Patents by Inventor Tony Zou

Tony Zou has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Techniques for checking vulnerability to cross-temperature read errors in a memory device
    Patent number: 11972804
    Abstract: The memory device includes a memory block with an array of memory cells. The memory device also includes control circuitry that is in communication with the memory cells. The control circuitry is configured to program a group of the memory cells in a programming operation that does not include verify to obtain a natural threshold voltage (nVt) distribution, calculate an nVt width of the nVt distribution, compare the nVt width to a threshold, and identify the memory block as being vulnerable to cross-temperature read errors in response to the nVt width exceeding the threshold.
    Type: Grant
    Filed: June 22, 2022
    Date of Patent: April 30, 2024
    Assignee: SanDisk Technologies, LLC
    Inventors: Xuan Tian, Henry Chin, Liang Li, Vincent Yin, Wei Zhao, Tony Zou
  • TECHNIQUES FOR CHECKING VULNERABILITY TO CROSS-TEMPERATURE READ ERRORS IN A MEMORY DEVICE
    Publication number: 20230420053
    Abstract: The memory device includes a memory block with an array of memory cells. The memory device also includes control circuitry that is in communication with the memory cells. The control circuitry is configured to program a group of the memory cells in a programming operation that does not include verify to obtain a natural threshold voltage (nVt) distribution, calculate an nVt width of the nVt distribution, compare the nVt width to a threshold, and identify the memory block as being vulnerable to cross-temperature read errors in response to the nVt width exceeding the threshold.
    Type: Application
    Filed: June 22, 2022
    Publication date: December 28, 2023
    Applicant: SanDisk Technologies LLC
    Inventors: Xuan Tian, Henry Chin, Liang Li, Vincent Yin, Wei Zhao, Tony Zou