a first heat treatment on a substrate on which a coating film of a metal-containing resist has been formed and subjected to an exposure treatment, to form the metal-containing resist into a precursor in an exposed region of the coating film; thereafter, performing a second heat treatment on the substrate to condense the metal-containing resist formed into the precursor in the exposed region of the coating film; and thereafter, performing a developing treatment on the substrate.
    Type: Application
    Filed: September 25, 2023
    Publication date: April 11, 2024
    Inventors: Shinichiro KAWAKAMI, Kosuke YOSHIHARA, Satoru SHIMURA, Yuhei KUWAHARA, Tomoya ONITSUKA, Soichiro OKADA, Tetsunari FURUSHO
  • Publication number: 20240038533
    Abstract: The present disclosure provides a substrate processing method and a substrate processing apparatus which are effective in preventing pattern collapse of an uneven pattern. The substrate processing method according to an exemplary embodiment includes replacing a liquid in a recess of a substrate having an uneven pattern of a negative type resist including a metal formed on a surface of the substrate with a solid-state stiffener, and subjecting the substrate to a molecular weight reduction processing that reduces the number of intermolecular bonds contained in the solid-state stiffener while maintaining the solid-state stiffener in a solid state.
    Type: Application
    Filed: August 10, 2021
    Publication date: February 1, 2024
    Inventors: Hiroki TADATOMO, Makoto MURAMATSU, Kenichi UEDA, Arnaud Alain Jean DAUENDORFFER, Tomoya ONITSUKA, Keisuke YOSHIDA
  • Publication number: 20240027923
    Abstract: A substrate processing apparatus for processing a substrate including a metal-containing resist film, includes: a heat treatment part configured to perform a heat treatment on the substrate having the film subjected to an exposing process; a developing process part configured to perform a developing process on the film of the substrate subjected to the heat treatment; and a gas contact part configured to bring the film into contact with an inert gas during a period after the exposing process and before the developing process.
    Type: Application
    Filed: July 17, 2023
    Publication date: January 25, 2024
    Inventors: Tomoya ONITSUKA, Shinichiro KAWAKAMI, Hisashi GENJIMA
  • Publication number: 20230176484
    Abstract: A heat treatment apparatus includes: a stage on which a substrate is placed and heated, the substrate including an exposed resist film formed on a surface of the substrate, and the exposed resist film exhibiting a change in solubility of an exposed portion or an unexposed portion in a liquid developer by reacting with water and being heated; a lifting mechanism configured to relatively raise and lower the substrate between a first position at which the substrate is placed on the stage and a second position which is spaced apart from the stage; and a gas supply configured to supply a first gas to the substrate located at the second position before moving to the first position, the first gas having a humidity higher than that of an atmosphere in which the stage is provided.
    Type: Application
    Filed: March 15, 2021
    Publication date: June 8, 2023
    Inventors: Shinichiro KAWAKAMI, Yohei SANO, Tomoya ONITSUKA
  • Patent number: 10656526
    Abstract: A thermal treatment apparatus performs a thermal treatment on a metal-containing film formed on a substrate. The thermal treatment apparatus includes a treatment chamber that houses the substrate; a thermal treatment plate that is provided inside the treatment chamber and mounts the substrate thereon; and a moisture supply unit that supplies moisture to the metal-containing film. At the time of the thermal treatment, moisture is supplied to the metal-containing film of the substrate on the thermal treatment plate and an atmosphere in the treatment chamber is exhausted from a central portion of the treatment chamber.
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: May 19, 2020
    Assignee: Tokyo Electron Limited
    Inventors: Yohei Sano, Shinichiro Kawakami, Masashi Enomoto, Takahiro Shiozawa, Keisuke Yoshida, Tomoya Onitsuka
  • Publication number: 20180164689
    Abstract: A thermal treatment apparatus that performs a thermal treatment on a metal-containing film formed on a substrate, includes: a treatment chamber that houses the substrate; a thermal treatment plate that is provided inside the treatment chamber and mounts the substrate thereon; and a moisture supply unit that supplies moisture to the metal-containing film, wherein at the time of the thermal treatment, moisture is supplied to the metal-containing film of the substrate on the thermal treatment plate and an atmosphere in the treatment chamber is exhausted from a central portion of the treatment chamber.
    Type: Application
    Filed: November 28, 2017
    Publication date: June 14, 2018
    Inventors: Yohei SANO, Shinichiro KAWAKAMI, Masashi ENOMOTO, Takahiro SHIOZAWA, Keisuke YOSHIDA, Tomoya ONITSUKA